  We present a study that evaluates the impact of regularization on the
achieved resolution in restorations from a novel three-dimensional (3D)
Structured Illumination Microscopy (3D-SIM) system with desirable tunability
properties. This contribution is the first performance evaluation of the
Tunable SIM (TSIM) system through the restoration process. The study quantifies
the achieved resolution in restorations, from simulated TSIM data of a 3D
star-like object, at various expected resolution limits controlled by system
parameters, and at different noise levels mitigated by the Generalized Wiener
filter, a computationally efficient method, successfully applied to other
conventional 3D-SIM systems. We show that theoretical TSIM resolution limits
are attained in the absence of noise, while with increasing noise levels, the
necessary increase in regularization and residual restoration artifacts
contributed to a $\sim$ 5%-10% and a 20% reduction in the axial achieved
resolution, in 20-dB and 15-dB data, respectively, which is within the pixel
size (20 nm) limitation.
