  The scanning electron microscopy (SEM) is probably one the most fascinating
examination approach that has been used since more than two decades to detailed
inspection of micro scale objects. Most of the scanning electron microscopes
could only produce 2D images that could not assist operational analysis of
microscopic surface properties. Computer vision algorithms combined with very
advanced geometry and mathematical approaches turn any SEM into a full 3D
measurement device. This work focuses on a methodical literature review for
automatic 3D surface reconstruction of scanning electron microscope images.
