  Paraffin coatings on glass slides were investigated through both X-ray
photoelectron spectroscopy (XPS) and spin relaxation measurement for cesium
(Cs) vapor. The components of the glass substrate, such as silicon (Si) and
oxygen (O), existed in the XPS spectra of the coated slides, indicating the
imperfection of the prepared paraffin coatings. The substrate was not observed
after the annealing of the coatings in Cs vapor, which is known as a `ripening'
process for spin relaxation measurement. We found a general trend that
effective anti-spin relaxation performance requires high paraffin and low Cs
coverage on the surface. We also examined a type of diamond-like carbon (DLC)
film, anticipating the effect of anti-spin relaxation; our attempts have failed
to date.
