  We report the synthesis and characterization of Nd_{0.5}Sr_{0.5}MnO_{3} thin
films grown by the Pulsed Laser Deposition technique on 100 -oriented LaAlO_{3}
substrates. X-ray diffraction (XRD) studies show that the films are 101
-oriented, with a strained and quasi-relaxed component, the latter increasing
with film thickness. We observe that transport properties are strongly
dependent on the thickness of the films. Variable temperature XRD down to 100 K
suggests that this is caused by substrate induced strain on the films.
