  The projected electrostatic potential of a thick crystal is reconstructed at
atomic-resolution from experimental scanning transmission electron microscopy
data recorded using a new generation fast- readout electron camera. This
practical and deterministic inversion of the equations encapsulating multiple
scattering that were written down by Bethe in 1928 removes the restriction of
established methods to ultrathin ($\lesssim 50$ {\AA}) samples. Instruments
already coming on-line can overcome the remaining resolution-limiting effects
in this method due to finite probe-forming aperture size, spatial incoherence
and residual lens aberrations.
