  The main feature of vicinal surfaces of crystals characterized by the Miller
indices $(h\,h\,m)$, is rather small width (less than 10 nm) and substantially
large length (more than 200 nm) of atomically-flat terraces on sample surface.
This makes difficult to apply standard methods of image processing and correct
visualization of crystalline lattice at the terraces and multiatomic steps.
Here we consider two procedures allowing us to minimize effects of both
small-scale noise and global tilt of sample: (i) analysis of the difference of
two Gaussian blurred images, and (ii) subtraction of the plane, whose
parameters are determined by optimization of the histogram of the visible
heights, from raw topography image. It is shown that both methods provide
non-distorted images demonstrating atomic structures on vicinal ${\rm
Si}(5\,5\,6)$ and ${\rm Si}(5\,5\,7)$ surfaces.
