  A new method for dark field imaging is introduced which uses scanned electron
diffraction (or 4DSTEM - 4-dimensional scanning transmission electron
microscopy datasets) as its input. Instead of working on simple summation of
intensity, it works on a sparse representation of the diffraction patterns in
terms of a list of their diffraction peaks. This is tested on a thin perovskite
film containing structural ordering resulting in additional superlattice spots
that reveal details of domain structures, and is shown to give much better
selectivity and contrast than conventional virtual dark field imaging. It is
also shown to work well in polycrystalline aggregates of CuO nanoparticles. In
view of the higher contrast and selectivity, and the complete exclusion of
diffuse scattering from the image formation, it is expected to be of
significant benefit for characterisation of a wide variety of crystalline
materials.
