  The work describes the capabilities of Laser Scanning Microscopy (LSM) as a
spatially resolved method of testing high_Tc materials and devices. The earlier
results obtained by the authors are briefly reviewed. Some novel applications
of the LSM are illustrated, including imaging the HTS responses in rf mode,
probing the superconducting properties of HTS single crystals, development of
twobeam laser scanning microscopy. The existence of the phase slip lines
mechanism of resistivity in HTS materials is proven by LSM imaging.
