  The temperature ($T$)-shift protcol of aging in the 3 dimensional (3D)
Edwards- Anderson (EA) spin-glass (SG) model is studied through the
out-of-phase component of the ac susceptibility simulated by the Monte Carlo
method. For processes with a small magnitude of the $T$-shift, $\Delta T$, the
memory imprinted before the $T$-shift is preserved under the $T$-change and the
SG short-range order continuously grows after the $T$-shift, which we call the
cumulative memory scenario. For a negative $T$-shift process with a large
$\Delta T$ the deviation from the cumulative memory scenario has been observed
for the first time in the numerical simulation. We attribute the phenomenon to
the `chaos effect' which, we argue, is qualitatively different from the
so-called rejuvenation effect observed just after the $T$-shift.
