  We present our current progress on the design and test of Ti/TiN Multilayer
for use in Kinetic Inductance Detectors (KIDs). Sensors based on
sub-stoichiometric TiN film are commonly used in several applications. However,
it is difficult to control the targeted critical temperature $T_C$, to maintain
precise control of the nitrogen incorporation process and to obtain a
production uniformity. To avoid these problems we investigated multilayer
Ti/TiN films that show a high uniformity coupled with high quality factor,
kinetic inductance and inertness of TiN. These features are ideal to realize
superconductive microresonator detectors for astronomical instruments
application but also for the field of neutrino physics. Using pure Ti and
stoichiometric TiN, we developed and tested different multilayer configuration,
in term of number of Ti/TiN layers and in term of different interlayer
thicknesses. The target was to reach a critical temperature $T_C$ around
$(1\div 1.5)$ K in order to have a low energy gap and slower recombination time
(i.e. low generation-recombination noise). The results prove that the
superconductive transition can be tuned in the $(0.5\div 4.6)$ K temperature
range properly choosing the Ti thickness in the $(0\div 15)$ nm range, and the
TiN thickness in the $(5\div 100)$ nm range
