  We study the entanglement behavior of a random unitary circuit punctuated by
projective measurements at the measurement-driven phase transition in one
spatial dimension. We numerically study the logarithmic entanglement negativity
of two disjoint intervals and find that it scales as a power of the
cross-ratio. We investigate two systems: (1) Clifford circuits with projective
measurements, and (2) Haar random local unitary circuit with projective
measurements. Remarkably, we identify a power-law behavior of entanglement
negativity at the critical point. Previous results of entanglement entropy and
mutual information point to an emergent conformal invariance of the
measurement-driven transition. Our result suggests that the critical behavior
of the measurement-driven transition is distinct from the ground state behavior
of any \emph{unitary} conformal field theory.
