  Small-angle X-ray scattering (SAXS) technique enables convenient nanoscopic
characterization for various systems and conditions. Nonetheless, lab-based
SAXS systems intrinsically suffer from insufficient x-ray flux and limited
angular resolution. Here, we develop a two-step reconstruction methodology to
enhance the angular resolution for given experimental conditions. Using minute
hardware additions, we show that translating the x-ray detector in subpixel
steps and modifying the incoming beam shape results in a set of 2D scattering
images which is sufficient for super-resolution SAXS reconstruction. The
technique is verified experimentally to show above 25\% increase in resolution.
Such advantages have a direct impact on the ability to resolve faster and finer
nanoscopic structures and can be implemented in most existing SAXS apparatuses.
