  This paper delves into a comprehensive analysis of fault-tolerant memory
systems, focusing on recovery techniques modeled using Markov chains to address
transient errors. The study revolves around the application of scrubbing
methods in conjunction with Single Error Correction and Double Error Detection
(SEC-DED) codes. It explores three primary models: 1) Exponentially distributed
scrubbing, involving periodic checks of memory words within exponentially
distributed time intervals; 2) Deterministic scrubbing, featuring regular,
periodic word checks; and 3) Mixed scrubbing, which combines both probabilistic
and deterministic scrubbing approaches. The research encompasses the estimation
of reliability and Mean Time to Failure (MTTF) values for each model. Notably,
the findings highlight the superior performance of mixed scrubbing over simpler
scrubbing methods in terms of reliability and MTTF.
