  Angle-resolved photoemission spectroscopy (ARPES) is the key
momentum-resolved technique for direct probing of the electronic structure of a
material. However, since it is very surface-sensitive, it has been applied to a
relatively small set of complex oxides that can be easily cleaved in ultra-high
vacuum. Here we describe a new multi-module system at Brookhaven National
Laboratory (BNL) in which an oxide molecular beam epitaxy (OMBE) is
interconnected with an ARPES and a spectroscopic-imaging scanning tunneling
microscopy (SI-STM) module. This new capability largely expands the range of
complex-oxide materials and artificial heterostructures accessible to these two
most powerful and complementary techniques for studies of electronic structure
of materials. We also present the first experimental results obtained using
this system - the ARPES studies of electronic band structure of a
La$_{2-x}$Sr$_x$CuO$_4$ (LSCO) thin film grown by OMBE.
