  In this paper, a linear model based on multiple measurement vectors model is
proposed to formulate the inverse scattering problem of highly conductive
objects at one single frequency. Considering the induced currents which are
mostly distributed on the boundaries of the scatterers, joint sparse structure
is enforced by a sum-of-norm regularization. Since no \textit{a priori}
information is required and no approximation of the scattering model has been
made, the proposed method is versatile. Imaging results with transverse
magnetic and transverse electric polarized synthetic data and Fresnel data
demonstrate its higher resolving ability than both linear sampling method and
its improved version with higher, but acceptable, computational complexity.
