  We investigate correlations of current at contacts and voltage fluctuations
at voltage probes coupled to interferometers. The results are compared with
correlations of current and occupation number fluctuations at dephasing probes.
We use a quantum Langevin approach for the average quantities and their
fluctuations. For higher order correlations we develop a stochastic path
integral approach and find the generating functions of voltage or occupation
number fluctuations. We also derive a generating function for the joint
distribution of voltage or occupation number at the probe and current
fluctuations at a terminal of a conductor. For energy independent scattering we
found earlier that the generating function of current cumulants in
interferometers with a one-channel dephasing or voltage probe are identical.
Nevertheless, the distribution function for voltage and the distribution
function for occupation number fluctuations differ, the latter being broader
than that of former in all examples considered here.
