  We report on the development of an ultrafast Transmission Electron Microscope
based on a cold field emission source which can operate in either DC or
ultrafast mode. Electron emission from a tungsten nanotip is triggered by
femtosecond laser pulses which are tightly focused by optical components
integrated inside a cold field emission source close to the cathode. The
properties of the electron probe (brightness, angular current density,
stability) are quantitatively determined. The measured brightness is the
largest reported so far for UTEMs. Examples of imaging, diffraction and
spectroscopy using ultrashort electron pulses are given. Finally, the potential
of this instrument is illustrated by performing electron holography in the
off-axis configuration using ultrashort electron pulses.
