  The aim of this work is to investigate feasibility of the ion beam analysis
techniques for monitoring swift heavy ion track formation. First, use of the in
situ Rutherford backscattering spectroscopy in channeling mode to observe
damage build-up in quartz SiO2 after MeV heavy ion irradiation is demonstrated.
Second, new results of the in situ grazing incidence time-of-flight elastic
recoil detection analysis used for monitoring the surface elemental composition
during ion tracks formation in various materials are presented. Ion tracks were
found on SrTiO3, quartz SiO2, a-SiO2 and muscovite mica surfaces by atomic
force microscopy, but in contrast to our previous studies on GaN and TiO2,
surface stoichiometry remained unchanged.
