  Three-dimensional (3D) imaging of thin, extended specimens at nanometer
resolution is critical for applications in biology, materials science, advanced
synthesis, and manufacturing. One route to 3D imaging is tomography, which
requires a tilt series of a local region. Here we describe a coherent imaging
alternative that recovers the 3D volume of a thin, homogeneously amorphous
specimen with only a single, energy-filtered, bright-field image. We
demonstrated this technique with a transmission electron microscope to fill a
glaring gap for rapid, accessible, non-destructive 3D nanometrology. This
technique is applicable, in general, to any coherent bright field imaging with
electrons, photons, or any other wavelike particles.
