  Porous silicon layers were embedded with ZnTe using the isothermal close
space sublimation technique. The presence of ZnTe was demonstrated using
cross-sectional energy dispersive spectroscopy maps. ZnTe embedded samples
present intense room temperature photoluminescence along the whole visible
range. We ascribe this PL to ZnTe nanocrystals of different sizes grown on the
internal pore surface. Such crystals, with different orientations and sizes,
were observed in transmission electron microscopy images, while transmission
electron diffraction images of the same regions reveal ZnTe characteristic
patterns.
