  Crack-templated networks, metallic frameworks fabricated from crack patterns
in sacrificial thin films, can exhibit high optical transmittance, high
electric conductivity, and a host of other properties attractive for
applications. Despite advances in preparing, characterizing, and analyzing
optoelectronic performance of cracked template networks, limited efforts have
focused on predicting how their disordered structures help determine their
electrical and optical properties and explain their interrelationships. We
introduce a geometric modeling approach for crack-templated networks and use
simulation to compute their wavelength- and incident angle-dependent optical
transmittance and sheet resistivity. We explore how these properties relate to
one another and to those of metallic meshes with periodically ordered aperture
arrays. We consider implications of the results for optoelectronic
applications, compare figure-of-merit predictions to experimental data, and
highlight an opportunity to extend the modeling approach using inverse methods.
