  We present here an experimental set-up to perform simultaneously measurements
of surface plasmon resonance (SPR) and X-ray absorption spectroscopy (XAS) in a
synchrotron beamline. The system allows measuring in situ and in real time the
effect of X-ray irradiation on the SPR curves to explore the interaction of
X-rays with matter. It is also possible to record XAS spectra while exciting
SPR in order to detect the changes in the electronic configuration of thin
films induced by the excitation of surface plasmons. Combined experiments
recording simultaneously SPR and XAS curves while scanning different parameters
can be carried out. The relative variations in the SPR and XAS spectra that can
be detected with this set-up ranges from 10-3 to 10-5, depending on the
particular experiment.
