  We present a novel and straightforward approach for the spatio-spectral
characterization of ultrashort pulses. This minimally intrusive method relies
on placing a mask with specially arranged pinholes in the beam path before the
focusing optic and retrieving the spectrally-resolved laser wavefront from the
speckle pattern produced at focus. We test the efficacy of this new method by
accurately retrieving chromatic aberrations, such as pulse front tilt, pulse
front curvature, and higher-order aberrations introduced by a spherical lens.
The simplicity and scalability of this method, combined with its compatibility
with single-shot operation, make it a promising candidate to become a new
standard diagnostic tool in high-intensity laser facilities.
