  X-ray binary systems consist of a companion star and a compact object in
close orbit. Thanks to their copious X-ray emission, these objects have been
studied in detail using X-ray spectroscopy and timing. The inclination of these
systems is a major uncertainty in the determination of the mass of the compact
object using optical spectroscopic methods. In this paper, we present a new
method to constrain the inclination of X-ray binaries, which is based on the
modeling of the polarization of X-rays photons produced by a compact source and
scattered off the companion star. We describe our method and explore the
potential of this technique in the specific case of the low mass X-ray binary
GS 1826-238 observed by the Imaging X-ray Polarimetry Explorer (IXPE)
observatory.
