  This is a Comment on a recent publication: Y.-P. Zhao et al., Phys. Rev.
Lett. 85, 3229 (2000). In the Letter, the authors report on an experimental
investigation of polymeric (p-xylene) thin film growth and propose a new
universality class not previously known. Here, we point out that the critical
exponents reported in the Letter are consistent with the critical exponents of
Das Sarma-Tamborenea growth model.
