  The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy
Electron Microscopy (LEEM) techniques to the study of the electronic and
chemical structure of ferroelectric materials is reviewed. Electron optics in
both techniques gives spatial resolution of a few tens of nanometres. PEEM
images photoelectrons whereas LEEM images reflected and elastically
backscattered electrons. Both PEEM and LEEM can be used in direct and
reciprocal space imaging. Together, they provide access to surface charge, work
function, topography, chemical mapping, surface crystallinity and band
structure. Examples of applications for the study of ferroelectric thin films
and single crystals are presented.
