  Computer simulations are used to generate two-dimensional diffusion-limited
deposits of dipoles. The structure of these deposits is analyzed by measuring
some global quantities: the density of the deposit and the lateral correlation
function at a given height, the mean height of the upper surface for a given
number of deposited particles and the interfacial width at a given height.
Evidences are given that the fractal dimension of the deposits remains constant
as the deposition proceeds, independently of the dipolar strength. These same
deposits are used to obtain the growth probability measure through Monte Carlo
techniques. It is found that the distribution of growth probabilities obeys
multifractal scaling, i.e. it can be analyzed in terms of its $f(\alpha)$
multifractal spectrum. For low dipolar strengths, the $f(\alpha)$ spectrum is
similar to that of diffusion-limited aggregation. Our results suggest that for
increasing dipolar strength both the minimal local growth exponent
$\alpha_{min}$ and the information dimension $D_1$ decrease, while the fractal
dimension remains the same.
