  Neutral helium atom microscopy is a novel microscopy technique that offers
strictly surface-sensitive, non-destructive imaging. Several experiments have
been published in recent years where images are obtained by scanning a helium
beam spot across a surface and recording the variation in scattered intensity
at a fixed total scattering angle $\theta_{sd}$ and fixed incident angle
$\theta_{i}$ relative to the overall surface normal. These experiments used a
spot obtained by collimating the beam (referred to as helium pinhole
microscopy). Alternatively, a beam spot can be created by focusing the beam
with an atom optical element. However up till now imaging with a focused helium
beam (referred to as helium zone plate microscopy) has only been demonstrated
in transmission. Here we present the first reflection images obtained with a
focused helium beam. Images are obtained with a spot size (FWHM) down to 4.7
$\mu$m $\pm$ 0.5 $\mu$m, and we demonstrate focusing down to a spot size of
about 1 $\mu$m. Furthermore, we present the first experiments measuring the
scattering distribution from a focused helium beam spot. The experiments are
done by varying the incoming beam angle $\theta_{i}$ while keeping the
beam-detector angle $\theta_{sd}$ and the point where the beam spot hits the
surface fixed - in essence, a microscopy scale realization of a standard helium
atom scattering experiment. Our experiments are done using an electron
bombardment detector with adjustable signal accumulation, developed
particularly for helium microscopy.
