  The local work function of a surface determines the spatial decay of the
charge density at the Fermi level normal to the surface. Here, we present a
method that enables simultaneous measurements of local work function and
tip-sample forces. A combined dynamic scanning tunneling microscope and atomic
force microscope is used to measure the tunneling current between an
oscillating tip and the sample in real time as a function of the cantilever's
deflection. Atomically resolved work function measurements on a silicon
(111)-($7\times 7$) surface are presented and related to concurrently recorded
tunneling current- and force- measurements.
