  NiO6 octahedral tilts in the LaNiO3/SrTiO3 superlattices are quantified using
position averaged convergent beam electron diffraction in scanning transmission
electron microscopy. It is shown that maintaining oxygen octahedra connectivity
across the interface controls the octahedral tilts in the LaNiO3 layers, their
lattice parameters and their transport properties. Unlike films and layers that
are connected on one side to the substrate, subsequent LaNiO3 layers in the
superlattice exhibit a relaxation of octahedral tilts towards bulk values. This
relaxation is facilitated by correlated tilts in SrTiO3 layers and is
correlated with the conductivity enhancement of the LaNiO3 layers in the
superlattices relative to individual films.
