  We demonstrate a simple and quick method for the measurement of the in-plane
thermal conductance of thin films via steady-state IR thermography. The films
are suspended above a hole in an opaque substrate and heated by a homogeneous
visible light source. The temperature distribution of the thin films is
captured via infrared microscopy and fitted to the analytical expression
obtained for the specific hole geometry in order to obtain the in-plane thermal
conductivity. For thin films of poly(3,4-ethylenedioxythiophene):polystyrene
sulfonate post-treated with ethylene glycol and of polyimide we find
conductivities of 1.0 W/mK and 0.4 W/mK at room temperature, respectively.
These results are in very good agreement with literature values, validating the
method developed.
