  Several theories exist to explain persistence, most of which revolve around
the distribution of traps. We aim to simulate persistence and illustrate this
complex issue with a 3D trap map. For this experiment, we vary the detector
voltage bias to simulate the change in the depletion region that occurs when
the detector is exposed to light. This allows us to measure the distribution of
traps in the depletion region. This paper will explore the results from this
experiment and discuss the implications.
