  We present a controlled mode of "topological" displacement of homogeneous
piezo films that arises solely from an inhomogeneous in-plane strain due to an
inhomogeneous polarization. For the rotationally symmetric case, we develop a
theoretical model that analytically relates the shape of the displacement to
the polarization for the cases of in-plane and out-of-plane polarization. This
is verified for several examples, and we further demonstrate controlled
asymmetric deformations.
