  Although a lateral-shear interferometer is robust against optical component
vibrations, its interferogram provides information about differential
wavefronts rather than the wavefronts themselves, resulting in the loss of
specific frequency components. Previous studies have addressed this limitation
by measuring four interferograms with different shear amounts to accurately
restore the two-dimensional wavefront. This study proposes a technique that
employs spectral interpolation to reduce the number of required interferograms.
The proposed approach introduces an origin-shift technique for accurate
spectral interpolation, which in turn is implemented by combining two methods:
natural extension and least-squares determination of ambiguities in uniform
biases. Numerical simulations confirmed that the proposed method accurately
restored a two-dimensional wavefront from just two interferograms, thereby
indicating its potential to address the limitations of the lateral-shear
interferometer.
