  In the main magnetic focus ion source, atomic ions are produced in the local
ion trap created by the rippled electron beam in focusing magnetic field. Here
we present the novel modification of the room-temperature hand-size device,
which allows the extraction of ions in the radial direction perpendicular to
the electron beam across the magnetic field. The detected X-ray emission
evidences the production of Ir$^{44+}$ and Ar$^{16+}$ ions. The ion source can
operate as the ion trap for X-ray spectroscopy, as the ion source for the
production of highly charged ions and also as the ion source of high
brightness.
