  Bragg coherent X-ray diffraction imaging (BCDI) allows the three-dimensional
(3D) measurement of lattice strain along the scattering vector for specific
microcrystals. If at least three linearly independent reflections are measured,
the 3D variation of the full lattice strain tensor within the microcrystal can
be recovered. However, this requires knowledge of the crystal orientation,
which is typically attained via estimates based on crystal geometry or
synchrotron micro-beam Laue diffraction measurements. Here, we present an
alternative method to determine the crystal orientation for BCDI measurements,
by using electron backscatter diffraction (EBSD) to align Fe-Ni and Co-Fe alloy
microcrystals on three different substrates. The orientation matrix is
calculated from EBSD Euler angles and compared to the orientation determined
using micro-beam Laue diffraction. The average angular mismatch between the
orientation matrices is less than ~6 degrees, which is reasonable for the
search for Bragg reflections. We demonstrate the use of an orientation matrix
derived from EBSD to align and measure five reflections for a single Fe-Ni
microcrystal using multi-reflection BCDI. Using this dataset, a refined strain
field computation based on the gradient of the complex exponential of the phase
is developed. This approach is shown to increase accuracy, especially in the
presence of dislocations. Our results demonstrate the feasibility of using EBSD
to pre-align BCDI samples and the application of more efficient approaches to
determine the lattice strain tensor with greater accuracy.
