  Angle-resolved photoemission spectroscopy (ARPES), an experimental technique
based on the photoelectric effect, is arguably the most powerful method for
probing the electronic structure of solids. The past decade has witnessed
notable progress in ARPES, including the rapid development of soft-X-ray ARPES,
time-resolved ARPES, spin-resolved ARPES and spatially resolved ARPES, as well
as considerable improvements in energy and momentum resolution. Consequently ,
ARPES has emerged as an indispensable experimental probe in the study of
topological materials, which have characteristic non-trivial bulk and surface
electronic structures that can be directly detected by ARPES. Over the past few
years, ARPES has had a crucial role in several landmark discoveries in
topological materials, including the identification of topological insulators
and topological Dirac and Weyl semimetals. In this Technical Review , we assess
the latest developments in different ARPES techniques and illustrate the
capabilities of these techniques with applications in the study of topological
materials.
