  Quantum devices made from van der Waals (vdW) heterostructures of two
dimensional (2D) materials may herald a new frontier in designer materials that
exhibit novel electronic properties and unusual electronic phases. However, due
to the complexity of layered atomic structures and the physics that emerges,
experimental realization of devices with tailored physical properties will
require comprehensive measurements across a large domain of material and device
parameters. Such multi-parameter measurements require new strategies that
combine data-intensive techniques - often applied in astronomy and high energy
physics - with the experimental tools of solid state physics and materials
science. We discuss the challenges of comprehensive experimental science and
present a technique, called Multi-Parameter Dynamic Photoresponse Microscopy
(MPDPM), that utilizes ultrafast lasers, diffraction limited scanning beam
optics, and hardware automation to characterize the photoresponse of 2D
heterostructures in a time efficient manner. Using comprehensive methods on vdW
heterostructures results in large and complicated data sets; in the case of
MPDPM, we measure a large set of images requiring advanced image analysis to
extract the underlying physics. We discuss how to approach such data sets in
general, and in the specific case of a graphene - boron nitride - graphite
heterostructure photocell.
