  Transport critical current measurements have been performed on 5 degree
[001]-tilt thin film YBa2Cu3O7-delta single grain boundaries with magnetic
field rotated in the plane of the film, phi. The variation of the critical
current has been determined as a function of the angle between the magnetic
field and the grain boundary plane. In applied fields above 1 T the critical
current, j_c, is found to be strongly suppressed only when the magnetic field
is within an angle phi_k of the grain boundary. Outside this angular range the
behavior of the artificial grain boundary is dominated by the critical current
of the grains. We show that the phi dependence of j_c in the suppressed region
is well described by a flux cutting model.
