  Ability to understand and model the performance limits of nanowire
transistors is the key to design of next generation devices. Here, we report
studies on high-mobility junction-less gate-all-around nanowire field effect
transistor with carrier mobility reaching 2000 cm2/V.s at room temperature.
Temperature-dependent transport measurements reveal activated transport at low
temperatures due to surface donors, while at room temperature the transport
shows a diffusive behavior. From the conductivity data, the extracted value of
sound velocity in InAs nanowires is found to be an order less than the bulk.
This low sound velocity is attributed to the extended crystal defects that
ubiquitously appear in these nanowires. Analyzing the temperature-dependent
mobility data, we identify the key scattering mechanisms limiting the carrier
transport in these nanowires. Finally, using these scattering models, we
perform drift-diffusion based transport simulations of a nanowire field-effect
transistor and compare the device performances with experimental measurements.
Our device modeling provides insight into performance limits of InAs nanowire
transistors and can be used as a predictive methodology for nanowire-based
integrated circuits.
