  The use of efficient wavelength-shifters from the vacuum-ultraviolet to the
photosensor's range of sensitivity is a key feature in detectors for Dark
Matter search and neutrino physics based on liquid argon scintillation
detection. Thin film of Tetraphenyl-butadiene (TPB) deposited onto the surface
delimiting the active volume of the detector and/or onto the photosensor
optical window is the most common solution in current and planned experiments.
Detector design and response can be evaluated and correctly simulated only when
the properties of the optical system in use (TPB film + substrate) are fully
understood. Characterization of the optical system requires specific, sometimes
sophisticated optical methodologies. In this paper the main features of TPB
coatings on different, commonly used substrates is reported, as a result of two
independent campaigns of measurements at the specialized optical metrology labs
of ENEA and University of Tor Vergata. Measured features include TPB emission
spectra with lineshape and relative intensity variation recorded as a function
of the film thickness and for the first time down to LAr temperature, as well
as optical reflectance and transmittance spectra of the TPB coated substrates
in the wavelength range of the TPB emission.
