  Using the weak-localization method, we have measured the electron-phonon
scattering times $\tau_{ep}$ in Pd$_{60}$Ag$_{40}$ thick films prepared by DC-
and RF-sputtering deposition techniques. In both series of samples, we find an
anomalous $1/\tau_{ep} \propto T^2\ell$ temperature and disorder dependence,
where $\ell$ is the electron elastic mean free path. This anomalous behavior
cannot be explained in terms of the current concepts for the electron-phonon
interaction in impure conductors. Our result also reveals that the strength of
the electron-phonon coupling is much stronger in the DC than RF sputtered
films, suggesting that the electron-phonon interaction not only is sensitive to
the total level of disorder but also is sensitive to the microscopic quality of
the disorder.
