  We present a quantitative investigation of the impact of tip radius as well
as sample type and thickness on the lateral resolution in piezoresponse force
microscopy (PFM) investigating bulk single crystals. The observed linear
dependence of the width of the domain wall on the tip radius as well as the
independence of the lateral resolution on the specific crystal-type are
validated by a simple theoretical model. Using a Ti-Pt-coated tip with a
nominal radius of 15 nm the so far highest lateral resolution in bulk crystals
of only 17 nm was obtained.
