  Accurate data of complex permittivity of dielectric substrates are needed for
efficient design of HTS microwave planar circuits. We have tested MgO
substrates from three different manufacturing batches using a dielectric
resonator with superconducting parts recently developed for precise microwave
characterization of laminar dielectrics at cryogenic temperatures. The
measurement fixture has been fabricated using a SrLaAlO3 post dielectric
resonator with DyBa2Cu3O7 end plates and silver-plated copper sidewalls to
achieve the resolution of loss tangent measurements of 2 {\times} 10-6. The
tested MgO substrates exhibited the average relative permittivity of 9.63 and
tan {\delta} from 3.7 {\times} 10-7 to 2 {\times} 10-5 at frequency of 10.5 GHz
in the temperature range from 14 to 80 K.
