  MgB2 thin films were deposited using Pulsed Laser Deposition (PLD) and
ex-situ annealing in Mg atmosphere. The films presented critical temperatures
up to 36K and turned out to be preferentially c-oriented both on Al2O3 (r-cut)
and MgO(100) substrates. Synchrotron analyses gave also some indications of in
plane texturing. The films exhibit very fine grain size (1200angstromin the
basal plane and 100angstrom along c-axis) but the general resistivity behavior
and the remarkable extension of the irreversible region confirm that the grains
boundaries are not barriers for supercurrents. Upper critical field
measurements with the magnetic field perpendicular and parallel with respect to
the film surface evidenced a field anisotropy ratio of 1.8. The Hc2 values are
considerably higher with respect to the bulk ones, namely when the field lies
in the basal plane, and the field-temperature phase diagram for the two
magnetic field orientations suggest the possibility of strongly enhancing the
pinning region by means of texturing.
