  We report a first exploration of High-angular-Resolution Electron Backscatter
Diffraction, without using simulated Electron Backscatter Diffraction patterns
as a reference, for absolute stress and orientation measurements in
polycrystalline materials. By co-correlating the pattern center and fully
exploiting crystal symmetry and plane-stress, simultaneous correlation of all
overlapping regions of interest in multiple direct-electron-detector,
energy-filtered Electron Backscatter Diffraction patterns is achieved. The
potential for highly accurate measurement of absolute stress, crystal
orientation and pattern center is demonstrated on a virtual polycrystalline
case-study, showing errors respectively below 20 MPa (or 1e-4 in strain), 7e-5
rad and 0.06 pixels.
