  We report on a comparative study of spin Hall related effects and
magnetoresistance in YIG|Pt and YIG|Ta bilayers. These combined measurements
allow to estimate the characteristic transport parameters of both Pt and Ta
layers juxtaposed to YIG: the spin mixing conductance $G_{\uparrow \downarrow}$
at the YIG$|$normal metal interface, the spin Hall angle $\Theta_{SH}$, and the
spin diffusion length $\lambda_{sd}$ in the normal metal. The inverse spin Hall
voltages generated in Pt and Ta by the pure spin current pumped from YIG
excited at resonance confirm the opposite signs of spin Hall angles in these
two materials. Moreover, from the dependence of the inverse spin Hall voltage
on the Ta thickness, we extract the spin diffusion length in Ta, found to be
$\lambda_{sd}^\text{Ta}=1.8\pm0.7$ nm. Both the YIG|Pt and YIG|Ta systems
display a similar variation of resistance upon magnetic field orientation,
which can be explained in the recently developed framework of spin Hall
magnetoresistance.
