  Ion beam analysis techniques are among the most powerful tools for advanced
material characterization. Despite their growing relevance in a widening number
of fields, most ion beam analysis facilities still rely on the oldest
accelerator technologies, with severe limitations in terms of portability and
flexibility. In this work we thoroughly address the potential of superintense
laser-driven proton sources for this application. We develop a complete
analytical and numerical framework suitable to describe laser-driven ion beam
analysis, exemplifying the approach for Proton Induced X-ray/Gamma-ray
emission, a technique of widespread interest. This allows us to propose a
realistic design for a compact, versatile ion beam analysis facility based on
this novel concept. These results can pave the way for ground-breaking
developments in the field of hadron-based advanced material characterization.
