  In previous work a different and powerful, analytical, technique was used to
get data, such as the absolute atom concentration (AAC), specimen thickness
etc., from public domain boron nitride EELS spectrum collected under a
collection semi-angle, $\beta$, less than the plasmon cutoff angle,
$\theta_{c}$, but large relative to incident beam convergence, $\alpha$. Here,
seeking for some completeness, another, numerical, technique usable together
with, also, $\beta < \theta_{c}$ is described in minute detail and applied to
data obtained with $\beta/\alpha < 2$, so necessitating incident beam
convergence-related corrections. A lot of experimental physical parameters all
fully relevant to one another are produced from a single EELS spectrum. Of
public domain silicon nitride, Si$_{3}$N$_{4}$, EELS spectrum used. Comparison
between results producible by the two $\beta<\theta_{c}$-related techniques
made. Results range from parameters such as AAC, density, plasmon critical
vector, plasmon dispersion coefficient, Fermi energy to specimen thickness.
Results were obtained using version 5 of eelsMicr program and compared with
existing results obtained using non EELS techniques.
