  In this work we present a detailed Raman scattering investigation of zinc
oxide and aluminum-doped zinc oxide (AZO) films characterized by a variety of
nanoscale structure and morphology and synthesized by pulsed laser deposition
(PLD) under different oxygen pressure conditions. The comparison of Raman data
for pure ZnO and AZO films with similar morphology at the nano/mesoscale allows
to investigate the relation between Raman features (peak or band positions,
width, relative intensity) and material properties such as local structural
order, stoichiometry and doping. Moreover Raman measurements with three
different excitation lines (532, 457 and 325 nm) point out a strong correlation
between vibrational and electronic properties. This observation confirms the
relevance of a multi-wavelength Raman investigation to obtain a complete
structural characterization of advanced doped oxide materials.
