  In this work, two particular properties of the position-sensitive, thick
silicon detectors (known as the "E" detectors) in the High Resolution Array
(HiRA) are investigated: the thickness of the dead layer on the front of the
detector, and the overall thickness of the detector itself. The dead layer
thickness for each E detector in HiRA is extracted using a measurement of alpha
particles emitted from a $^{212}$Pb pin source placed close to the detector
surface. This procedure also allows for energy calibrations of the E detectors,
which are otherwise inaccessible for alpha source calibration as each one is
sandwiched between two other detectors. The E detector thickness is obtained
from a combination of elastically scattered protons and an energy-loss
calculation method. Results from these analyses agree with values provided by
the manufacturer.
