  Electron scattering rates in metallic single-walled carbon nanotubes are
studied using an atomic force microscope as an electrical probe. From the
scaling of the resistance of the same nanotube with length in the low and high
bias regimes, the mean free paths for both regimes are inferred. The observed
scattering rates are consistent with calculations for acoustic phonon
scattering at low biases and zone boundary/optical phonon scattering at high
biases.
