  Mesoscopic-scale stacking reconfigurations are investigated when van der
Waals films are stacked. We have developed a method to visualize complicated
stacking structures and mechanical distortions simultaneously in stacked
atom-thick films using Raman spectroscopy. In the rigid limit, we found that
the distortions originate from the transfer process, which can be understood
through thin film mechanics with a large elastic property mismatch. In
contrast, with atomic corrugations, the in-plane strain fields are more closely
correlated with the stacking configuration, highlighting the impact of atomic
reconstructions on the mesoscopic scale. We discovered that the grain
boundaries don`t have a significant effect while the cracks are causing
inhomogeneous strain in stacked polycrystalline films. This result contributes
to understanding the local variation of emerging properties from moir\'e
structures and advancing the reliability of stacked vdW material fabrication.
