  Here, we present a numerical post-processing method for removing the effect
of anti-symmetric residual aberrations in high-resolution transmission electron
microscopy (HRTEM) images of weakly scattering 2D-objects. The method is based
on applying the same aberrations with the opposite phase to the Fourier
transform of the recorded image intensity and subsequently inverting the
Fourier transform. We present the theoretical justification of the method and
its verification based on simulated images in the case of low-order
anti-symmetric aberrations. Ultimately the method is applied to experimental
hardware aberration-corrected HRTEM images of single-layer graphene and MoSe2
resulting in images with strongly reduced residual low-order aberrations, and
consequently improved interpretability. Alternatively, this method can be used
to estimate by trial and error the residual anti-symmetric aberrations in HRTEM
images of weakly scattering objects.
