Reliability is the description of the endurance of the device. Anlogic Infotech tests the device mainly through different targeted experiments under the JESD47 test syllabus, including:
Reliability related to wafer process (HCI, BTI, TDDB, GOI, EM, SM…… ...)
Circuit-related reliability (ESD, Latch-up, HTOL, LTOL ……)
Package-related reliability (PC, TCT, HTSL, (U) HAST ……)
Board-level related reliability (BTC ……)
These test conditions are far more severe than the application scenarios. By stimulating the potential weaknesses of semiconductor wafers and packages, they are used to eliminate early defects of the device, check its reliability indexes, evaluate its service life and enhance its reliability level. The test data will be collected to illustrate the reliability of the device, and at the same time, to analyze the cause of each failure of the unqualified product in detail, and take effective corrective actions for closed loop.
Anlogic Infotech is currently referring to the following specifications (please refer to the official JEDEC website for the latest version):
|STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
|Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
|Cycled Temperature-Humidity-Bias with Surface Condensation Life Test
|Steady-State Temperature-Humidity Bias Life Test
|Accelerated Moisture Resistance - Unbiased Autoclave
|High Temperature Storage Life
|Highly Accelerated Temperature and Humidity Stress Test (HAST)
|Accelerated Moisture Resistance - Unbiased HAST
|Solderability Tests for Component Leads
|Solder Ball Pull
|Wire Bond Shear Test Method
|Solder Ball Shear
|IC LATCH-UP TEST
|TEMPERATURE, BIAS, AND OPERATING LIFE
|Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) -Component Level
|ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL
|Moisture/Reflow Sensitivity Classification for Non-hermetic Surface Mount Devices (SMDs)
|Reflow Flatness Requirements for Ball Grid Array Packages
|TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE
|METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS
The Endurance of the Product
The service life of the device refers to the service time when the performance indexes or acceptance requirements of the device meet the product specification under the specified stress environment. Usually the weakest part of a device determines its service life. When the distribution of the device failure rate conforms to Weibull function, the time when the cumulative failure rate of a device is below 63.2% is defined as the characteristic life of the device. We use the characteristic life curve (bathtub curve) to describe it, which consists of the following three parts:
The first part is the failure rate that decreases with time, which is called early failure.
The second part is the approximately fixed failure rate, which is called random failure.
The third part is the failure rate that increases with time after exceeding its design life, which is called wear out.
Anlogic Infotech introduces JESD85 (Methods for Calculating Failure Rates in Units of FITs) to measure its product failure in a uniform manner.
The calculation is described as follows:
Anlogic Infotech evaluates the reliability of devices running in different operating environments based on a set of generally acceptable stress test criteria that the devices can withstand to ensure good reliability performance in the application.
Anlogic Infotech has an extremely reliable monitoring and prevention program to ensure that all products it has launched are of the best quality. Anlogic Infotech performs all major reliability tests on each process using state-of-the-art equipment and technology. The results of the stress test in the accelerated environment can be extrapolated to standard operating conditions to predict effective service life and ensure that our products have the highest reliability ratings in the industry.
For detailed reliability data, please contact the sales center or distributor.