  A method is presented for the registration and correlation of intrinsic
property maps of materials, including data from nanoindentation hardness,
Electron Back-Scattered Diffraction (EBSD), Electron Micro-Probe Analysis
(EPMA). This highly spatially resolved method allows for the study of
micron-scale microstructural features, and has the capability to rapidly
extract correlations between multiple features of interest from datasets
containing thousands of datapoints. Two case studies are presented in
commercially pure (CP) titanium: in the first instance, the effect of crystal
anisotropy on measured hardness and, in the second instance, the effect of an
oxygen diffusion layer on hardness. The independently collected property maps
are registered us-ing affine geometric transformations and are interpolated to
allow for direct correlation. The results show strong agreement with trends
observed in the literature, as well as providing a large dataset to facilitate
future statistical analysis of microstructure-dependent mechanisms.
