  The crystallographic symmetries and spatial distribution of stacking domains
in graphene films on SiC have been studied by low energy electron diffraction
(LEED) and dark field imaging in a low energy electron microscope (LEEM). We
find that the graphene diffraction spots from 2 and 3 atomic layers of graphene
have 3-fold symmetry consistent with AB (Bernal) stacking of the layers. On the
contrary, graphene diffraction spots from the buffer layer and monolayer
graphene have apparent 6-fold symmetry, although the 3-fold nature of the
satellite spots indicates a more complex periodicity in the graphene sheets.
