  The effects on the local structure due to self-irradiation damage of Ga
stabilized $\delta$-Pu stored at cryogenic temperatures have been examined
using extended x-ray absorption fine structure (EXAFS) experiments. Extensive
damage, seen as a loss of local order, was evident after 72 days of storage
below 15 K. The effect was observed from both the Pu and Ga sites, although
less pronounced around Ga. Isochronal annealing was performed on this sample to
study the annealing processes that occur between cryogenic and room temperature
storage conditions, where damage is mostly reversed. Damage fractions at
various points along the annealing curve have been determined using an
amplitude-ratio method, standard EXAFS fitting, and a spherical crystallite
model, and provide information complementary to previous electrical
resistivity- and susceptibility-based isochronal annealing studies. The use of
a spherical crystallite model accounts for the changes in EXAFS spectra using
just two parameters, namely, the crystalline fraction and the particle radius.
Together, these results are discussed in terms of changes to the local
structure around Ga and Pu throughout the annealing process and highlight the
unusual role of Ga in the behavior of the lowest temperature anneals.
