  We present a comprehensive characterization of an individual multiwalled
carbon nanotube transport device combining electron microscopy and Raman
spectroscopy with electrical measurements. Each method gives complementary
information that mutually help to interpret each other. A sample design that
allows for combining these investigation methods on individual carbon nanotube
devices is introduced. This offers a direct correlation of transport features
and shifts of Raman modes with structural properties as e.g. the contact
interface and the morphology of the nanotube.
