  Atomically thin polycrystalline transition-metal dichalcogenides (TMDs) are
relevant to both fundamental science investigation and applications. TMD
thin-films present uniquely difficult challenges to effective nanoscale
crystalline characterization. Here we present a method to quickly characterize
the nanocrystalline grain structure and texture of monolayer WS2 films using
scanning nanobeam electron diffraction coupled with multivariate statistical
analysis of the resulting data. Our analysis pipeline is highly generalizable
and is a useful alternative to the time consuming, complex, and
system-dependent methodology traditionally used to analyze spatially resolved
electron diffraction measurements.
