  Complete dissociation dynamics of low-energy electron attachment to carbon
disulfide have been studied using the velocity slice imaging (VSI) technique.
The ion yields of S- and CS- fragment ions as the function of incident electron
energy in the range 5 to 11 eV have been obtained. Two resonances for S- ions
at around 6.2 eV and 7.7 eV and only one resonance for CS- ions at around 6.2
eV have been obtained in this energy range. The kinetic energy and the angular
distributions of these fragment negative ions at different incident electron
energies around these resonances have been measured. From the angular
distribution of these fragment anions, we have found that the bending of the
temporary negative ions causes a significant change in the angular distribution
from the expected one.
