  Co /CoO/Co polycrystalline film was grown on Si (001) substrate and magnetic
properties have been investigated using in-situ magneto-optic Kerr effect
during growth of the sample. Magnetic anisotropy with easy axis perpendicular
to the film surface has been observed in top Co layer, whereas bottom layer was
found to be soft with in-plane magnetization without any influence of top
layer. Ex-situ in-plane and out-of-plane diffraction measurements revealed that
the growth of Co on oxidized interface takes place with preferential
orientation of c-axis perpendicular to the film plane, which results in the
observed perpendicular magnetic anisotropy. Texturing of the c-axis is expected
to be a result of minimization of the interface energy due to hybridization
between Co and oxygen at the interface.
