  Forescatter electron imaging is a popular microscopy technique, especially
for scanning electron microscopes equipped with an electron backscatter
diffraction detector. In principal, this method enables qualitative imaging of
microstructure but quantitative assessment can be limited due to limited
information about the contrast afforded. In this work, we explore forescatter
electron imaging and demonstrate that imaging can be optimised for topographic,
phase, and subtle orientation contrast imaging through appropriate sample and
detector positioning. We demonstrate the relationship between imaging modes
using systematic variation in detector positioning and compare this with
pseudo-forescatter electron images, obtained from image analysis of diffraction
patterns, to explore and confirm image contrast modes. We demonstrate these
contrast mechanisms on a map obtained from a sample of the Gibeon meteorite.
