  Rapid and reliable analysis of liquid dispersions of 2D materials is
essential for fully harnessing their potential, allowing size and quality
validation before subsequent processing or device fabrication. Existing UV-VIS
extinction spectroscopy-based metrics, particularly those related to thickness,
have shown promise but rely on manual data processing, which can introduce
irreproducibility and user errors. To address this challenge and enable uniform
analysis across laboratories, a freely available program is developed for the
reproducible analysis of nanosheet dispersions. Specifically, a smoothing
routine is applied to the spectral data, takes the second derivative, and use
integral areas to find the wavelength of exciton transitions. This program
enables rapid measurement of nanosheet concentration, length, and thickness by
UV-VIS spectroscopy and thickness metrics are refined for eight common 2D
nanomaterials. The program and methodology are freely available for use and
allow metrics for new materials to be implemented easily in the future.
