  Low-angle grain boundaries with misorientation angles theta < 5 degrees in
optimally doped thin films of YBCO are investigated by magnetooptical imaging.
By using a numerical inversion scheme of Biot-Savart's law the critical current
density across the grain boundary can be determined with a spatial resolution
of about 5 micrometers. Detailed investigation of the spatially resolved flux
density and current density data shows that the current density across the
boundary varies with varying local flux density. Combining the corresponding
flux and current pattern it is found that there exists a universal dependency
of the grain boundary current on the local flux density. A change in the local
flux density means a variation in the flux line-flux line distance. With this
knowledge a model is developped that explains the flux-current relation by
means of magnetic vortex-vortex interaction.
