  We focus on the potential possibilities for supporting Scanning Probe
Microscopy measurements, emphasizing the application of Artificial
Intelligence, especially Machine Learning as well as quantum computing. It
turned out that Artificial Intelligence can be helpful in the experimental
processes automation in routine operations, the algorithmic search for good
sample regions, and shed light on the structure property relationships. Thus,
it contributes to increasing the efficiency and accuracy of optical nanoscopy
scanning probes. Moreover, the combination of Artificial Intelligence based
algorithms and quantum computing may have a huge potential to increase the
practical application of Scanning Probe Microscopy. The limitations were also
discussed. Finally, we outline a research path for the improvement of the
proposed approach.
