  A recently introduced two-channel confocal microscope with correlated
detection promises up to 50% improvement in transverse spatial resolution
[Simon, Sergienko, Optics Express {\bf 18}, 9765 (2010)] via the use of photon
correlations. Here we achieve similar results in a different manner,
introducing a triple-confocal correlated microscope which exploits the
correlations present in optical parametric amplifiers. It is based on tight
focusing of pump radiation onto a thin sample positioned in front of a
nonlinear crystal, followed by coincidence detection of signal and idler
photons, each focused onto a pinhole. This approach offers further resolution
enhancement in confocal microscopy.
