  In recent years, nanoporous thin films have been widely studied for
thermoelectric applications. High thermoelectric performance is reported for
nanoporous Si films, which is attributed to the dramatically reduced lattice
thermal conductivity and bulk-like electrical properties. Porous materials can
also be used in gas sensing applications by engineering the surface-trapped
charges on pore edges. In this work, an analytical model is developed to
explore the relationship between the thermoelectric properties and pore-edge
charges in a periodic two-dimensional nanoporous material. The presented model
can be widely used to analyze the measured electrical properties of general
nanoporous thin films and two-dimensional materials.
