  Enabling temperature dependent experiments in Atomic Force Microscopy is of
great interest to study materials and surface properties at the nanoscale. By
studying Curie temperature of multiferroic materials, temperature based phase
transition on crystalline structures or resistive switching phenomena are only
a few examples of applications. We present an equipment capable of cooling
samples using a thermoelectric cooling stage down to -61.4 C in a 15x15 mm
sample plate. The equipment uses a four-unit thermoelectric stack to achieve
maximum temperature range, with low electrical and mechanical noise. The
equipment is installed into a Keysight 5500LS Atomic Force Microscopy
maintaining its compatibility with all Electrical and Mechanical modes of
operation. We study the contribution of the liquid cooling pump vibration into
the cantilever static deflection noise and the temperature dependence of the
cantilever deflection. A La0.7Sr0.3MnO3-y thin film sample is used to
demonstrate the performance of the equipment and its usability by analysing the
resistive switching phenomena associated with this oxide perovskite.
