  Confocal Raman spectroscopy is a versatile, non-invasive investigation tool
and a major workhorse for graphene characterization. Here we show that the
experimentally observed Raman 2D line width is a measure of nanometer-scale
strain variations in graphene. By investigating the relation between the G and
2D line at high magnetic fields we find that the 2D line width contains
valuable information on nanometer-scale flatness and lattice deformations of
graphene, making it a good quantity for classifying the structural quality of
graphene even at zero magnetic field.
