  Energy efficiency is one of the most important parameters for designing and
building a computing system nowadays. Introduction of new transistor and memory
technologies to the integrated circuits design have brought hope for low energy
very large scale integration (VLSI) circuit design. This excellency is pleasant
if the computing system is secure and the energy is not wasted through
execution of malicious actions. In fact, it is required to make sure that the
utilized transistor and memory devices function correctly and no error occurs
in the system operation. In this regard, we propose a built-in-self-test
architecture for security checking of the magnetic tunnel junction (MTJ) device
under malicious process variations attack. Also, a general identification
technique is presented to investigate the behaviour and activities of the
employed circuitries within this MTJ testing architecture. The presented
identification technique tries to find any abnormal behaviour using the circuit
current signal.
