  We introduce the fully-depleted charge-coupled device (CCD) as a particle
detector. We demonstrate its low energy threshold operation, capable of
detecting ionizing energy depositions in a single pixel down to 50 eVee. We
present results of energy calibrations from 0.3 keVee to 60 keVee, showing that
the CCD is a fully active detector with uniform energy response throughout the
silicon target, good resolution (Fano ~0.16), and remarkable linear response to
electron energy depositions. We show the capability of the CCD to localize the
depth of particle interactions within the silicon target. We discuss the mode
of operation and unique imaging capabilities of the CCD, and how they may be
exploited to characterize and suppress backgrounds. We present the first
results from the deployment of 250 um thick CCDs in SNOLAB, a prototype for the
upcoming DAMIC100. DAMIC100 will have a target mass of 0.1 kg and should be
able to directly test the CDMS-Si signal within a year of operation.
