  Synchrotron based photoemission electron microscopy with energy filter
combines real space imaging with microprobe diffraction ($\mu$-ARPES), giving
access to the local electronic structure of laterally inhomogeneous materials.
We present here an overview of the capabilities of this technique, illustrating
selected applications of angle resolved photoemission electron microscopy and
related microprobe methods. In addition, we report the demonstration of a
darkfield XPEEM (df-XPEEM) imaging method for real space mapping of the
electronic structure away from $\Gamma$ at a lateral resolution of few tens of
nm. The application of df-XPEEM to the (1$\times$12)-O/W(110) model oxide
structure shows the high sensitivity of this technique to the local electronic
structure, allowing to image domains with inequivalent adsorption site
symmetry. Perspectives of angle resolved PEEM are discussed.
