  Reflection measurements give access to the complex impedance of a material on
a wide frequency range. This is of interest to study the dynamical properties
of various materials, for instance disordered superconductors. However
reflection measurements made at cryogenic temperature suffer from the
difficulty to reliably subtract the circuit contribution. Here we report on the
design and first tests of a setup able to precisely calibrate in situ the
sample reflection, at 4.2 K and up to 2 GHz, by switching and measuring, during
the same cool down, the sample and three calibration standards.
