  The dynamics of the release of stored energy during annealing along two
different crystallographic planes i.e.{111} and {220} in deformed copper have
been investigated using in-situ X-ray diffraction measurements at 458K and 473K
respectively. The study has been carried out on 50% and 80% rolled Cu sheets.
The microstructures of the rolled samples have been characterised using optical
microscope and Electron Back Scattered Diffraction measurements. The
microstructural parameters were evaluated using Scherrer equation and the
modified Rietveld technique from X-ray diffractogram. The stored energy along
different planes were determined using the modified Stibitz formula from the
X-ray peak broadening and the bulk stored energy has been evaluated using
differential scanning calorimetry. The process dynamics of recovery and
recrystallization as observed through the release of stored energy has been
modelled as a second order and first order process respectively.
