  We demonstrate monolayer MoS2 grown by chemical vapor deposition (CVD) with
transport properties comparable to those of the best exfoliated devices over a
wide range of carrier densities (up to ~10^13 1/cm^2) and temperatures (80-500
K). Transfer length measurements reveal monolayer mobility of ~20 cm2/V/s on
SiO2 substrates at 300 K and practical carrier densities (>2x10^12 1/cm^2). We
also demonstrate the highest current density reported to date (~270 uA/um or 44
MA/cm^2) at 300 K for an 80 nm device from CVD-grown monolayer MoS2. Using
simulations, we discuss what improvements of monolayer MoS2 are still required
to meet technology roadmap requirements for low power (LP) and high performance
(HP) applications. Such results are an important step towards large-area
electronics based on monolayer semiconductors.
