  Understanding and control of thermal transport in solids at nanoscale is
crucial to engineer and to enhance properties of a new generation of
optoelectronic, thermoelectric, and photonic devices. In this regard,
semiconductor superlattice structures provide a unique platform to study
phenomena associated with phonon propagations in solids such as heat
conduction. Transient X-ray diffraction can directly probe atomic motions and
therefore is among the rare techniques sensitive to phonon dynamics in a
condensed matter. Here, we study optically induced transient heat conduction in
GaAs/AlAs superlattice structures using EIGER2 detector. Benchmark experiments
have been performed at the Austrian SAXS beamline at Elettra Sincrotrone
Trieste that operated in the hybrid filling mode. We demonstrate that drifts of
experimental conditions, such as synchrotron beam fluctuations, become less
essential when utilizing EIGER2 double gating mode that results in a faster
acquisition of high quality data and facilitates data analysis and data
interpretation.
