  Single quantum emitters coupled to different plasmonic and photonic
structures are key elements for integrated quantum technologies. In order to
fully exploit these elements, e.g. for quantum enhanced sensors or quantum
repeaters, a reliable fabrication method as enabling technology is crucial. In
this work, we present a method that allows for positioning of individual nano
crystals containing single quantum light sources on non-transparent conductive
samples with sub-micrometer precision. We induce long-range electrostatic
forces between an atomic force microscope (AFM) tip, which carries a nano
particle, and the target surface. This allows for mapping of the target area in
non contact mode. Then, the placement site can be identified with high accuracy
without any tip approach, eliminating the risk of a particle loss. We
demonstrate the strength of the method by transferring a diamond nano crystal
containing a single nitrogen-vacancy defect to the center of a micrometer-sized
silver bullseye antenna with nanometer resolution. Our approach provides a
simple and reliable assembling technology for positioning single nano objects
on opaque substrates with high reproducibility and precision.
