  We report new measurements of the electrical conductivity sigma of the
canonical three-dimensional metal-insulator system Si:P under uniaxial stress
S. The zero-temperature extrapolation of sigma(S,T -> 0) ~\S - S_c\^mu shows an
unprecidentedly sharp onset of finite conductivity at S_c with an exponent mu =
1. The value of mu differs significantly from that of earlier stress-tuning
results. Our data show dynamical sigma(S,T) scaling on both metallic and
insulating sides, viz. sigma(S,T) = sigma_c(T) F(\S - S_cT^y) where sigma_c(T)
is the conductivity at the critical stress S_c. We find y = 1/znu = 0.34 where
nu is the correlation-length exponent and z the dynamic critical exponent.
