  In this paper, we describe the optical grid deflection method used to
reconstruct the 3D profile of liquid films deposited by a receding liquid
meniscus. This technique uses the refractive properties of the film surface and
is suitable for liquid thickness from several microns to millimeter. This
method works well for strong interface slopes and changing in time film shape;
it applies when the substrate and fluid media are transparent. The refraction
is assumed to be locally unidirectional. The method is particularly appropriate
to follow the evolution of parameters such as dynamic contact angle, triple
liquid-gas-solid contact line velocity or dewetting ridge thickness.
