  The microstructural and morphological properties of homoepitaxial (001)ZnTe
layers are investigated by x-ray diffuse scattering. High resolution reciprocal
space maps recorded close to the ZnTe (004) Bragg peak show different diffuse
scattering features. One kind of cross-shaped diffuse scattering streaks along
<111> directions can be attributed to stacking faults within the epilayers.
Another kind of cross-shaped streaks inclined at an angle of about 80deg with
respect to the <110> in-plane direction arises from the morphology of the
epilayers. (abridged version)
