  Tin Sulphide is a layered compound which retains its structure when deposited
as thin films by thermal evaporation. The films were found to have oriented
growth with the direction of orientation changing with film thickness. The
film's morphology was found to change with orientation. The poor conductivity
of the thicker samples made it difficult to make photocunductivity
characterisation. However, unlike reported the thinner samples showed
photo-sensitivity to be independent of film thickness and grain size with a
high persistent photocurrent. With their absorption, photosensitivty, optimum
band-gap and traps within the band-gap giving the charge carriers a longer
life-time, thin samples of tin sulphide gives adequate scope designing
efficient photovoltaics. The refractive index was modeled using Sellmeir's
model, while most of the previous studies talk of Wemple-DiDomenico single
oscillator model or Cauchy's dispersion relation. The Sellmeir's fitting
parameters are reported which can be of use in ellipsometric studies.
