  Workflows have been developed in the past decade to enable atom probe
tomography analysis at cryogenic temperatures. The inability to control the
local deposition of the metallic precursor from the gas-injection system (GIS)
at cryogenic temperature makes the preparation of site-specific specimens by
using lift-out extremely challenging in the focused-ion beam. Schreiber et al.
exploited redeposition to weld the lifted-out sample to a support. Here we
build on their approach to attach the region-of-interest and additionally
strengthen the interface with locally sputtered metal from the
micromanipulator. Following standard focused-ion beam annular milling, we
demonstrate atom probe analysis of Si in both laser pulsing and voltage mode,
with comparable analytical performance as a pre-sharpened microtip coupon. Our
welding approach is versatile, as various metals could be used for sputtering,
and allows similar flexibility as the GIS in principle.
