  We have made the first interferomeric measurements of the wavelengths of the
important ultraviolet diagnostic lines in the spectra \ion{C}{4} near 155 nm
and \ion{Si}{4} near 139 nm with a vacuum ultraviolet Fourier transform
spectrometer and high-current discharge sources. The wavelength uncertainties
were reduced by one order of magnitude for the \ion{C}{4} lines and by two
orders of magnitude for the \ion{Si}{4} lines. Our measurements also provide
accurate wavelengths for resonance transitions in \ion{Al}{3}, \ion{Al}{2}, and
\ion{Si}{2}.
