  We present the design, fabrication, and characterization of high quality
factor and small mode volume planar photonic crystal cavities from cubic (3C)
thin films (thickness ~ 200 nm) of silicon carbide (SiC) grown epitaxially on a
silicon substrate. We demonstrate cavity resonances across the
telecommunications band, with wavelengths from 1,250 - 1,600 nm. Finally, we
discuss possible applications in nonlinear optics, optical interconnects, and
quantum information science.
