  The densification, delamination and crack growth behavior in a
Ce$_{0.9}$Gd$_{0.1}$O$_{1.95}$ (CGO) and
(La$_{0.85}$Sr$_{0.15})_{0.9}$MnO$_{3}$ (LSM) multi-layer ceramic sample was
studied using in situ X-ray tomographic microscopy (microtomography), to
investigate the critical dynamics of crack propagation and delamination in a
multilayered sample. Naturally occurring defects, caused by the sample
preparation process, are shown not to be critical in sample degradation.
Instead defects are nucleated during the debinding step. Crack growth is
significantly faster along the material layers than perpendicular to them, and
crack growth and delamination only accelerates when sintering occurs.
