  The thermal fluctuations of the electric field between the CuO_2 planes of
layered cuprates are considered as an origin of the electrical resistivity. The
model evaluation employs a set of separate plane capacitors each having area
equal to the squared in-plane lattice constant a_0^2. It is shown that the
scattering of charge carriers by the fluctuation of electric charge in the
conducting CuO_2 planes gives rise to the in-plane electrical resistivity
rho_ab. Such a mechanism can be viewed as an analog of the Rayleigh's blue-sky
law---the charge carriers are scattered by thermal fluctuations of electron
density.
