  A new experimental equipment allowing to study the sputtering induced by ion
beam irradiation is presented. The sputtered particles are collected on a
catcher which is analyzed in situ by Auger electron spectroscopy without
breaking the ultra high vacuum (less than 10-9mbar), avoiding thus any problem
linked to possible contamination. This method allows to measure the angular
distribution of sputtering yield. Thanks to this new setup it is now possible
to study the sputtering of many elements especially light elements such as
carbon based materials. Preliminary results are presented in the case of highly
oriented pyrolytic graphite and tungsten irradiated by an Ar+ beam at
respectively 2.8 keV and 7 keV.
