  The CLIC Tracker Detector (CLICTD) is a monolithic pixel sensor featuring
pixels of 30um x 37.5um and a small collection diode. The sensor is fabricated
in a 180 nm CMOS imaging process, using two different pixel flavours: the first
with a continuous n-type implant for full lateral depletion, and the second
with a segmentation in the n-type implant for accelerated charge collection.
Moreover, CLICTD features an innovative sub-pixel segmentation scheme that
allows the digital footprint to be reduced while maintaining a small sub-pixel
pitch. In this contribution, test-beam measurements for the pixel flavour with
the segmented n-implant are presented. The performance is evaluated in terms of
time and spatial resolution as well as efficiency. Furthermore, the test-beam
data is compared to simulation studies using a combination of 3D TCAD and Monte
Carlo simulation tools.
