  An alternative measure of x-ray absorption spectroscopy (XAS) called inverse
partial fluorescence yield (IPFY) has recently been developed that is both bulk
sensitive and free of saturation effects. Here we show that the angle
dependence of IPFY can provide a measure directly proportional to the total
x-ray absorption coefficient, $\mu(E)$. In contrast, fluorescence yield (FY)
and electron yield (EY) spectra are offset and/or distorted from $\mu(E)$ by an
unknown and difficult to measure amount. Moreover, our measurement can
determine $\mu(E)$ in absolute units with no free parameters by scaling to
$\mu(E)$ at the non-resonant emission energy. We demonstrate this technique
with measurements on NiO and NdGaO$_3$. Determining $\mu(E)$ across edge-steps
enables the use of XAS as a non-destructive measure of material composition. In
NdGaO$_3$, we also demonstrate the utility of IPFY for insulating samples,
where neither EY or FY provide reliable spectra due to sample charging and
self-absorption effects, respectively.
