  We examine the effect of different sources of technical noise on inverse weak
value-based precision phase measurements. We find that this type of measurement
is similarly robust to technical noise as related experiments in the weak value
regime. In particular, the measurements considered here are robust to additive
Gaussian white noise and angular jitter noise commonly encountered in optical
experiments. Additionally, we show the same techniques used for precision phase
measurement can be used with the same technical advantages for optical
frequency measurements.
