  Soft errors in memories and logic circuits are known to disturb program
execution. In this context, the research community has been proposing a
plethora of fault-tolerance (FT) solutions over the last decades, as well as
fault-injection (FI) approaches to test, measure and compare them. However,
there is no agreed-upon benchmarking suite for demonstrating FT or FI
approaches. As a replacement, authors pick benchmarks from other domains, e.g.
embedded systems. This leads to little comparability across publications, and
causes behavioral overlap within benchmarks that were not selected for
orthogonality in the FT/FI domain.
  In this paper, we want to initiate a discussion on what a benchmarking suite
for the FT/FI domain should look like, and propose criteria for benchmark
selection.
