  Here, we report the first successful exfoliation of two-dimensional
Ti$_3$C$_2$T$_x$ MXene through selective etching of silicon from titanium
silicon carbide (Ti$_3$SiC$_2$) MAX. The successful etching and exfoliation of
MXene is confirmed through the shifting of all (00l) peaks to lower angles
along with the increase in c-lattice parameter as determined by X-ray
diffraction technique to detail the material structure. The c-lattice parameter
of multilayered MXene was found to be 19.34{\AA} which was increased to 26.22
{\AA} after delamination process indicating the successful intercalation of
TMA+ ions within the MXene Sheets. The scanning electron microscopy (SEM)
images show the formation of 2D layered structure. The magnetic measurement of
the etched MXene sample was measured using superconducting quantum interference
device (SQUID: Quantum Design). The magnetization vs magnetic (M-H) curves
clearly indicate the ferromagnetic-dominant hysteresis loops at low-temperature
as well as at room-temperature along with the presence of small diamagnetic
phase due to the presence of silicon carbide (SiC) present in MXene structure.
The presence of SiC phase is confirmed through XRD and Raman spectra that show
the sharp peaks and vibrational modes of SiC within 2D MXene structure. The
present work shows the co-existence of ferromagnetic and diamagnetic phases
making it suitable 2D material for future spintronics devices.
