  Based on the interaction between different spatial modes, semiconductor
Bragg-reflection waveguides provide a highly functional platform for non-linear
optics. Therefore, the control and engineering of the properties of each
spatial mode is essential. Despite the multimodeness of our waveguide, the
well-established Fabry-Perot technique for recording fringes in the optical
transmission spectrum can successfully be employed for a detailed linear
optical characterization when combined with Fourier analysis. A prerequisite
for the modal sensitivity is a finely resolved transmission spectrum that is
recorded over a broad frequency band. Our results highlight how the features of
different spatial modes, such as their loss characteristics and dispersion
properties, can be separated from each other allowing their comparison. The
mode-resolved measurements are important for optimizing the performance of such
multimode waveguides by tailoring the properties of their spatial modes.
