  In the present work, we investigate the formation of nano tracks by cluster
and mono-atomic ion beams in the fullerene (C60) thin films by High Resolution
Transmission Electron Microscopy (HRTEM). The fullerene films on carbon coated
grids were irradiated by 30 MeV C60 cluster beam and 120 MeV Au mono-atomic
beams at normal and grazing angle to the incident ion beams. The studies show
that the cluster beam creates latent tracks of an average diameter of around 20
nm. The formation of large size nano tracks by cluster beam is attributed to
the deposition of large electronic energy density as compared to mono-atomic
beams.
