  The low-temperature dc conductivities of barely metallic samples of p-type
Si:B are compared for a series of samples with different dopant concentrations,
n, in the absence of stress (cubic symmetry), and for a single sample driven
from the metallic into the insulating phase by uniaxial compression, S. For all
values of temperature and stress, the conductivity of the stressed sample
collapses onto a single universal scaling curve. The scaling fit indicates that
the conductivity of si:B is proportional to the square-root of T in the
critical range. Our data yield a critical conductivity exponent of 1.6,
considerably larger than the value reported in earlier experiments where the
transition was crossed by varying the dopant concentration. The larger exponent
is based on data in a narrow range of stress near the critical value within
which scaling holds. We show explicitly that the temperature dependences of the
conductivity of stressed and unstressed Si:B are different, suggesting that a
direct comparison of the critical behavior and critical exponents for stress-
tuned and concentration-tuned transitions may not be warranted.
