  We report new experimental studies to understand the physics of phonon
sensors which utilize quasiparticle diffusion in thin aluminum films into
tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic
TES physics and a simple physical model of the overlap region between the W and
Al films in our devices enables us to accurately reproduce the experimentally
observed pulse shapes from x-rays absorbed in the Al films. We further estimate
quasiparticle loss in Al films using a simple diffusion equation approach.
