  The empirical Coffin-Manson law has been used to characterize the low-cycle
mechanical fatigue failure of metallic materials for decades. Our experimental
studies reported in this letter have shown that the electrical fatigue failure
in dielectrics can be well described by a fitting function having the same
mathematical expression as that of the Coffin-Manson law. This observation
indicates that the physical mechanism beneath the formation and evolution of
atomic disordered structures, the key factor influencing both mechanical and
electrical fatigue, might be the same.
