  In the quest of understanding significant variations in the physical,
chemical and electronic properties of the novel functional materials, low
temperature Synchrotron X-ray Diffraction (LT-SXRD) measurements on CTO (a
type-II) and CMTO (a type-I) multiferroics are presented. Magnetic phase
diagram of CTO shows multiple magnetic transitions at zero fields, whereas, in
CMTO, 20 K enhancement in the antiferromagnetic transition temperature is
observed followed by near room temperature Griffiths phase. Rietveld analysis
on LT-SXRD data of both the samples indicates important observations. For both
CTO and CMTO, the magnetic anomalies are followed by structural anomalies,
which is a clear signature of spin lattice coupling and the positive shift of
spin lattice coupling from CTO to CMTO.
