  The stress-induced switching behavior of a multiferroic nanomagnet, dipole
coupled to a hard nanomagnet, is numerically studied by solving the stochastic
Landau-Lifshitz-Gilbert (LLG) equation for a single domain macro-spin state.
Different factors were found to affect the switching probability in the
presence of thermal noise at room temperature: (i) dipole coupling strength,
(ii) stress levels, and (iii) stress withdrawal rates (ramp rates). We report
that the thermal broadening of the magnetization distribution causes large
switching error rates. This could render nanomagnetic logic schemes that rely
on dipole coupling to perform Boolean logic operations impractical whether they
are clocked by stress or field or other means.
