Nanotechnology in STEM > Methods
Tutorials of Methods Used in Nanotechnology
Browse Geochemical Analytical Instruments and Techniques
Each of these pages contains information about each instrument or technique including what it is, fundamental principles, how it works, applications, strengths and limitations, sample preparation, data collection, results, and preparation, and if available, literature and teaching activities/resources.
Single-crystal X-ray Diffraction--Christine M. Clark, Eastern Michigan University and Barbara L. Dutrow, Louisiana State University
X-ray Powder Diffraction (XRD)--Barbara L. Dutrow, Louisiana State University and Christine M. Clark, Eastern Michigan University
Electron Microbeam
Electron Probe Micro-analyzer (EPMA)--John Goodge, University of Minnesota-Duluth
Scanning Electron Microscopy (SEM)--Susan Swapp, University of Wyoming
Wavelength Dispersive Spectroscopy (WDS)--Darrell Henry, Louisiana State University and John Goodge, University of Minnesota-Duluth
Energy Dispersive Spectroscopy (EDS)--John Goodge, University of Minnesota-Duluth
Back-Scattered Electron Imaging (BSE)--John Goodge, University of Minnesota at Duluth
X-ray Elemental Mapping--John Goodge, University of Minnesota-Duluth
Cathodoluminescence (SEM-CL)--Darrell Henry, Louisiana State University
Electron Back-Scattered Diffraction (EBSD)--Susan Swapp, University of Wyoming
Cryogenic SEM -- currently empty
X-ray Fluorescence (XRF)--Karl Wirth, Macalester College and Andy Barth, Indiana University~Purdue University, Indianapolis
Instrumental Neutron Activation Analysis (INAA)--Nelson Eby, University of Massachusetts Lowell
Using Geochemical Data--Karl Wirth, Macalester College
Mass Spectrometers--Magnetic Sector
Thermal Ionization Mass Spectrometry (TIMS)--Paul Mueller, University of Florida and Jeff Vervoort, Washington State University
Multicollector-Inductively Coupled Plasma Mass Spectrometer (MC-ICPMS)--Jeff Vervoort, Washington State University and Paul Mueller,University of Florida
Secondary Ion Mass Spectroscopy (SIMS)--Paul Mueller, University of Florida and Jeff Vervoort, Washington State University
Gas Source--Steve Dunn, Mount Holyoke College
Micro-Imaging Instruments
Petrographic Microscope
X-ray Computed Tomography (CT)--Richard Ketcham, University of Texas at Austin
SEM-Cathodoluminescence (SEM-CL)--Darrell Henry, Louisiana State University
Optical Cathodoluminescence (Op-CL)--Darrell Henry, Louisiana State University
Surface Spectroscopies
Time Of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS)--David W. Mogk, Montana State University
Other Spectroscopies
Mossbauer Spectroscopy--M. Darby Dyar, Department of Astronomy, Mount Holyoke College
Supporting Information Sheets
Generation of Chracteristic X-rays--Darrell Henry, Louisiana State University
Bragg's Law--Darrell Henry, Louisiana State University; Nelson Eby, University of Massachusetts - Lowell; John Goodge, University of Minnesota - Duluth; and David Mogk, Montana State University
Electron Beam - Sample Interactions--Darrell Henry, Louisiana State University
Characterization of Nanoparticles
Methods described in this section were originally developed in the Geochemical Instrumentation and Analysis module. These pages will be migrated into this page.
TEM in progress
Grazing Incidence Diffraction and Reflectometry to be developed
Auger Electron Spectroscopy to be developed
Atomic Force Microscopy, to be developed.
Confocal Microscopy to be developed
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This material is based upon work supported by the National Science Foundation under Grant No. 1542210. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.