  We analyze the effects of lateral device size and magnetic material
parameters on the ferromagnetic resonance (FMR) response. Results presented are
directly relevant to widely used FMR experimental techniques for extracting
magnetic parameters from thin films, the results of which are often assumed to
carry over to corresponding nanometer-sized patterned devices. We show that
there can be significant variation in the FMR response with device size, and
that the extent of the variation depends on the magnetic material properties.
This explains, for example, why different experiments along these lines have
yielded different size-dependent trends from damping measurements. Observed
trends with increasing size and different material parameters are explained
through the evolution of three distinct eigen-modes, demonstrating the
respective roles of demagnetization and exchange. It is also shown that there
is a crossover of dominant eigen-modes in the response signal, accompanied by
conjugating edge-type modes, leading to evident effects in measured linewidth
and damping. Among the sizes considered, in higher saturation magnetization, we
observe as much as a 40% increase in apparent damping, due solely to device
size variation.
