  We present numerical simulations of scattering-type Scanning Near-Field
Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive
analysis of simulated s-SNOM spectra is performed for three types of junctions.
We find conditions when the conventional interpretation of the plasmon
reflection coefficients from s-SNOM measurements does not apply. Our results
are applicable to other conducting 2D materials and provide a comprehensive
understanding of the s-SNOM techniques for probing local transport properties
of 2D materials.
