  Low-power SRAM architectures are especially sensitive to many types of
defects that may occur during manufacturing. Among these, resistive defects can
appear. This paper analyzes some types of such defects that may impair the
device functionalities in subtle ways, depending on the defect characteristics,
and that may not be directly or easily detectable by traditional test methods,
such as March algorithms. We analyze different methods to test such defects and
discuss them in terms of complexity and test time.
