  While piezoelectrics and ferroelectrics are playing a key role in many
everyday applications, there are still a number of open questions related to
the physics of those materials. In order to foster the understanding of
piezoelectrics and ferroelectric and pave the way to future applications, the
nanoscale characterization of these materials is essential. In this light, we
have developed a novel AFM based mode that obtains a direct quantitative
analysis of the piezoelectric coefficient d33. This nanoscale tool is capable
of detecting and reveal piezo-charge generation through the direct
piezoelectric effect at the surface of the piezoelectric and ferroelectric
materials. We report the first nanoscale images of the charge generated in a
thick single crystal of Periodically Poled Lithium Niobate (PPLN) and a Bismuth
Ferrite (BiFO3) thin film by applying a force and recording the current
produced by the materials. The quantification of both d33 coefficients for PPLN
and BFO are 13 +- 2 pC/N and 46 +- 7 pC/N respectively, in agreement with the
values reported in the literature. This new mode can operate simultaneously
with PFM mode providing a powerful tool for the electromechanical and
piezo-charge generation characterization of ferroelectric and piezoelectric
materials.
