  In this paper, we apply the angle-resolved Optically Detected Magnetic
Resonance (ODMR) technique to study series of strained (Cd, Mn)Te/(Cd, Mg)Te
quantum wells (QWs) produced by molecular beam epitaxy. By analyzing
characteristic features of ODMR angular scans, we determine strain-induced
axial-symmetry spin Hamiltonian parameter D with neV precision. Furthermore, we
use low-temperature optical reflectivity measurements and X-ray diffraction
scans to evaluate the local strain present in QW material. In our analysis, we
take into account different thermal expansion coefficients of GaAs substrate
and CdTe buffer. The additional deformation due to the thermal expansion
effects has the same magnitude as deformation origination from the different
compositions of the samples. Based on the evaluated deformations and values of
strain-induced axial-symmetry spin Hamiltonian parameter D, we find strain
spin-lattice coefficient G11 = (72.2 +- 1.9) neV for Mn2+ in CdTe and shear
deformation potential b = (-0.94 +- 0.11) eV for CdTe.
