  We report the magnetic properties of yttrium iron garnet (YIG) thin films
grown by pulsed laser deposition technique. The films were deposited on Si
(100) substrates in the range of 15-50 nm thickness. Magnetic characterizations
were investigated by ferromagnetic resonance spectra. Perpendicular magnetic
easy axis was achieved up to 50 nm thickness. We observed that the
perpendicular anisotropy values decreased by increasing the film thickness. The
origin of the perpendicular magnetic anisotropy (PMA) was attributed to the
texture and the lattice distortion in the YIG thin films. We anticipate that
perpendicularly magnetized YIG thin films on Si substrates pave the way for a
cheaper and compatible fabrication process.
