  Using transmission electron microscopy (TEM) to analyse the physical-chemical
surface properties of subwavlength structured silver films and
finite-difference time-domain (FDTD) numerical simulations of the optical
response of these structures to plane-wave excitation, we report on the origin
and nature of the persistent surface waves generated by a single slit-groove
motif and recently measured by far-field optical interferometry. The surface
analysis shows that the silver films are free of detectable oxide or sulfide
contaminants, and the numerical simulations show very good agreement with the
results previously reported.
