  The structure and chemistry of grain boundaries (GBs) are crucial in
determining polycrystalline materials' properties. Faceting and solute
segregation to minimize the GB energy is a commonly observed phenomenon. In
this paper, a deposition process to obtain pure tilt GBs in titanium (Ti) thin
films is presented. By increasing the power density, a transition from
polycrystalline film growth to a maze bicrystalline Ti film on SrTiO$_3$ (001)
substrate is triggered. All the GBs in the bicrystalline thin film are
characterized to be $\Sigma$13 [0001] coincident site lattice (CSL) boundaries.
The GB planes are seen to distinctly facet into symmetric {$\bar{7}520$} and
asymmetric {$10\bar{1}0$} // {$11\bar{2}0$} segments of 20-50~nm length.
Additionally, EDS reveals preferential segregation of iron (Fe) in every
alternate symmetric {$\bar{7}520$} segment. Both the faceting and the
segregation are explained by a difference in the CSL density between the facet
planes. Furthermore, in the GB plane containing Fe segregation, atom probe
tomography is used to experimentally determine the GB excess solute to be
1.25~atoms/nm$^{2}$. In summary, the study reveals for the first time a
methodology to obtain bicrystalline Ti thin films with strong faceting and
anisotropy in iron (Fe) segregation behaviour within the same family of planes.
