  A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8
GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is
a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI
beam at Fermilab. Similar to previous workers, we found that the full
collection of the secondary electron signal requires a bias voltage to draw the
ejected electrons cleanly off the foils, and this effect is more pronounced at
larger beam intensity. The beam centroid and width resolutions of the SEM were
measured at beam widths of 3, 7, and 8 mm, and compared to calculations.
Extrapolating the data from this beam test, we expect a centroid and width
resolutions of 20um and 25 um, respectively, in the NuMI beam which has 1 mm
spot size.
