  Nanocrystalline textured EuO thin films are prepared by an oxygen loss
process from a pure Eu2O3 bulk ceramic target through pulsed laser deposition
in vacuum at room temperature. X-ray diffraction spectra evidence a
well-defined diffraction peak corresponding to the EuO phase textured along the
(110) direction. Analysis of the XRD peak profile indicates that the films are
nanocrystalline (average crystallite size of 11 nm) with a compressive residual
strain. The formation of stoichiometric EuO is further confirmed by a strong
signal from Eu2+ in the X-ray photoelectron spectra. The complex refractive
index in the near infrared has been determined by spectroscopic ellipsometry
and shows that the EuO films have a high transparency (k < 10-3) and a
refractive index of 2.1. A band-gap shift of 0.25 eV is found with respect to
the EuO bulk. These films, deposited by an accessible and efficient method,
open a new route to produce EuO films with optical quality, suitable for NIR
optoelectronic components.
