  Development of an ellipsometry to the case of a coherent far infrared
irradiation, low temperatures and small samples is described, including a
decision of the direct and inverse problems of the convergent beam ellipsometry
for an arbitrary wavelength, measurement technique and a compensating
orientation of cryostat windows. Experimental results are presented: for a gold
film and UBe13 single crystal at room temperature (lambda=119 um), temperature
dependencies of the complex dielectric function of SrTiO3 (lambda=119, 84 and
28 um) and of YBa2Cu3O7-delta ceramic (lambda=119 um).
