  Networks of solution-processed nanomaterials are important for multiple
applications in electronics, sensing and energy storage/generation. While it is
known that network morphology plays a dominant role in determining the physical
properties of printed networks, it remains difficult to quantify network
structure. Here, we utilise FIB-SEM nanotomography to characterise the
morphology of nanostructured networks. Nanometer-resolution 3D-images were
obtained from printed networks of graphene nanosheets of various sizes, as well
as networks of WS2 nanosheets, silver nanosheets and silver nanowires.
Important morphological characteristics, including network porosity,
tortuosity, pore dimensions and nanosheet orientation were extracted and linked
to network resistivity. By extending this technique to interrogate the
structure and interfaces within vertical printed heterostacks, we demonstrate
the potential of this technique for device characterisation and optimisation.
