  The collected charge of two pad diodes is measured along the diode width
using a 5:2 GeV electron beam at the DESY II beam test facility. The electron
beam enters parallel to the readout electrode plane and perpendicular to the
edge of the diode. The position of the electron beam is reconstructed by three
planes of an EUDET-type telescope. An in-situ procedure is developed to align
the diode surface parallel to the electron beam. The result of these
measurements is the charge collection efficiency profile as a function of depth
for each diode. For a non-irradiated diode, the charge profile is uniform as a
function of the beam position for bias voltages above the full-depletion, as
expected. For the irradiated diode, the charge profile is non-uniform and
changes as a function of bias voltage.
