  We describe a technique for fabricating nanometer-scale gaps in Pt wires on
insulating substrates, using individual single-walled carbon nanotubes as
shadow masks during metal deposition. More than 80% of the devices display
current-voltage dependencies characteristic of direct electron tunneling. Fits
to the current-voltage data yield gap widths in the 0.8-2.3 nm range for these
devices, dimensions that are well suited for single-molecule transport
measurements.
