  We have developed scanning near-field microwave microscopes which can image
electrodynamic properties of superconducting materials on length scales down to
about 2 $\mu$m. The microscopes are capable of quantitative imaging of sheet
resistance of thin films, and surface topography. We demonstrate the utility of
the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin
film wafer, images of bulk Nb surfaces, and spatially resolved measurements of
Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the
microscope and conclude with a summary of its present capabilities.
