  In the scanning transmission electron microscope, both phase imaging of
beam-sensitive materials and characterisation of a material's functional
properties using in-situ experiments are becoming more widely available. As the
practicable scan speed of 4D-STEM detectors improves, so too does the temporal
resolution achievable for both differential phase contrast (DPC) and
ptychography. However, the read-out burden of pixelated detectors, and the size
of the gigabyte to terabyte sized data sets, remain a challenge for both
temporal resolution and their practical adoption. In this work, we show that a
high-fidelity DPC phase reconstruction can be achieved from both annular
segmented detectors or pixelated arrays with relatively few elements using
signal digitisation. Unlike conventional analog data, even at the fastest scan
speeds, phase reconstructions from digitised DPC-segment images yield reliable
data. Finally, dose fractionation by fast scanning and multi-framing allows for
post-process binning of frame streams to balance signal-to-noise ratio and
temporal resolution for low-dose phase imaging for in-situ experiments.
