  We measure the resonance line shape of atomic vapor layers with nanoscale
thickness confined between two sapphire windows. The measurement is performed
by scanning a probe laser through resonance and collecting the scattered light.
The line shape is dominated by the effects of Dicke narrowing, self-broadening,
and atom-surface interactions. By fitting the measured line shape to a simple
model we discuss the possibility to extract information about the atom-surface
interaction.
