  A new far-field optical microscopy technique capable of reaching
nanometer-scale resolution has been developed recently using the in-plane image
magnification by surface plasmon polaritons. This microscopy is based on the
optical properties of a metal-dielectric interface that may, in principle,
provide extremely large values of the effective refractive index n up to
100-1000 as seen by the surface plasmons. Thus, the theoretical diffraction
limit on resolution becomes lambda/2n, and falls into the nanometer-scale
range. The experimental realization of the microscope has demonstrated the
optical resolution better than 50 nm for 502 nm illumination wavelength.
However, the theory of such surface plasmon-based far-field microscope
presented so far gives an oversimplified picture of its operation. For example,
the imaginary part of the metal dielectric constant severely limits the
surface-plasmon propagation and the shortest attainable wavelength in most
cases, which in turn limits the microscope magnification. Here I describe how
this limitation has been overcome in the experiment, and analyze the practical
limits on the surface plasmon microscope resolution. In addition, I present
more experimental results, which strongly support the conclusion of extremely
high spatial resolution of the surface plasmon microscope.
