  A CMOS-compatible plasmonic TE-pass polarizer capable of working in the O, E,
S, C, L, and U bands is numerically analyzed. The device is based on an
integrated hybrid plasmonic waveguide (HPW) with a segmented metal design. The
segmented metal will avoid the propagation of the TM mode, confined in the slot
of the HPW, while the TE fundamental mode will pass. The TE mode is not
affected by the metal segmentation since it is confined in the core of the HPW.
The concept of the segmented metal can be exploited in a plasmonic circuit with
HPWs as the connecting waveguides between parts of the circuit and in a silicon
photonics circuit with strip or slab waveguides connecting the different parts
of the circuit. Using 3D FDTD simulations, it is shown that for a length of 5.5
{\mu}m the polarization extinction ratios are better than 20 dB and the
insertion losses are less than 1.7 dB over all the optical communication bands.
