  To investigate the effects of CdCl$_2$ treatment on the local electronic
properties of polycrystalline CdTe films, we conducted a photoemission electron
microscopy (PEEM) study of polished surfaces of CdTe films in superstrate
configuration, with and without CdCl$_2$ treatment. From photoemission
intensity images, we observed the tendency for individual exposed grain
interiors to vary in photoemission intensity, regardless of whether or not
films received CdCl$_2$ treatment. Additionally, grain boundaries develop
contrast in photoemission intensity images different from grain interiors after
an air exposure step, similar to observations of activated grain boundaries
using scanning Kelvin probe force microscopy studies. These results suggest
that work function varies locally, from one grain interior to another, as well
as between grain boundaries and grain interiors.
