  K. Mallick and P. S. A. Kumar had reported exchange bias effect in Mg-ferrite
thin films, deposited on Si substrate (with a buffer layer of MgO) using Pulsed
Laser Deposition (PLD) technique. The authors had presented the temperature
dependence exchange bias effect, field dependence exchange bias effect and
training effect of a selected Magnesium ferrite thin film of thickness 132 nm.
These studies were followed by the film thickness dependence of exchange bias
effect. However, the data presented for the 132 nm thick film shows mutually
contradicting values in each and every figures. Here, I point out these highly
self-contradicting data in this comment.
