  The structure of single atoms in real space is investigated by scanning
tunneling microscopy. Very high resolution is possible by a dramatic reduction
of the tip-sample distance. The instabilities which are normally encountered
when using small tip-sample distances are avoided by oscillating the tip of the
scanning tunneling microscope vertically with respect to the sample. The
surface atoms of Si(111)-(7 x 7) with their well-known electronic configuration
are used to image individual samarium, cobalt, iron and silicon atoms. The
resulting images resemble the charge density corresponding to 4f, 3d and 3p
atomic orbitals.
