- Hurley, G.F. and Cocks, F.H., X-ray analysis of internal strain in neutron-irradiated silicon nitrides and oxynitrides,
Am. Ceram. Soc. Bull. (USA), vol. 60 no. 12
pp. 1302 - 5 .
(last updated on 2007/04/10)
Four silicon nitride and oxynitride materials were neutron-irradiated in the EBR-11 fission reactor at 1015K. Strength measurements were subsequently made on two of these materials and suggested a small strength decrease. X-ray line broadening analysis was performed to examine internal strain/stress as a source of weakening. In the case of Si2ON2 the only material for which both strength data and meaningful internal stress data could be obtained, the analysis showed that only a small strength decrease would be expected, despite high internal stress. However, it was concluded that the level of rms strain/stress observed would have a more significant effect in stronger forms of the same material
ceramics;fusion reactor materials;internal stresses;silicon compounds;strain measurement;stress-strain relations;X-ray diffraction examination of materials;