  We present an imaging technique that allows the recovery of the transparency
profile of wavelength-scale objects with deep subwavelength resolution based on
far-field intensity measurements. The approach, interscale mixing microscopy
(IMM), relies on diffractive element positioned in the near-field proximity to
the object, to scatter information carried by evanescent waves into propagating
part of the spectrum. A combination of numerical solutions of Maxwell equations
and nonlinear fitting is then used to recover the information about the object
based on far-field intensity measurements. The potential of the developed
formalism to recover wavelength/20 features of wavelength-scale objects in
presence of up to 10% noise is demonstrated.
