  We present a generalized method to describe the x-ray scattering intensity of
the Bragg spots in a diffraction pattern from nanocrystals exposed to intense
x-ray pulses. Our method involves the subdivision of a crystal into smaller
units. In order to calculate the dynamics within every unit we employ a
Monte-Carlo (MC)-molecular dynamics (MD)-ab-initio hybrid framework using real
space periodic boundary conditions. By combining all the units we simulate the
diffraction pattern of a crystal larger than the transverse x-ray beam profile,
a situation commonly encountered in femtosecond nanocrystallography experiments
with focused x-ray free-electron laser radiation. Radiation damage is not
spatially uniform and depends on the fluence associated with each specific
region inside the crystal. To investigate the effects of uniform and
non-uniform fluence distribution we have used two different spatial beam
profiles, gaussian and flattop.
