  In this paper, we present a unified FPGA based electrical test-bench for
characterizing different emerging NonVolatile Memory (NVM) chips. In
particular, we present detailed electrical characterization and benchmarking of
multiple commercially available, off-the-shelf, NVM chips viz.: MRAM, FeRAM,
CBRAM, and ReRAM. We investigate important NVM parameters such as: (i) current
consumption patterns, (ii) endurance, and (iii) error characterization. The
proposed FPGA based testbench is then utilized for a Proof-of-Concept (PoC)
Neural Network (NN) image classification application. Four emerging NVM chips
are benchmarked against standard SRAM and Flash technology for the AI
application as active weight memory during inference mode.
