  Many corner cube prisms, or retroreflectors, employ total internal reflection
(TIR) via uncoated rear surfaces. The different elliptical polarization states
emerging from the six unique paths through the corner cube complicate the
far-field diffraction pattern by introducing various phase delays between the
six paths. In this paper, we present a computational framework to evaluate
polarization through TIR corner cubes for arbitrary incidence angles and input
polarization states, presenting example output for key normal-incidence
conditions. We also describe a method to produce far-field diffraction patterns
resulting from the polarization analysis, presenting representative
images---broken into orthogonal polarizations, and characterizing key cases.
Laboratory confirmation is also presented for both polarization states and
far-field diffraction patterns.
