  In this paper, we propose a non-invasive imaging method of microwave near
field using a diamond containing nitrogen-vacancy centers. We applied
synchronous pulsed sequence combined with charge coupled device camera to
measure the amplitude of the microwave magnetic field. A full reconstruction
formulation of the local field vector, including the amplitude and phase, is
developed by measuring both left and right circular polarizations along the
four nitrogen-vacancy axes. Compared to the raster scanning approach, the two
dimensional imaging method is promising for application to circuit failure
analysis. A diamond film with micrometer thinness enables high-resolution near
field imaging. The proposed method is expected to have applications in
monolithic-microwave-integrated circuit chip local diagnosis, antenna
characterization, and field mode imaging of microwave cavities and waveguides.
