  The conductive characteristics of Bi0.9La0.1Fe0.96Mg0.04O3(BLFM) thin film
are investigated at various temperatures and a negative differential resistance
(NDR) is observed in the thin film, where a leakage current peak occurs upon
application of a downward electric field above 80 oC. The origin of the NDR
behavior is shown to be related to the ionic defect of oxygen vacancies (VO..)
present in the film. On the basis of analyzing the leakage mechanism and
surface potential behavior, the NDR behavior can be understood by considering
the competition between the polarized distribution and neutralization of VO...
