  A self-consistent theory of shot noise in ballistic two-terminal conductors
under the action of long-range Coulomb correlations is presented. Analytical
formulas for the electron distribution function and its fluctuation along the
conductor, which account for the Coulomb correlations, have been derived. Based
upon these formulas, the current-noise reduction factor has been obtained for
biases ranging from thermal to shot-noise limits as dependent on two
parameters: the ratio between the length of the sample and the Debye screening
length \lambda=d/L_D and the applied voltage qU/k_BT. The difference with the
formulas for a vacuum diode is discussed.
