  Coherent x-ray micro-diffraction and local mechanical loading can be combined
to investigate the mechanical deformation in crystalline nanostructures. Here
we present measurements of plastic deformation in a copper crystal of
sub-micron size obtained by loading the sample with an Atomic Force Microscopy
tip. The appearance of sharp features in the diffraction pattern, while
conserving its global shape, is attributed to crystal defects induced by the
tip.
