  This study explores the dynamics of charge transport within a cryogenic
P-type Ge particle detector, fabricated from a crystal cultivated at the
University of South Dakota (USD). By subjecting the detector to cryogenic
temperatures and an Am-241 source, we observe evolving charge dynamics and the
emergence of cluster dipole states, leading to the impact ionization process at
40 mK. Our analysis focuses on crucial parameters: the zero-field cross-section
of cluster dipole states and the binding energy of these states. For the Ge
detector in our investigation, the zero-field cross-section of cluster dipole
states is determined to be $8.45 \times 10^{-11}\pm 4.22\times 10^{-12}~cm^2$.
Examination of the binding energy associated with cluster dipole states, formed
by charge trapping onto dipole states during the freeze-out process, reveals a
value of $0.034 \pm 0.0017$ meV. These findings shed light on the intricate
charge states influenced by the interplay of temperature and electric field,
with potential implications for the sensitivity in detecting low-mass dark
matter.
