  The properties of Van der Waals heterostructures are determined by the twist
angle and the interface between adjacent layers as well as their polytype and
stacking. Here we describe the use of spectroscopic Low Energy Electron
Microscopy (LEEM) and micro Low Energy Electron Diffraction ({\mu}LEED) methods
to measure these properties locally. We present results on a MoS$_{2}$/hBN
heterostructure, but the methods are applicable to other materials. Diffraction
spot analysis is used to assess the benefits of using hBN as a substrate. In
addition, by making use of the broken rotational symmetry of the lattice, we
determine the cleaving history of the MoS$_{2}$ flake, i.e., which layer stems
from where in the bulk.
