  We present a comparative study of the angular dependent critical current
density in YBa2Cu3O7 films deposited on IBAD MgO and on single crystal MgO and
SrTiO3 substrates. We identify three angular regimes where pinning is dominated
by different types of correlated and uncorrelated defects. We show that those
regimes are present in all cases, indicating that the pinning mechanisms are
the same, but their extension and characteristics are sample dependent,
reflecting the quantitative differences in texture and defect density. In
particular, the more defective nature of the films on IBAD turns into an
advantage as it results in stronger vortex pinning, demonstrating that the
critical current density of the films on single crystals is not an upper limit
for the performance of the IBAD coated conductors.
