  Fluorescence-lifetime imaging microscopy (FLIM) was applied to investigate
the donor distribution in SrTiO3 single crystals. On the surfaces of Nb- and
La-doped SrTiO3, structures with different fluorescence intensities and
lifetimes were found that could be related to different concentrations of Ti3+.
Furthermore, the inhomogeneous distribution of donors caused a non-uniform
conductivity of the surface, which complicates the production of potential
electronic devices by the deposition of oxide thin films on top of doped single
crystals. Hence, we propose FLIM as a convenient technique (length scale: 1
$\mu$m) for characterizing the quality of doped oxide surfaces, which could
help to identify appropriate substrate materials.
