  We report local roughness exponents, $\alpha_{\text{loc}}$, for three
interface growth models in one dimension which are believed to belong the
non-linear molecular-beam-epitaxy (nMBE) universality class represented by the
Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum
detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801
(2017)] and compared the outcomes with standard detrending methods. We observe
in all investigated models that ODFA outperforms the standard methods providing
exponents in the narrow interval $\alpha_{\text{loc}}\in[0.96,0.98]$ consistent
with renormalization group predictions for the VLDS equation. In particular,
these exponent values are calculated for the Clarke-Vvdensky and Das
Sarma-Tamborenea models characterized by very strong corrections to the
scaling, for which large deviations of these values had been reported. Our
results strongly support the absence of anomalous scaling in the nMBE
universality class and the existence of corrections in the form
$\alpha_{\text{loc}}=1-\epsilon$ of the one-loop renormalization group analysis
of the VLDS equation.
