  We report a demonstration of a surface ion trap fabricated directly on a
highly reflective mirror surface, which includes a secondary set of radio
frequency (RF) electrodes allowing for translation of the quadrupole RF null
location. We introduce a position-dependent photon scattering rate for a
$^{174}$Yb$^+$ ion in the direction perpendicular to the trap surface using a
standing wave of retroreflected light off the mirror surface directly below the
trap. Using this setup, we demonstrate the capability of fine-tuning the RF
trap location with nanometer scale precision and characterize the charging
effects of the dielectric mirror surface upon exposure to ultra-violet light.
