  Copper deposition has been carried out at various time span on glass slide
and silicon substrate by using indigenously developed unbalanced type DC
magnetron sputtering system. The main objective of this work is to study the
crystalline structure of the deposited materials and also to calculate the
crystallite grain size. As a transition metal, Copper nano-particles and
structures have several utilities in the field of photo-catalytic and sensor
applications. Such structures are utilized to provide free electrons that
enhance optical and electrical properties of the photo-catalytic sensor
mate-rials. These nano-catalysts enhance deposition rate and nucleation of
graphitic Carbon Nitride, a popular photo-catalyst. In this work, synthesized
Copper thin film has been characterized by using X-Ray Fluorescence and X-Ray
Diffractometer.
