  As the brightness of synchrotron radiation (SR) light sources improves, the
operation stability of light sources is weakened. To explore various beam
instability related issues in light sources, one transverse beam diagnostics
system for bunch-by-bunch (BbB) profile measurement has been established at
Hefei Light Source-II (HLS-II). In this paper, one in-situ extraction algorithm
in the data processing backend of the system is developed for BbB profiles, so
as to provide important beam information of the machine operation in time.
