  Transmission electron microscopy has witnessed rampant development and
surging point resolution over the past few years. The improved imaging
performance of modern electron microscopes shifts the bottleneck for image
contrast and resolution to sample preparation. Hence, it is increasingly being
realized that the full potential of electron microscopy will only be realized
with the optimization of current sample preparation techniques. Perhaps the
most recognized issues are background signal and noise contributed by sample
supports, sample charging and instability. Graphene provides supports of single
atom thickness, extreme physical stability, periodic structure, and ballistic
electrical conductivity. As an increasing number of applications adapting
graphene to their benefit emerge, we discuss the unique capabilities afforded
by the use of graphene as a sample support for electron microscopy.
