  We obtained a semi-analytical treatment obtaining estimators for the sample
variance and variance of sample variance for the RTS noise. Our method suggests
a way to experimentally determine the constants of capture and emission in the
case of a dominant trap and universal behaviors for the superposition from many
traps. We present detailed closed-form expressions corroborated by MC
simulations. We are sure to have an important tool to guide developers in
building and analyzing low-frequency noise in semiconductor devices.
