  In this paper, we show that patterns exist in the properties of the High
Water Mark (HWM) convergents of Champernowne's Constant in various bases (Cb),
specifically in bases 2 through 124. The convergents are formed by truncating
the Continued Fraction Expansion (CFE) of Cb immediately before the CFE HWMs.
These patterns have been extended from the known patterns in the CFE HWMs of
Champernowne's Constant in base ten. We show that the patterns may be used to
efficiently calculate the CFE coefficients of Cb, and to calculate and predict
the lengths of the HWM coefficients, the number of correct digits of Cb as
calculated by the convergent, and the convergent error. We have discovered that
minor corrections to the pattern formulations in base 10 are required for some
bases, and these corrections are presented and discussed. The resulting
formulations may be used to make the calculations for Cb in any base.
