  The resistance of $Tl_2Ba_2CaCu_2O_8$ thin films has been measured when the
angle between the applied fields and $ab$-plane of the film is changed
continuously at various temperatures. Under various magnetic fields, the
resistance can be well scaled in terms of the c-axis component of the applied
fields at the same temperature in the whole angle range. Meanwhile, we show
that the measurement of resistance in this way is a complementary method to
determine the growth orientation of the anisotropic high-$T_c$ superconductors.
