  The electronic properties of moir\'e heterostructures depend sensitively on
the relative orientation between layers of the stack. For example,
near-magic-angle twisted bilayer graphene (TBG) commonly shows
superconductivity, yet a TBG sample with one of the graphene layers
rotationally aligned to a hexagonal Boron Nitride (hBN) cladding layer provided
the first experimental observation of orbital ferromagnetism. To create samples
with aligned graphene/hBN, researchers often align edges of exfoliated flakes
that appear straight in optical micrographs. However, graphene or hBN can
cleave along either zig-zag or armchair lattice directions, introducing a 30
degree ambiguity in the relative orientation of two flakes. By characterizing
the crystal lattice orientation of exfoliated flakes prior to stacking using
Raman and second-harmonic generation for graphene and hBN, respectively, we
unambiguously align monolayer graphene to hBN at a near-0 degree, not 30
degree, relative twist angle. We confirm this alignment by torsional force
microscopy (TFM) of the graphene/hBN moir\'e on an open-face stack, and then by
cryogenic transport measurements, after full encapsulation with a second,
non-aligned hBN layer. This work demonstrates a key step toward systematically
exploring the effects of the relative twist angle between dissimilar materials
within moir\'e heterostructures.
