  Complementary metal-oxide semiconductor (CMOS) sensors have been widely used
as soft X-ray detectors in several fields owing to their recent developments
and unique advantages. The parameters of CMOS detectors have been extensively
studied and evaluated. However, the key parameter signal-to-noise ratio in
certain fields has not been sufficiently studied. In this study, we analysed
the charge distribution of the CMOS detector GSENSE2020BSI and proposed a
two-dimensional segmentation method to discriminate signals according to the
charge distribution. The effect of the two-dimensional segmentation method on
the GSENSE2020BSI dectector was qualitatively evaluated. The optimal feature
parameters used in the two-dimensional segmentation method was studied for
G2020BSI. However, the two-dimensional segmentation method is insensitive to
feature parameters.
