  LAM and CEA-LETI are developing the technology of deformable detectors, for
UV, VIS or NIR applications. Such breakthrough devices will be a revolution for
future wide field imagers and spectrographs, firstly by improving the image
quality with better off-axis sharpness, resolution, brightness while scaling
down the optical system, secondly by overcoming the manufacturing issues
identified so far and by offering a flexibility and versatility in optical
design. The technology of curved detectors can benefit of the developments of
active and deformable structures, to provide a flexibility and a fine tuning of
the detectors curvature by thinning down the substrate without modifying the
fabrication process of the active pixels. We present studies done so far on
optical design improvements, the technological demonstrators we developed and
their performances as well as the future five-years roadmap for these
developments.
