  A planar slab of negative index material works as a superlens with
sub-diffraction-limited imaging resolution, since propagating waves are focused
and, moreover, evanescent waves are reconstructed in the image plane. Here, we
demonstrate a superlens for electric evanescent fields with low losses using
perovskites in the mid-infrared regime. The combination of near-field
microscopy with a tunable free-electron laser allows us to address precisely
the polariton modes, which are critical for super-resolution imaging. We
spectrally study the lateral and vertical distributions of evanescent waves
around the image plane of such a lens, and achieve imaging resolution of
wavelength/14 at the superlensing wavelength. Interestingly, at certain
distances between the probe and sample surface, we observe a maximum of these
evanescent fields. Comparisons with numerical simulations indicate that this
maximum originates from an enhanced coupling between probe and object, which
might be applicable for multifunctional circuits, infrared spectroscopy, and
thermal sensors.
