  We image the field enhancement at Ag nanostructures using femtosecond laser
pulses with a center wavelength of 1.55 micrometer. Imaging is based on
non-linear photoemission observed in a photoemission electron microscope
(PEEM). The images are directly compared to ultra violet PEEM and scanning
electron microscopy (SEM) imaging of the same structures. Further, we have
carried out atomic scale scanning tunneling microscopy (STM) on the same type
of Ag nanostructures and on the Au substrate. Measuring the photoelectron
spectrum from individual Ag particles shows a larger contribution from higher
order photoemission process above the work function threshold than would be
predicted by a fully perturbative model, consistent with recent results using
shorter wavelengths. Investigating a wide selection of both Ag nanoparticles
and nanowires, field enhancement is observed from 30% of the Ag nanoparticles
and from none of the nanowires. No laser-induced damage is observed of the
nanostructures neither during the PEEM experiments nor in subsequent SEM
analysis. By direct comparison of SEM and PEEM images of the same
nanostructures, we can conclude that the field enhancement is independent of
the average nanostructure size and shape. Instead, we propose that the
variations in observed field enhancement could originate from the wedge
interface between the substrate and particles electrically connected to the
substrate.
