  We measure the homogeneous excitation linewidth of regioregular
poly(3-hexylthiophene), a model semicrystalline polymeric semiconductor, by
means of two-dimensional coherent photoluminescence excitation spectroscopy. At
a temperature of 8\,K, we find a linewidth that is always $\gtrsim 110$\,meV
full-width-at-half-maximum, which is a significant fraction of the total
linewidth. It displays a spectral dependence and is minimum near the 0--0
origin peak. We interpret this spectral dependence of the homogeneous
excitation linewidth within the context of a weakly coupled aggregate model.
