  The spatial scaling law and intermittency of the $V_2 O_5$ surface roughness
by atomic force microscopy has been investigated. The intermittency of the
height fluctuations has been checked by two different methods, first, by
measuring scaling exponent of q-th moment of height-difference fluctuations
i.e. $C_q = < |h(x_1) - h(x_2)|^{q} >$ and the second, by defining generating
function $Z(q,N)$ and generalized multi-fractal dimension $D_q$. These methods
predict that there is no intermittency in the height fluctuations. The observed
roughness and dynamical exponents can be explained by the numerical simulation
on the basis of forced Kuramoto-Sivashinsky equation.
