  In this work, limiting factors for developing metrologically useful arrays
from epitaxial graphene on SiC are lifted with a combination of
centimeter-scale, high-quality material growth and the implementation of
superconducting contacts. Standard devices for metrology have been restricted
to having a single quantized value output based on the $\nu$ = 2 Landau level.
With the demonstrations herein of devices having multiple outputs of quantized
values available simultaneously, these versatile devices can be used to
disseminate the ohm globally. Such devices are designed to give access to
quantized resistance values over the range of three orders of magnitude,
starting as low as the standard value of approximately 12.9 k$\Omega$ and
reaching as high as 1.29 M$\Omega$. Several experimental methods are used to
assess the quality and versatility of the devices, including standard lock-in
techniques and Raman spectroscopy.
