  The characterization of spacial and timing resolution of the novel Trench
Isolated LGAD (TI-LGAD) technology is presented. This technology has been
developed at FBK with the goal of achieving 4D pixels, where an accurate
position resolution is combined in a single device with the precise timing
determination for Minimum Ionizing Particles (MIPs). In the TI-LGAD technology,
the pixelated LGAD pads are separated by physical trenches etched in the
silicon. This technology can reduce the interpixel dead area, mitigating the
fill factor problem. The TI-RD50 production studied in this work is the first
one of pixelated TI-LGADs. The characterization was performed using a scanning
TCT setup with an infrared laser and a $^{90}$Sr source setup.
