  Optical weak measurements are a powerful tool for measuring small shifts of
optical paths. When applied to the measurement of the Goos-Haenchen shift, in
particular, a special step must be added to its protocol: the removal of the
relative Goos-Haenchen phase, since its presence generates a destructive
influence on the measurement. There is, however, a lack of description in the
literature of the precise effect of the Goos-Haenchen phase on weak
measurements. In this paper we address this issue, developing an analytic study
for a Gaussian beam transmitted through a dielectric structure. We obtain
analytic expressions for weak measurements as a function of the relative
Goos-Haenchen phase and show how to remove it without the aid of waveplates.
