  In this work, we explored data acquisition protocols and improved data
reduction protocols using PDFgetX3 to obtain reliable data for atomic pair
distribution function (PDF) analysis from a laboratory-based Mo x-ray source. A
variable counting scheme is described that preferentially counts in the
high-angle region of the diffraction pattern. The effects on the resulting PDF
are studied by varying the overall count time, the use of Soller slits, and
limiting the out-of-plane divergence of the incident beam. The protocols are
tested using an amorphous silica and a quartz sample. We also present a
modification to the current PDFgetX3 data corrections to take care of sample
absorption, which was previously neglected in the use of that program for
high-energy synchrotron x-ray data. We show that, despite limitations in the
Q-range and flux of laboratory instruments, reasonable data for PDF model fits
may be obtained using the best protocols in a few hours of counting.
