  We introduce a notion of pattern occurrence that generalizes both classical
permutation patterns as well as poset containment. Many questions about pattern
statistics and avoidance generalize naturally to this setting, and we focus on
functional complexity problems -- particularly those that arise by constraining
the order dimensions of the pattern and text posets. We show that counting the
number of induced, injective occurrences among dimension 2 posets is #P-hard;
enumerating the linear extensions that occur in realizers of dimension 2 posets
can be done in polynomial time, while for unconstrained dimension it is
GI-complete; counting not necessarily induced, injective occurrences among
dimension 2 posets is #P-hard; counting injective or not necessarily injective
occurrences of an arbitrary pattern in a dimension 1 text is #P-hard, although
it is in FP if the pattern poset is constrained to have bounded intrinsic
width; and counting injective occurrences of a dimension 1 pattern in an
arbitrary text is #P-hard, while it is in FP for bounded dimension texts. This
framework easily leads to a number of open questions, chief among which are (1)
is it #P-hard to count the number of occurrences of a dimension 2 pattern in a
dimension 1 text, and (2) is it #P-hard to count the number of texts which
avoid a given pattern?
