  FeSe0.5Te0.5 thin films were grown by pulsed laser deposition on CaF2, LaAlO3
and MgO substrates and structurally and electro-magnetically characterized in
order to study the influence of the substrate on their transport properties.
The in-plane lattice mismatch between FeSe0.5Te0.5 bulk and the substrates
shows no influence on the lattice parameters of the films, whereas the type of
substrates affects the crystalline quality of the films and, therefore, the
superconducting properties. The film on MgO showed an extra peak in the angular
dependence of critical current density Jc({\theta}) at {\theta} = 180{\deg} (H
|| c), which arises from c-axis defects as confirmed by transmission electron
microscopy. In contrast, no Jc({\theta}) peaks for H || c were observed in
films on CaF2 and LaAlO3. Jc({\theta}) can be scaled successfully for both
films without c-axis correlated defects by the anisotropic Ginzburg-Landau
(AGL) approach with appropriate anisotropy ratio {\gamma}J. The scaling
parameter {\gamma}J is decreasing with decreasing temperature, which is
different from what we observed in FeSe0.5Te0.5 films on Fe-buffered MgO
substrates.
