  Quantitative thermoelectric measurements in the mesoscopic regime require
accurate knowledge of temperature, thermovoltage, and device energy scales. We
consider the effect of a finite load resistance on thermovoltage measurements
of InAs/InP heterostructure nanowires. Load resistance and ac attenuation
distort the measured thermovoltage therefore complicating the evaluation of
device performance. Understanding these effects improves experimental design
and data interpretation.
