  This paper presents the standardization of Proton Induced X-rays Emission
(PIXE) technique for the trace element analysis of thick standard samples.
Three standard reference materials (SRMs) viz-\`a-vis titanium, copper and iron
base alloys were used for the study due to their availability. The protons beam
was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator
and samples were irradiated at different geometry and durations. Spectrum was
acquired using a multi-channel spectrum analyzer while spectrum analysis was
done using a GUPIXWIN model for determination of elemental concentrations of
trace elements. The obtained experimental data was compared with theoretical
data and results were found in close agreement.
