  For single particle electron cryo-microscopy (cryoEM), contrast loss due to
beam-induced charging and specimen movement is a serious problem, as the thin
films of vitreous ice spanning the holes of a holey carbon film are
particularly susceptible to beam-induced movement. We demonstrate that the
problem is at least partially solved by carbon nanotechnology. Doping
ice-embedded samples with single-walled carbon nanotubes (SWNT) in aqueous
suspension or adding nanocrystalline graphene supports, obtained by thermal
conversion of cross-linked self-assembled biphenyl precursors, significantly
reduces contrast loss in high-resolution cryoEM due to the excellent electrical
and mechanical properties of SWNTs and graphene.
