  We report the first results from an X-ray polarimeter with a micropattern gas
proportional counter using an amorphous silicon active matrix readout. With
100% polarized X-rays at 4.5 keV, we obtain a modulation factor of 0.33 +/-
0.03, confirming previous reports of the high polarization sensitivity of a
finely segmented pixel proportional counter. The detector described here has a
geometry suitable for the focal plane of an astronomical X-ray telescope.
Amorphous silicon readout technology will enable additional extensions and
improvements.
