  A new material characterization technique is emerging for the transmission
electron microscope (TEM). Using electron energy-loss spectroscopy, real space
mappings of the underlying electronic transitions in the sample, so called
orbital maps, can be produced. Thus, unprecedented insight into the electronic
orbitals responsible for most of the electrical, magnetic and optical
properties of bulk materials can be gained. However, the incredibly demanding
requirements on spatial as well as spectral resolution paired with the low
signal-to-noise ratio severely limits the day-to-day use of this new technique.
With the use of simulations, we strive to alleviate these challenges as much as
possible by identifying optimal experimental parameters. In this manner, we
investigate representative examples of a transition metal oxide, a material
consisting entirely of light elements, and an interface between two different
materials to find and compare acceptable ranges for sample thickness,
acceleration voltage and electron dose for a scanning probe as well as for
parallel illumination.
