  Millimeter-sized MnBi$_2$Te$_4$ single crystals are grown out of Bi-Te flux
and characterized by measuring magnetic and transport properties, scanning
tunneling microscope (STM) and spectroscopy (STS). The magnetic structure of
MnBi$_2$Te$_4$ below T$_N$ is determined by powder and single crystal neutron
diffraction measurements. Below T$_N$=24\,K, Mn$^{2+}$ moments order
ferromagnetically in the \textit{ab} plane but antiferromagnetically along the
crystallographic \textit{c} axis. The ordered moment is 4.04(13) $\mu_{B}$/Mn
at 10\,K and aligned along the crystallographic \textit{c}-axis. The electrical
resistivity drops upon cooling across T$_N$ or when going across the
metamagnetic transition in increasing fields below T$_N$. A critical scattering
effect was observed in the vicinity of T$_N$ in the temperature dependence of
thermal conductivity. However, A linear temperature dependence was observed for
thermopower in the temperature range 2K-300K without any anomaly around T$_N$.
These indicate that the magnetic order in Mn-Te layer has negligible effect on
the electronic band structure, which makes possible the realization of proposed
topological properties in MnBi$_2$Te$_4$ after fine tuning of the electronic
band structure.
