  This work presents a methodology to the morphology analysis and
characterization of nanostructured material images acquired from FEG-SEM (Field
Emission Gun-Scanning Electron Microscopy) technique. The metrics were
extracted from the image texture (mathematical surface) by the volumetric
fractal descriptors, a methodology based on the Bouligand-Minkowski fractal
dimension, which considers the properties of the Minkowski dilation of the
surface points. An experiment with galvanostatic anodic titanium oxide samples
prepared in oxalyc acid solution using different conditions of applied current,
oxalyc acid concentration and solution temperature was performed. The results
demonstrate that the approach is capable of characterizing complex morphology
characteristics such as those present in the anodic titanium oxide.
