  The silicon-on-insulator pixel (SOIPIX) detector is a unique
monolithic-structure imaging device currently being developed by the SOIPIX
group led by the High Energy Accelerator Research Organization (KEK). The
detector team at KEK Photon Factory (PF) is also developing an X-ray camera
using INTPIX4NA with a 14.1 $\times$ 8.7 $\mathsf{mm^2}$ sensitive area and
425,984 (832 column $\times$ 512 row matrix) pixels, with a pixel size of 17
$\times$ 17 $\mathsf{\mu m^2}$. The detector has high resolution and
sensitivity for low-intensity X-rays, making it suitable for imaging in optical
systems with lower X-ray intensities, such as an X-ray zooming microscope using
two Fresnel zone plates (FZPs), which is also under development at PF. To
enable imaging under such conditions, we developed a detector cooling system
using a Peltier element to support longer exposure time (~0.5 seconds per
frame). Additionally, we developed a new readout system using DAQ boards
developed by PF, equipped with SiTCP-XG (network controller implemented on
field-programmable gate array) that supports 10 Gbps Ethernet for
high-frame-rate imaging at several hundred hertz. The new X-ray camera was
tested at the PF BL-14A, BL-14B, and AR-NE1A experimental stations, and the
resolution and sensitivity characteristics were confirmed. Given these
confirmed characteristics, this X-ray camera is suitable for X-ray imaging
using 5--20 keV X-rays under low-intensity, low-contrast conditions. These
conditions are ideal for capturing soft tissues with poor contrast, objects
with fine structures, and specimens vulnerable to radiation damage.
