  Single Event Effects (SEEs) - predominately bit-flips in electronics caused
by particle interactions - are a major concern for ASICs operated in high
radiation environments such as ABCStar ASICs, which are designed to be used in
the future ATLAS ITk strip tracker. The chip design is therefore optimised to
protect it from SEEs by implementing triplication techniques such as Triple
Modular Redundancy (TMR). In order to verify the radiation protection
mechanisms of the chip design, the cross-section for Single Event Upsets
(SEUs), a particular class of SEEs, is measured by exposing the chip to
high-intensity particle beams while monitoring it for observed SEUs. This study
presents the setup, the performed measurements, and the results from SEU tests
performed using the latest version of the ABCStar ASIC (ABCStar V1) using a 480
MeV proton beam.
