  We present a method to carry out electrical and opto-electronic measurements
on 2D materials using carbon fiber microprobes to directly make electrical
contacts to the 2D materials without damaging them. The working principle of
this microprobing method is illustrated by measuring transport in MoS2 flakes
in vertical (transport in the out-of-plane direction) and lateral (transport
within the crystal plane) configurations, finding performances comparable to
those reported for MoS2 devices fabricated by conventional lithographic
process. We also show that this method can be used with other 2D materials.
