  We propose a novel nonlinear dynamical Hall effect characteristic of layered
materials with chiral symmetry, which is driven by the joint action of in-plane
and time variation of out-of-plane ac fields
$\boldsymbol{j}_{\text{H}}\sim\boldsymbol{\dot{E}_{\perp}}\times\boldsymbol{E}_{\parallel}$.
A new band geometric quantity -- interlayer Berry connection polarizability,
which probes a mixed quantum metric characteristic of layer hybridized
electrons by twisted interlayer coupling, underlies this effect. When the two
orthogonal fields have common frequency, their phase difference controls the
on/off, direction and magnitude of the rectified Hall current. We show sizable
effects in twisted homobilayer transition metal dichalcogenides and twisted
bilayer graphene over broad range of twist angles. Our work opens the door to
discovering mixed quantum metric responses unique to van der Waals stacking and
concomitant applications under the nonlinear spotlight.
