  A unified, Bayesian inference of midplane electron temperature and density
profiles using both Thompson scattering (TS) and interferometric data is
presented. Beyond the Bayesian nature of the analysis, novel features of the
inference are the use of a Gaussian process prior to infer a mollification
length-scale of inferred profiles and the use of Gauss-Laguerre quadratures to
directly calculate the depolarisation term associated with the TS forward
model. Results are presented from an application of the method to data from the
high resolution TS system on the Mega-Ampere Spherical Tokamak, along with a
comparison to profiles coming from the standard analysis carried out on that
system.
