  Mn $K$-edge fluorescence data are presented for thin film samples (3000~\AA)
of Colossal Magnetoresistive (CMR) La$_{0.67}$Ca$_{0.33}$MnO$_3$: as-deposited,
and post-annealed at 1000 K and 1200 K. The local distortion is analyzed in
terms of three contributions: static, phonon, and an extra,
temperature-dependent, polaron term. The polaron distortion is very small for
the as-deposited sample and increases with the annealing temperature. In
contrast, the static distortion in the samples decreases with the annealing
temperature. Although the local structure of the as-deposited sample shows very
little temperature dependence, the change in resistivity with temperature is
the largest of these three thin film samples. The as-deposited sample also has
the highest magnetoresistance (MR), which indicates some other mechanism may
also contribute to the transport properties of CMR samples. We also discuss the
relationship between local distortion and the magnetization of the sample.
