  Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging
techique capable of imaging defects in the bulk of extended crystalline
samples. We present numerical simulations of image-formation in such a
microscope using numerical integration of the dynamical Takagi-Taupin Equations
(TTE) and wave front propagation. We validate our approach by comparing
simulated images to experimental data from a near-perfect single crystal of
diamond containing a single stacking fault defect in the illuminated volume.
