  The dynamic scaling of mesoscopically thick films (up to $10^{4}$ atomic
layers) grown with the Clarke-Vvedensky model is investigated numerically for
broad ranges of values of the diffusion-to-deposition ratio $R$ and lateral
neighbor detachment probability $\epsilon$, but with no barrier at step edges.
The global roughness scales with the film thickness $t$ as $W \sim
t^{\beta}/\left[R^{3/2}\left(\epsilon + a\right)\right]$, where $\beta \approx
0.2$ is the growth exponent consistent with Villain-Lai-Das Sarma (VLDS)
scaling and $a=0.025$. This general dependence on $R$ and $\epsilon$ is
inferred from renormalization studies and shows a remarkable effect of the
former but a small effect of the latter, for $\epsilon\leq 0.1$. For $R\geq
{10}^4$, very smooth surfaces are always produced. The local roughness shows
apparent anomalous scaling for very low temperatures ($R\leq {10}^2$), which is
a consequence of large scaling corrections to asymptotic normal scaling. The
scaling variable $R^{3/2}\left( \epsilon + a\right)$ also represents the
temperature effects in the scaling of the correlation length and appears in the
dynamic scaling relation of the local roughness, which gives dynamic exponent
$z\approx 3.3$ also consistent with the VLDS class.
