  We report the ultrafast laser fabrication and mid-IR characterization (3.39
microns) of four-port evanescent field directional couplers. The couplers were
fabricated in a commercial gallium lanthanum sulphide glass substrate using
sub-picosecond laser pulses of 1030 nm light. Straight waveguides inscribed
using optimal fabrication parameters were found to exhibit propagation losses
of 0.8 dB/cm. A series of couplers were inscribed with different interaction
lengths, and we demonstrate power splitting ratios of between 8% and 99% for
mid-IR light with a wavelength of 3.39 microns. These results clearly
demonstrate that ultrafast laser inscription can be used to fabricate high
quality evanescent field couplers for future applications in astronomical
interferometry.
