  The electrical characterisation of graphene, either in plane sheets or in
properly geometrised form can be approached using non-contact methods already
employed for thin film materials. The extraordinary thinness (and,
correspondingly, the volume) of graphene, however, makes the proper application
of these methods difficult. The electrical properties of interest (sheet
electrical resistivity/conductivity, concentration and mobility of charge
carriers) must be indirectly derived from the measurement outcome by
geometrical and electrical modelling; the assumptions behind such models (e.g.,
uniformity and isotropy, effective value of the applied fields, etc.) require
careful consideration. The traceability of the measurement to the International
System of units and a proper expression of measurement uncertainty is an issue.
  This guide focuses on non-contact and high-throughput methods, that are
methods where the graphene sample surface is not physically contacted with any
metallic electrodes at any stage. A companion guide about contact methods is
also available. The methods discussed are:
  - Measurement of surface potential and work function using Scanning Kelvin
Probe Microscopy (SKPM); - Measurement of sheet resistance by Microwave
Resonant Cavity; - Measurement of sheet resistance by Terahertz time-domain
spectroscopy (THz-TDS); For each method, a corresponding measurement protocol
is discussed, which describes: - The measurement principle; - Sample
requirements and preparation; - A description of the measurement equipment /
apparatus; - Calibration standards and ways to achieve a traceable measurement;
