  Results of a study on the electrochemical properties of exfoliated single and
multilayer graphene flakes are presented. Graphene flakes were deposited on
silicon/silicon oxide wafers to enable fast and accurate characterization by
optical microscopy and Raman spectroscopy. Conductive silver paint and silver
wires were used to fabricate contacts; epoxy resin was employed as masking
coating in order to expose a stable, well defined area of graphene. Both
multilayer and monolayer graphene microelectrodes showed quasi-reversible
behavior during voltammetric measurements in potassium ferricyanide. However,
the standard heterogeneous charge transfer rate constant, k{\deg}, was
estimated to be higher for mono-layer graphene flakes.
