  Noise from atomic tunneling systems (TSs) limit the performance of various
resonant devices, ranging in application from astronomy detectors to quantum
computing. Using devices containing these TSs, we study the $1/f$ permittivity
noise and loss tangent in two film types containing different TS densities. The
noise reveals an intrinsic value as well as the crossover to power-saturated
noise. The intrinsic $1/f$ noise fits to the temperature dependence
$1/T^{1+\mu}$ where $0.2\le\mu\le0.7$, which is related to previous studies and
strongly interacting TS. An analysis of the noise normalized by the loss
tangent and temperature is quantitatively identical for two film types, despite
a factor of 5 difference in their loss tangent. Following from the broad
applicability of the TS model, the data supports a universal relationship for
amorphous-solid produced permittivity noise. The quantity of the observed noise
particularly supports a recent model in which noise is created by weak TS-TS
interactions.
