  High quality scanning transmission electron microscopy (STEM) data
acquisition and analysis has become increasingly important due to the
commercial demand for investigating the properties of complex materials such as
battery cathodes; however, multidimensional techniques (such as 4-D STEM) which
can improve resolution and sample information are ultimately limited by the
beam-damage properties of the materials or the signal-to-noise ratio of the
result. subsampling offers a solution to this problem by retaining high signal,
but distributing the dose across the sample such that the damage can be
reduced. It is for these reasons that we propose a method of subsampling for
4-D STEM, which can take advantage of the redundancy within said data to
recover functionally identical results to the ground truth. We apply these
ideas to a simulated 4-D STEM data set of a LiMnO2 sample and we obtained high
quality reconstruction of phase images using 12.5% subsampling.
