  We investigate theoretically the resonant inelastic x-ray scattering (RIXS)
at the $K$ edge of Si on the basis of an ab initio calculation. We calculate
the RIXS spectra with systematically varying transfered-momenta,
incident-photon energy and incident-photon polarization. We confirm the
anisotropy of the experimental spectra by Y. Ma {\it et al}. (Phys. Rev. Lett.
74, 478 (1995)), providing a quantitative explanation of the spectra.
