  We introduce a rapid data acquisition and reconstruction method to image the
crystalline structure of materials and associated strain and orientations at
micrometer resolution using Laue diffraction. Our method relies on scanning a
coded-aperture across the diffracted x-ray beams from a broadband illumination,
and a reconstruction algorithm to resolve Laue microdiffraction patterns as a
function of depth along the incident illumination path. This method provides a
rapid access to full diffraction information at sub-micrometer volume elements
in bulk materials. Here we present the theory as well as the experimental
validation of this imaging approach.
