  We show that the recent experimental claim [Pudalov {\it et al}. \prl {\bf
91}, 126403 (2003) ] of observing ``interaction effects in the conductivity of
Si inversion layers at intermediate temperatures'' is incorrect and misleading.
In particular, the temperature dependent conductivity $\sigma$, in contrast to
the resistivity (which is what is shown in the paper), does not have a linear
temperature regime, rendering the extraction of the slope $d\sigma/dT$
completely arbitrary. We also show that, at least for higher densities, the
standard semiclassical transport theory, which includes realistic disorder
effects such as scattering by {\it screened} charged impurity and surface
roughness, gives essentially quantitative agreement with the experimental data.
