  In this letter we discuss a novel and versatile template technique aimed to
the fabrication of sub-10 nm wide wires. Using this technique, we have
successfully measured AuPd wires, 12 nm wide and as long as 20 $\mu$m. Even
materials that form a strong superficial oxide, and thus not suited to be used
in combination with other techniques, can be successfully employed. In
particular we have measured Al wires, with lateral width smaller or comparable
to 10 nm, and length exceeding 10 $\mu$m.
