  A combined analysis of x-ray absorption and resonant reflectivity data was
used to obtain the orbital polarization profiles of superlattices composed of
four-unit-cell-thick layers of metallic LaNiO3 and layers of insulating RXO3
(R=La, Gd, Dy and X=Al, Ga, Sc), grown on substrates that impose either
compressive or tensile strain. This superlattice geometry allowed us to partly
separate the influence of epitaxial strain from interfacial effects controlled
by the chemical composition of the insulating blocking layers. Our quantitative
analysis reveal orbital polarizations up to 25%. We further show that strain is
the most effective control parameter, whereas the influence of the chemical
composition of the blocking layers is comparatively small.
