  Polarized neutron reflectometry (PNR) has long been applied to measure the
magnetic depth profile of thin films. In recent years, interest has increased
in observing lateral magnetic structures in a film. While magnetic arrays
patterned by lithography and submicron-sized magnetic domains in thin films
often give rise to off-specular reflections, micron-sized ferromagnetic domains
on a thin film produce few off-specular reflections and the domain distribution
information is contained within the specular reflection. In this paper, we will
first present some preliminary results of off-specular reflectivity from arrays
of micron-sized permalloy rectangular bars. We will then use specular
reflections to study the domain dispersion of an exchange-biased Co/CoO bilayer
at different locations of the hysteresis loop.
