  The aggressive scaling down of flash memories has threatened data reliability
since the scaling down of cell sizes gives rise to more serious degradation
mechanisms such as cell-to-cell interference and lateral charge spreading. The
effect of these mechanisms has pattern dependency and some data patterns are
more vulnerable than other ones. In this paper, we will categorize data
patterns taking into account degradation mechanisms and pattern dependency. In
addition, we propose several modulation coding schemes to improve the data
reliability by transforming original vulnerable data patterns into more robust
ones.
