  A new method for identifying crystalline phases in X-ray diffraction data has
been proposed, which is especially useful for the study of multiphase materials
(more than eight - ten phases) with a relatively low content (less than 1 - 3
wt\%). The method is based on a statistical analysis of data and provides an
unambiguous non-quantitative criterion for the presence of one or another phase
in the material. It has been shown that the method works reliably in cases
where a significant number of reflexes (more than several dozen) on the
diffraction pattern are comparable with intensity-to-noise ratio.
