  An experimental setup for determining the electrical resistivity of several
types of thermoelectric materials over the temperature range 20 < T < 550 C is
described in detail. One resistivity measurement during temperature cycling is
also explained for Cu0.01Bi2Te2.7Se0.3 while a second measurement is made on
Yb0.35Co4Sb12 as a function of time at 400 C. Both measurements confirm that
the materials are thermally stable for the temperature range and time period
measured. Measurements made during temperature cycling show an irreversible
decrease in the electrical resistivity of Cu0.01Bi2Te2.7Se0.3 when the
measuring temperature exceeds the pressing temperature. Several other possible
uses of such a system include but are not limited to studying the effects of
annealing and/or oxidation as a function of both temperature and time.
