  A radically new approach to surface probing based on a replacement of the
solid-state near-field probes by the 'long-field' ones is presented and
discussed. Such probes may enable to create a radically new generation
microscopes with non-perturbing long-range action probe based on a highly
sensitive RF test method with a single-layer flat coil. This may give a start
for creation of a new direction in microscopy.
