  The correlation between magnetic and structural properties of Co_{2} FeAl
(CFA) thin films of different thickness (10 nm<d< 100 nm) grown at room
temperature on MgO-buffered Si/SiO2 substrates and annealed at
600\lyxmathsym{\textdegree}C has been studied. XRD measurements revealed an
(011) out-of-plane texture growth of the films. The deduced lattice parameter
increases with the film thickness. Moreover, pole figures showed no in-plane
preferential growth orientation. The magneto-optical Kerr effect hysteresis
loops showed the presence of a weak in-plane uniaxial anisotropy with a random
easy axis direction. The coercive field measured with an applied field along
the easy axis direction and the uniaxial anisotropy field increase linearly
with the inverse of the CFA thickness. The microstrip line ferromagnetic
resonance measurements for in-plane and perpendicular applied magnetic fields
revealed that the effective magnetization and the uniaxial in-palne anisotropy
field follow a linear variation versus the inverse CFA thickness. This allows
deriving a perpendicular surface anisotropy coefficient of -1.86 erg/cm2
