  We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging
surface potential. The open-loop, single-pass technique applies a low-frequency
AC voltage to the atomic force microscopy tip while driving the cantilever near
its resonance frequency. Frequency mixing due to the nonlinear capacitance
gives intermodulation products of the two drive frequencies near the cantilever
resonance, where they are measured with high signal to noise ratio. Analysis of
this intermodulation response allows for quantitative reconstruction of the
contact potential difference. We derive the theory of the method, validate it
with numerical simulation and a control experiment, and we demonstrate its
utility for fast imaging of the surface photo-voltage on an organic
photo-voltaic material.
