  A setup is designed for measuring the Seebeck coefficient (S) of materials in
form of thin film, bar and wire. The main feature of this setup is control in
heating and cooling cycles. In this setup heat pulse is used to generate the
temperature gradient. To demonstrate the capabilities of this setup, S vs T of
standard wire samples such as Au-Fe (0.07 \%), chromel, Pt and thin films of Pt
and F doped SnO$_2$ are presented. The standard uncertainty of the
repeatability in S measurement is found to be $\sim$ $\pm 0.056~\mu V/K$ while
temperature stability is $\sim$ $\pm 10~mK$ (at 320 K), estimated for a chromel
wire sample. We have tested the setup in temperature range 100 K to 320 K,
while it does not have any intrinsic limitation in going down to liquid He
temperatures. For temperatures above 320 K limitation is due to gluing material
like varnish.
