  Plasmonic circuitry is considered as a promising solution-effective
technology for miniaturizing and integrating the next generation of optical
nano-devices. A key element is the shared metal network between electrical and
optical information enabling an efficient hetero-integration of an electronic
control layer and a plasmonic data link. Here, we investigate to what extend
surface plasmons and current-carrying electrons interfere in such a shared
circuitry. By synchronously recording surface plasmon propagation and
electrical output characteristics of single chemically-synthesized silver
nanowires we determine the limiting factors hindering the co-propagation of
electrical current and surface plasmons in these nanoscale circuits.
