  Existing Charge-Coupled Devices (CCDs) operate by detecting either the
electrons or holes created in an ionization event. We propose a new type of
imager, the Dual-Sided CCD, which collects and measures both charge carriers on
opposite sides of the device via a novel dual-buried channel architecture. We
show that this dual detection strategy provides exceptional dark-count
rejection and enhanced timing capabilities. These advancements have
wide-ranging implications for dark-matter searches, near-IR/optical
spectroscopy, and time-domain X-ray astrophysics.
