  We propose a new technique to measure the infrared scintillation light yield
of rare earth (RE) doped crystals by comparing it to near UV-visible
scintillation of a calibrated Pr:(Lu$_{0.75}$Y$_{0.25}$)$_{3}$Al$_5$O$_{12}$
sample. As an example, we apply this technique to provide the light yield in
visible and infrared range up to \SI{1700}{nm} of this crystal.
