  Domain engineering technology in lithium tantalate is a well studied approach
for nonlinear optical applications. However, for several cases of interest, the
realization of short period structures (< 2 \mu m) is required, which make
their characterization difficult with standard techniques. In this work, we
show that high resolution x-ray diffraction is a convenient approach for the
characterization of such structures, allowing us to obtain in a nondestructive
fashion information such as the average domain period, the domain wall
inclination, and the overall structure quality.
