  Electron backscatter diffraction (EBSD) in the scanning electron microscope
is routinely used for microstructural characterisation of polycrystalline
materials. Maps of EBSD data are typically acquired at high stage tilt and slow
scan speed, leading to tilt and drift distortions that obscure or distort
features in the final microstructure map. In this paper, we describe TrueEBSD,
an automatic postprocessing procedure for distortion correction with
pixel-scale precision. Intermediate images are used to separate tilt and drift
distortion components and fit each to a physically-informed distortion model.
We demonstrate TrueEBSD on three case studies (titanium, zirconium and hydride
containing Zr), where distortion removal has enabled characterisation of
otherwise inaccessible microstructural features.
