  We report a detailed study of surface and interface properties of
pulsed-laser deposited NiMnSb films on Si (100) substrate as a function of film
thickness. As the thickness of films is reduced below 35 nm formation of a
porous layer is observed. Porosity in this layer increases with decrease in
NiMnSb film thickness. These morphological changes of the ultra thin films are
reflected in the interesting transport and magnetic properties of these films.
On the other hand, there are no influences of compositional in-homogeneity and
surface/interface roughness on the magnetic and transport properties of the
films.
