  Yttrium Iron Garnet (YIG) and bismuth (Bi) substituted YIG (Bi0.1Y2.9Fe5O12,
BYG) films are grown in-situ on single crystalline Gadolinium Gallium Garnet
(GGG) substrates [with (100) and (111) orientations] using pulsed laser
deposition (PLD) technique. As the orientation of the Bi-YIG film changes from
(100) to (111), the lattice constant is enhanced from 12.384 {\AA} to 12.401
{\AA} due to orientation dependent distribution of Bi3+ ions at dodecahedral
sites in the lattice cell. Atomic force microscopy (AFM) images show smooth
film surfaces with roughness 0.308 nm in Bi-YIG (111). The change in substrate
orientation leads to the modification of Gilbert damping which, in turn, gives
rise to the enhancement of ferromagnetic resonance (FMR) line width. The best
values of Gilbert damping are found to be (0.54)*10-4, for YIG (100) and
(6.27)*10-4, for Bi-YIG (111) oriented films. Angle variation measurements of
the Hr are also performed, that shows a four-fold symmetry for the resonance
field in the (100) grown film. In addition, the value of effective
magnetization (4{\pi}Meff) and extrinsic linewidth ({\Delta}H0) are observed to
be dependent on substrate orientation. Hence PLD growth can assist
single-crystalline YIG and BYG films with a perfect interface that can be used
for spintronics and related device applications.
