  In this paper, we briefly introduce physical foundations of electromigration
(EM) and present a few classical EMrelated theories. We discuss physical
parameters affecting EM wire lifetime and we introduce some background related
to the existing EM physical simulators. In our work, for EM physical simulation
we adopt the atomic concentration balance-based model. We discuss the
simulation setup and results. We present a variation-aware electromigration
(EM) analysis tool for power grid wires. The tool considers process variations
caused by the chemical-mechanical polishing (CMP) and edge placement error
(EPE). It uses a compact model that features critical region extraction and
variation coefficient calculation.
