  Distinguishing photon-arrival time and position is crucial for advancing
quantum technology. However, capturing spatial and temporal information
efficiently remains challenging. Here, we present a novel photon-detection
technique to achieve a significantly more efficient measurement of
frequency-entangled biphoton than conventional photon detectors. We utilize a
delay-line-anode single-photon detector (DLD), which consists of a
position-sensitive delay line anode sensor behind a microchannel plate.
Biphotons are obtained from the decay of biexcitons in the copper chloride
semiconductor crystal. Two DLDs are coupled with a grating spectrometer exit to
measure the joint spectral distributions of the biphoton. The resulting
non-scanning process requires only a few minutes to obtain a temporally and
spectrally resolved image, which is much quicker than the conventional biphoton
frequency measurement. Our technique paves the way for all experiments in
multi-mode quantum science requiring coincidence measurement.
