  We report a study of long-range MoS2-substrate interaction using resonant
Raman imaging. We observed a strong thickness-dependent peak shift of a
Raman-forbidden mode that can be used as a new method of determining the
thickness of multilayered MoS2 flakes. In addition, dependence of the Raman
scattering intensity on thickness is explained by the interference enhancement
theory. Finally, the resonant Raman spectra on different substrates are
analysed.
