  Reflection high energy electron diffraction (RHEED), scanning tunneling
microscopy (STM), vibrating sample magnetometry and other physical property
measurements are used to investigate the structure, morphology, magnetic and
magneto-transport properties of (001)-oriented Cr$_2$Te$_3$ thin films grown on
Al$_2$O$_3$(0001) and Si(111)-(7$\times$7) surfaces by molecular beam epitaxy
(MBE). Streaky RHEED patterns indicate flat smooth film growth on both
substrates. STM studies show the hexagonal arrangements of surface atoms.
Determination of the lattice parameter from atomically resolved STM image is
consistent with the bulk crystal structures. Magnetic measurements show the
film is ferromagnetic having the Curie temperature of about 180 K, and a spin
glass-like behavior was observed below 35 K. Magneto-transport measurements
show the metallic nature of the film with a perpendicular magnetic anisotropy
along the $c$-axis.
