  The in-plane current profile within multilayers of generic structure
Ta/Pt/(CoNi)/Pt/Ta is investigated. A large set of samples where the thickness
of each layer is systematically varied was grown, followed by the measurement
of the sheet resistance of each sample. The data are analyzed by a series of
increasingly elaborate models, from a macroscopic engineering approach to
mesoscopic transport theory. Non-negligible variations of the estimated
repartition of current between the layers are found. The importance of having
additional structural data is highlighted.
