  AMORPH utilizes a new Bayesian statistical approach to interpreting X-ray
diffraction results of samples with both crystalline and amorphous components.
AMORPH fits X-ray diffraction patterns with a mixture of narrow and wide
components, simultaneously inferring all of the model parameters and
quantifying their uncertainties. The program simulates background patterns
previously applied manually, providing reproducible results, and significantly
reducing inter- and intra-user biases. This approach allows for the
quantification of amorphous and crystalline materials and for the
characterization of the amorphous component, including properties such as the
centre of mass, width, skewness, and nongaussianity of the amorphous component.
Results demonstrate the applicability of this program for calculating amorphous
contents of volcanic materials and independently modeling their properties in
compositionally variable materials.
