  We investigate the scaling properties of single flux lines in a random
pinning landscape consisting of splayed columnar defects. Such correlated
defects can be injected into Type II superconductors by inducing nuclear
fission or via direct heavy ion irradiation. The result is often very efficient
pinning of the vortices which gives, e.g., a strongly enhanced critical
current. The wandering exponent \zeta and the free energy exponent \omega of a
single flux line in such a disordered environment are obtained analytically
from scaling arguments combined with extreme-value statistics. In contrast to
the case of point disorder, where these exponents are universal, we find a
dependence of the exponents on details in the probability distribution of the
low lying energies of the columnar defects. The analytical results show
excellent agreement with numerical transfer matrix calculations in two and
three dimensions.
