  High-resolution X-ray photoemission electron microscopy (X-PEEM) is a
well-established method for imaging ferroelectric domain structures. Here, we
expand the scope of application of X-PEEM and demonstrate its capability for
imaging and investigating domain walls in ferroelectrics with high-spatial
resolution. Using ErMnO3 as test system, we show that ferroelectric domain
walls can be visualized based on photo-induced charging effects and local
variations in their electronic conductance can be mapped by analyzing the
energy distribution of photoelectrons. Our results open the door for
non-destructive, contract-free, and element-specific studies of the electronic
and chemical structure at domain walls in ferroelectrics.
