  We propose an isogeometric approach to model the deformation of active thin
films using layered, nonlinear, Kirchhoff Love shells. Isogeometric Collocation
and Galerkin formulations are employed to discretize the electrophysiological
and mechanical sub-problems, respectively, with the possibility to adopt
different element and time-step sizes. Numerical tests illustrate the
capabilities of the active stress based approach to effectively simulate the
contraction of thin films in both quasi-static and dynamic conditions.
