  In this article, we investigate the problem of entanglement characterization
with polarization measurements combined with maximum likelihood estimation
(MLE). A realistic scenario is considered with measurement results distorted by
random experimental errors. In particular, by imposing unitary rotations acting
on the measurement operators, we can test the performance of the tomographic
technique versus the amount of noise. Then, dark counts are introduced to
explore the efficiency of the framework in a multi-dimensional noise scenario.
The concurrence is used as a figure of merit to quantify how well entanglement
is preserved through noisy measurements. Quantum fidelity is computed to
quantify the accuracy of state reconstruction. The results of numerical
simulations are depicted on graphs and discussed.
