  The orientation of the tilted magnetic anisotropy has crucial importance in
many spintronic devices. However, it is very challenging to determine it
especially in very small structures produced by lithography. Here, we propose a
new experimental method to directly and accurately measure both the polar and
azimuthal angles of a tilted magnetic anisotropy. By using the proposed
experimental method, we have successfully determined the out-of-plane and
in-plane angles of the tilted magnetic anisotropy in a micro-structured
multilayer thin film. The orientation of the tilted magnetic anisotropy in the
sample has also been confirmed by the theoretical simulations proving the
accuracy of the method.
