  In this work, we revisit the problem of interference fringe patterns in CCD
chips occurring in near-infrared bands due to multiple light reflections within
the chip. We briefly discuss the traditional approaches that were developed to
remove these patterns from science images, and mention their limitations. We
then introduce a new method to globally estimate the fringe patterns in a
collection of science images without additional external data, allowing for
some variation of the patterns between images. We demonstrate this new method
on near-infrared images taken by the CFHT wide-field imager Megacam.
