  A reformulated implementation of single-sideband ptychography enables
analysis and display of live detector data streams in 4D scanning transmission
electron microscopy (STEM) using the LiberTEM open-source platform. This is
combined with live first moment and further virtual STEM detector analysis.
Processing of both real experimental and simulated data shows the
characteristics of this method when data is processed progressively, as opposed
to the usual offline processing of a complete dataset. In particular, the
single side band method is compared to other techniques such as the enhanced
ptychographic engine in order to ascertain its capability for structural
imaging at increased specimen thickness. Qualitatively interpretable live
results are obtained also if the sample is moved, or magnification is changed
during the analysis. This allows live optimization of instrument as well as
specimen parameters during the analysis. The methodology is especially expected
to improve contrast- and dose-efficient in-situ imaging of weakly scattering
specimens, where fast live feedback during the experiment is required.
