  Atomic Force Microscopy has enabled 2D imaging at the sub-molecular level,
and 3D mapping of the potential field. However, fast identification of the
surface still remains a challenging topic. In this paper, as a step towards
implementation of such function, we introduce a control scheme and mathematical
treatment of the acquired data that enable retrieval of essential information
characterizing the potential field, leading to fast acquisition of images with
chemical contrast. The control scheme is based on tip sample distance
modulation at an angular frequency of ${\omega}$, and null control of the
${1\omega}$ component of the self excitation frequency of the oscillator. It is
demonstrated that the control is robust in UHV for a frequency well as small as
a few Hz/MHz, and that the mathematical treatment results in satisfactory
identification of the potential field. Morse potential is chosen as a case
study for identifying the Morse parameters per pixel. Atomic features with
similar topography were distinguished by differences in the parameters. The
decay length parameter was resolved with a resolution of 10 pm. The method was
demonstrated on quenched Silicon at a scan rate comparable to normal imaging.
