  Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface
with a resolution in the nanometer range. The exceptional resolution attainable
with the AFM makes this instrument a key tool in nanoscience and technology.
The core of the set-up relies on the detection of the mechanical properties of
a micro-oscillator when approached to a sample to image. Despite the fact that
AFM is nowadays a very common instrument for research and development
applications, thanks to the exceptional performances and the relative
simplicity to use it, the fabrication of the micrometric scale mechanical
oscillator is still a very complicated and expensive task requiring a dedicated
platform. Being able to perform atomic force microscopy with a macroscopic
oscillator would make the instrument more versatile and accessible for an even
larger spectrum of applications and audiences. We present for the first time
atomic force imaging with a centimetric oscillator. We show how it is possible
to perform topographical images with nanometric resolution with a grams tuning
fork. The images presented here are obtained with an aluminum tuning fork of
centimeter size as sensor on which an accelerometer is glued on one prong to
measure the oscillation of the resonator. In addition to the stunning
sensitivity, by imaging both in air and in liquid, we show the high versatility
of such oscillator. The set up proposed here can be extended to numerous
experiments where the probe needs to be heavy and/or very complex as well as
the environment.
