  An atomic-scale study utilizing scanning tunneling microscopy (STM) in
ultrahigh vacuum (UHV) is performed on large single crystalline graphene grains
synthesized on Cu foil by a chemical vapor deposition (CVD) method. After
thermal annealing, we observe the presence of periodic surface depressions
(stripe patterns) that exhibit long-range order formed in the area of Cu
covered by graphene. We suggest that the observed stripe pattern is a Cu
surface reconstruction formed by partial dislocations (which appeared to be
stair-rod-like) resulting from the strain induced by the graphene overlayer. In
addition, these graphene grains are shown to be more decoupled from the Cu
substrate compared to previously studied grains that exhibited Moir\'e
patterns.
