  We characterize low-loss electron-beam evaporated niobium thin films
deposited under ultra-high vacuum conditions. Slow deposition yields films with
a high superconducting transition temperature ($9.20 \pm 0.06 \rm ~K$) as well
as a residual resistivity ratio of $4.8$. We fabricate the films into coplanar
waveguide resonators to extract the intrinsic loss due to the presence of
two-level-system fluctuators using microwave measurements. For a coplanar
waveguide resonator gap of $2~\mu \rm m$, the films exhibit
filling-factor-adjusted two-level-system loss tangents as low as $1.5 \times
10^{-7}$ with single-photon regime internal quality factors in excess of one
million after removing native surface oxides of the niobium.
