  The properties of porous glasses and their field of application strongly
depend on the characteristics of the void space. Understanding the relationship
between their porous structure and failure behaviour can contribute to the
development of porous glasses with long-term reliability optimized for specific
applications. In the present work, we used X-ray computed tomography with
nanometric resolution (nano-CT) to image a controlled pore glass (CPG) with 400
nm-sized pores whilst undergoing uniaxial compression in-situ to emulate a
stress process. Our results show that in-situ nano-CT provides an ideal
platform for identifying the mechanisms of damage within glass with pores of
400 nm, as it allowed the tracking of the pores and struts change of shape
during compression until specimen failure. We have also applied computational
tools to quantify the microstructural changes within the CPG sample by mapping
the displacements and strain fields, and to numerically simulate the behaviour
of the CPG using a Fast Fourier Transform/phase-field method. Both experimental
and numerical data show local shear deformation, organized along bands,
consistent with the appearance and propagation of +/- 45 degrees cracks.
