Non-volatile memories have inherent errors: the content written inside might be different from what is read out.
It is because memories suffer of reliability issues (data retention, stress sensitivity, limited number of write operations, ...). In order to overcome this problems, specific algorithms are used (ECC, LDPC, wear leveling, read-retry, ...). These algorithms need to be tuned for the specific application and usage mode and they strongly depend on the memory device itself.
Understanding the memory is essential to build efficient electronic devices using non-volatile memory for data or for code storage.
We developed our technology to carry out specific measurements on the memory components, to extract all information needed for the algorithm optimization.
Our products include test/measurement tools and data analysis software, embedding dozens of years of experience.
We are working on all currently used non-volatile memory technologies like NAND, NOR, PCM, RRAM, FeRAM, MRAM.
Our partners are designing electronic boards and modules using intensively non-volatile memories for the data storage.
We are offering hardware and software tools for characterizing the non-volatile memory components and/or we are offering our knowledge to execute the characterization in our laboratory and working together with our partners to find the optimal algorithms and parameters for the specific application.