  Ultra-thin films of the electron doped manganite La$_{0.8}$Ce$_{0.2}$MnO$_3$
were grown in a layer-by-layer growth mode on SrTiO$_3$ (001) substrates by
pulsed laser interval deposition. High structural quality and surface
morphology was confirmed by a combination of synchrotron based x-ray
diffraction and atomic force microscopy. Resonant X-ray absorption spectroscopy
measurements confirm the presence of Ce$^{+4}$ and Mn$^{+2}$ ions. In addition,
the electron doping signature was corroborated by Hall effect measurements. All
grown films show ferromagnetic ground state as revealed by both XMCD and
magnetoresistance measurements and remain insulating contrary to earlier
reports of metal-insulator transition. Our results hint at the possibility of
electron-hole asymmetry in the colossal magnetoresistive (CMR) manganite phase
diagram akin to high-$T_c$ cuprates.
