  Moir\'e superlattices formed from twisting trilayers of graphene are an ideal
model for studying electronic correlation, and offer several advantages over
bilayer analogues, including more robust and tunable superconductivity and a
wide range of twist angles associated with flat band formation. Atomic
reconstruction, which strongly impacts the electronic structure of twisted
graphene structures, has been suggested to play a major role in the relative
versatility of superconductivity in trilayers. Here, we exploit an
inteferometric 4D-STEM approach to image a wide range of trilayer graphene
structures. Our results unveil a considerably different model for moir\'e
lattice relaxation in trilayers than that proposed from previous measurements,
informing a thorough understanding of how reconstruction modulates the atomic
stacking symmetries crucial for establishing superconductivity and other
correlated phases in twisted graphene trilayers.
