  We report here perhaps the first successful synthesis and structural
characterization of the n=3 family member of Tin+1AlCn, i. e. Ti4AlC3. X-ray
Powder diffraction (XRD) data shows characteristic reflections of from
corresponding to reflections from the (002), (004), (006), (008), (100), (102),
(104), (0010), (105), (106), (0012), (1011) and (1012) planes at 2{\theta}
=7.640, 15.170, 22.760, 30.50, 350, 37.40 38.30, 39.20, 41.30, 46.220, 55.240,
58.620 and 60.780 (double structure) respectively. Rietveld refinement of the
XRD data reveals a phase purity of about 79 % for alpha-Ti4AlC3, 15 % for
beta-Ti4AlC3 and the rest mostly that of cubic TiC (6 %). The primary crystal
symmetry of the two dominant phases is the hexagonal P63/mmc. The precursors
chosen were TiH2, Al metal powder and Carbon powder in a molar ratio of
3:1.2:2, which build the case for an Al-deficient condition. We adopted the
pressureless sintering technique at 13500 C with a dwelling time of 4 hours
under ultra-high vacuum of 10-7 mbar. The co-existence of trace amount of
Ti2AlC at 1350 deg C is proven by the small structure at 2{\theta}=13.130. No
trace of oxides like Al2O3 or TiO2 was found in the end product. The line
profile width of XRD data indicates average grain size of the order of micro
meter. The Scanning Electron Microscopy images show highly lamellar stacked
growth of almost a pure MAX (alpha or beta) phase and grain size of micron
order, agreeing well with the XRD data.
