  We report Ultraviolet Brillouin light scattering experimental data on v-SiO2
in an unexplored frequency region, performed with a newly available
spectrometer up to exchanged wavevector q values of 0.075 nm^{-1}, as a
function of temperature. The measured attenuation scales on visible data
following a q^2 behavior and is temperature-dependent. Such temperature
dependence is found in a good agreement with that measured at lower q,
suggesting that its origin is mainly due to a dynamic attenuation mechanism.
The comparison between the present data with those obtained by Inelastic X-ray
Scattering suggests the existence of a cross-over to a different attenuation
regimes.
