  We present the first findings of the new electrically-detected electron spin
resonance technique (EDESR), which reveal the point defects in the ultra-narrow
silicon quantum wells (Si-QW) confined by the superconductor delta-barriers.
This technique allows the ESR identification without application of an external
cavity, as well as a high frequency source and recorder, and with measuring the
only response of the magnetoresistance, with internal GHz Josephson emission
within frameworks of the normal-mode coupling (NMC) caused by the microcavities
embedded in the Si-QW plane.
