  (001) oriented NiO/NiFe bilayers were grown on single crystal MgO (001)
substrates by ion beam sputtering in order to determine the effect that the
crystalline orientation of the NiO antiferromagnetic layer has on the
magnetization curve of the NiFe ferromagnetic layer. Simple models predict no
exchange anisotropy for the (001)-oriented surface, which in its bulk
termination is magnetically compensated. Nonetheless exchange anisotropy is
present in the epitaxial films, although it is approximately half as large as
in polycrystalline films that were grown simultaneously. Experiments show that
differences in exchange field and coercivity between polycrystalline and
epitaxial NiFe/NiO bilayers couples arise due to variations in induced surface
anisotropy and not from differences in the degree of compensation of the
terminating NiO plane. Implications of these observations for models of induced
exchange anisotropy in NiO/NiFe bilayer couples will be discussed.
