  The Trigger Data Serializer (TDS) is a custom ASIC designed for the upgrade
of the innermost station of the endcap ATLAS Muon Spectrometer. It is a
mixed-signal chip with two working modes that can handle up to 128 detector
channels. A total of 6,000 TDS ASICs have been produced for detector operation.
This paper discusses a custom automatic test platform we developed to provide
quality control of the TDS ASICs. We introduce the design, test procedures, and
results obtained from this TDS testing platform.
