  We present high-speed and wide-field EUV ptychography at 13.5 nm wavelength
using a table-top high-order harmonic source. By employing a scientific
complementary metal oxide semiconductor (sCMOS) detector the scan time for
sub-20 nm high-resolution measurements were significantly reduced by up to a
factor of five. The fast frame rate of sCMOS enables wide-field imaging with a
field of view of 100 {\mu}m x 100 {\mu}m with an imaging speed of 4.6 Mpix/h.
Furthermore, fast EUV wavefront characterization is employed using a
combination of the sCMOS detector with orthogonal probe relaxation.
