  In this paper, we introduce a general scientific CCD simulation and test
system which can meet the test requirements of different types of CCD chips
from E2V company, such as measuring different signals output from modules of a
CCD controller including power supply, fan, temperature control module, crystal
oscillator, shutter and clock-bias generator. Furthermore, the video signal of
the CCD detector can be simulated and superimposed with random noise to verify
the performance of the video sampling circuit of the CCD controller. The
simulation and test system was successful used for the CCD controller which was
designed for E2V CCD47-20 detector.
