  An algorithm to measure the drift time of charge carriers in p-type point
contact (PPC) high-purity germanium (HPGe) detectors from the signals processed
with a charge-sensitive preamplifier is introduced. It is demonstrated that the
drift times can be used to estimate the distance of charge depositions from the
point contact and to characterize losses due to charge trapping. A correction
for charge trapping effects over a wide range of energies is implemented using
the measured drift times and is shown to improve the energy resolution by up to
30%.
