  In this Letter, we report a demonstration of ion and electron ghost imaging.
Two beams of correlated ions and electrons are produced by a photoionization
process and accelerated into opposite directions. Using a single time and
position sensitive detector for one beam, we can image an object seen by the
other beam even when the detector that sees this object has no spatial
resolution. The extra information given by this second detector can, therefore,
be used to reconstruct the image thanks to the correlation between the ions and
the electrons. In our example, a metallic mask placed in front of a
time-sensitive detector is used as the object to image. We demonstrated ion and
electron ghost imaging using this mask in a transmission mode. These primary
results are very promising and open applications especially in ion and electron
imaging in surface science and nanophysics.
