  We report on DC and microwave electrical transport measurements in
silicon-on-insulator CMOS nano-transistors at low and room temperature. At low
source-drain voltage, the DC current and RF response show signs of conductance
quantization. We attribute this to Coulomb blockade resulting from barriers
formed at the spacer-gate interfaces. We show that at high bias transport
occurs thermionically over the highest barrier: Transconductance traces
obtained from microwave scattering-parameter measurements at liquid helium and
room temperature is accurately fitted by a thermionic model. From the fits we
deduce the ratio of gate capacitance and quantum capacitance, as well as the
electron temperature.
