  Three-dimensional atomic resolution imaging using transmission electron
microscopes is a unique capability that requires challenging experiments.
Linear electron tomography methods are limited by the missing wedge effect,
requiring a high tilt range. Multislice ptychography can achieve deep
sub-{\AA}ngstrom resolution in the transverse direction, but the depth
resolution is limited to 2 to 3 nanometers. In this paper, we propose and
demonstrate an end-to-end approach to reconstructing the electrostatic
potential volume of the sample directly from the 4D-STEM datasets. End-to-end
multi-slice ptychographic tomography recovers several slices at each tomography
tilt angle and compensates for the missing wedge effect. The algorithm is
initially tested in simulation with a Pt@$\mathrm{Al_2O_3}$ core-shell
nanoparticle, where both heavy and light atoms are recovered in 3D from an
unaligned 4D-STEM tilt series with a restricted tilt range of 90 degrees. We
also demonstrate the algorithm experimentally, recovering a Te nanoparticle
with sub-{\AA}ngstrom resolution.
