  We propose a threshold detector for L\'evy distributed fluctuations based on
a Josephson junction. The L\'evy noise current added to a linearly ramped bias
current results in clear changes in the distribution of switching currents out
of the zero-voltage state of the junction. We observe that the analysis of the
cumulative distribution function of the switching currents supplies information
on both the characteristics shape parameter $\alpha$ of the L\'evy statistics
and the intensity of the fluctuations. Moreover, we discuss a theoretical model
which allows to extract characteristic features of the L\'evy fluctuations from
a measured distribution of switching currents. In view of this results, this
system can effectively find an application as a detector for a L\'evy signal
embedded in a noisy background.
