  A novel method capable of delivering relative optical path length metrology
with nanometer precision is demonstrated. Unlike conventional dual-wavelength
metrology which employs heterodyne detection, the method developed in this work
utilizes direct detection of interference fringes of two He-Ne lasers as well
as a less precise stepper motor open-loop position control system to perform
its measurement. Although the method may be applicable to a variety of
circumstances, the specific application where this metrology is essential is in
an astrometric optical long baseline stellar interferometer dedicated to
precise measurement of stellar positions. In our example application of this
metrology to a narrow-angle astrometric interferometer, measurement of
nanometer precision could be achieved without frequency-stabilized lasers
although the use of such lasers would extend the range of optical path length
the metrology can accurately measure. Implementation of the method requires
very little additional optics or electronics, thus minimizing cost and effort
of implementation. Furthermore, the optical path traversed by the metrology
lasers is identical with that of the starlight or science beams, even down to
using the same photodetectors, thereby minimizing the non-common-path between
metrology and science channels.
