  We previously demonstrated near-field speckle scanning based x-ray imaging to
be an easy-to-implement phase sensing method capable of providing both high
sensitivity and high resolution. Yet, this performance combination could only
be achieved at the cost of a significant number of sample exposures and of
extensive data acquisition time, thus tempering its implementation for
tomography applications. Herein, we show ways of drastically lowering the
number of exposures for the speckle scanning method to become attractive for
computed tomography (CT) imaging. As the method presented can cope with a high
divergence beam, it is also expected to attract the attention of the laboratory
sources community.
