  Reliability management is one of the primary concerns in manycore systems
design. Different aging mechanisms such as Negative-Bias Temperature
Instability (NBTI), Electromigration (EM), and thermal cycling can reduce the
reliability of these systems. However, state-of-the-art works mainly focused on
NBTI and EM, whereas a few works have considered the thermal cycling effect.
The thermal cycling effect can significantly aggravate the systems lifetime.
Moreover, the thermal effects of cores on each other due to their adjacency may
also influence the systems Mean Time to Failure (MTTF). This paper introduces a
new technique to manage the reliability of manycore systems. The technique
considers thermal cycling, adjacency of cores, and process variation-induced
diversity of operating frequencies. It uses two levels of task mapping to
improve system lifetime. At the first level, cores with close temperatures are
packed into the same bin, and then, an arrived task is assigned to a bin with a
similar temperature. Afterward in the second level, the task is assigned to a
core inside the selected bin in the first level, based on performance
requirements and the core frequency. Compared to the conventional TC-aware
techniques, the proposed method is performed at a higher level (bins level) to
reduce the thermal variations of cores inside a bin, and improves the system
MTTFTC, making it a promising solution for manycore systems. The efficacy of
our proposed technique is evaluated on 16, 32, 64, and 256 core systems using
SPLASH2 and PARSEC benchmark suite applications. The results show up to 20%
MTTFTC increment compared to the conventional thermal cycling-aware task
mapping techniques.
