  We study the delta-T noise in the Kondo regime, which implies the charge
current noise under the temperature bias for the SU(2) Kondo quantum dot. We
propose an experimentally measurable quantity to quantify the low-temperature
properties in the delta-T noise: $S_{\ell}=S(T_{\mathrm{L}},T_{\mathrm{R}}) -
(1/2)[S(T_{\mathrm{L}},T_{\mathrm{L}}) + S(T_{\mathrm{R}},T_{\mathrm{R}})]$,
which yields the shot noise expression in the noninteracting limit. We
calculate this quantity for the SU(2) Kondo quantum dot in the particle-hole
symmetric case. We found that the $S_{\ell}$ exhibits qualitatively the same
behavior in both the electrochemical potential biased case and the temperature
biased case. The quantitative difference appears as a difference of the
coefficients of the noises, which reflects the difference of the Fermi
distribution function: electrochemical potential biased or temperature biased.
