  Electron backscatter diffraction (EBSD) is a technique used to measure
crystallographic features in the scanning electron microscope. The technique is
highly automated and readily accessible in many laboratories. EBSD pattern
indexing is conventionally performed with raw electron backscatter patterns
(EBSPs). These patterns are software processed to locate the band centres (and
sometimes edges) from which the crystallographic index of each band is
determined. Once a consistent index for many bands are obtained, the crystal
orientation with respect to a reference sample & detector orientation can be
determined and presented. Unfortunately, due to challenges related to crystal
symmetry, there are limited available pattern indexing approaches and this has
likely hampered open development of the technique. In this manuscript, we
present a new method of pattern indexing, based upon a method with which
satellites locate themselves in the night sky, and systematically demonstrate
its effectiveness using dynamical simulations and real experimental patterns.
The benefit of releasing this new algorithm is demonstrated as we utilise this
indexing process, together with dynamical solutions, to provide some of the
first accuracy assessments of an indexing solution. In disclosing a new
indexing algorithm, and software processing tool-kit, we hope this opens up
EBSD developments to more users. The software code and example data is released
alongside this article for 3rd party developments.
