  We review the status of the understanding of single-electron transport (SET)
devices with respect to their applicability in metrology. Their envisioned role
as the basis of a high-precision electrical standard is outlined and is
discussed in the context of other standards. The operation principles of single
electron transistors, turnstiles and pumps are explained and the fundamental
limits of these devices are discussed in detail. We describe the various
physical mechanisms that influence the device uncertainty and review the
analytical and numerical methods needed to calculate the intrinsic uncertainty
and to optimise the fabrication and operation parameters. Recent experimental
results are evaluated and compared with theoretical predictions. Although there
are discrepancies between theory and experiments, the intrinsic uncertainty is
already small enough to start preparing for the first SET-based metrological
applications.
