  Serial electron diffraction (SerialED) is an emerging technique, which
applies the snapshot data-collection mode of serial X-ray crystallography to
three-dimensional electron diffraction (3D ED), forgoing the conventional
rotation method. Similarly to serial X-ray crystallography, this approach leads
to almost complete absence of radiation damage effects even for the most
sensitive samples, and allows for a high level of automation. However, SerialED
also necessitates new techniques of data processing, which combine existing
pipelines for rotation electron diffraction and serial X-ray crystallography
with some more particular solutions for challenges arising in SerialED
specifically. Here, we introduce our analysis pipeline for SerialED data, and
its implementation using the CrystFEL and diffractem program packages. Detailed
examples are provided in extensive supplementary code.
