  We present a new set of accurate formulae for the computation of random
errors in the measurement of atomic and molecular indices. The new expressions
are in excellent agreement with numerical simulations. We have found that, in
some cases, the use of approximated equations can give misleading line-strength
index errors. It is important to note that accurate errors can only be achieved
after a full control of the error propagation throughout the data reduction
with a parallel processing of data and error frames. Finally, simple recipes
for the estimation of the required signal-to-noise ratio to achieve a fixed
index error are presented.
