  Ion temperature in the scrape-off layer is an important quantity but rarely
measured at high temporal resolution. In order to achieve fast measurements
during intermittent events such as blobs, a novel ExB analyzer has been
designed. The measurement with the E$\times$B analyzer does not require voltage
sweeping but records ion current on DC biased collectors, meaning that the
temporal resolution is only limited by the sampling frequency of the data
acquisition system and electronics of the amplifiers, which exceeds the typical
timescale of events of interest (~10 microseconds).
  The analyzer is equipped with entrance slit of optimized knife-edge shape,
which reduces selective ion losses and improves overall ion transmission. The
design of the analyzer is presented together with first acquired signals and
reconstructed temperatures.
