  Depth-sensitive magnetic, structural and chemical characterization is
important in the understanding and optimization of novel physical phenomena
emerging at interfaces of transition metal oxide heterostructures. In a
simultaneous approach we have used polarized neutron and resonant X-ray
reflectometry to determine the magnetic profile across atomically sharp
interfaces of ferromagnetic La0.67Sr0.33MnO3 / multiferroic BiFeO3 bi-layers
with sub-nanometer resolution. In particular, the X-ray resonant magnetic
reflectivity measurements at the Fe and Mn resonance edges allowed us to
determine the element specific depth profile of the ferromagnetic moments in
both the La0.67Sr0.33MnO3 and BiFeO3 layers. Our measurements indicate a
magnetically diluted interface layer within the La0.67Sr0.33MnO3 layer, in
contrast to previous observations on inversely deposited layers. Additional
resonant X-ray reflection measurements indicate a region of an altered Mn- and
O-content at the interface, with a thickness matching that of the magnetic
diluted layer, as origin of the reduction of the magnetic moment.
