  Most near-term quantum information processing devices will not be capable of
implementing quantum error correction and the associated logical quantum gate
set. Instead, quantum circuits will be implemented directly using the physical
native gate set of the device. These native gates often have a parameterization
(e.g., rotation angles) which provide the ability to perform a continuous range
of operations. Verification of the correct operation of these gates across the
allowable range of parameters is important for gaining confidence in the
reliability of these devices. In this work, we demonstrate a procedure for
sample-efficient verification of continuously-parameterized quantum gates for
small quantum processors of up to approximately 10 qubits. This procedure
involves generating random sequences of randomly-parameterized layers of gates
chosen from the native gate set of the device, and then stochastically
compiling an approximate inverse to this sequence such that executing the full
sequence on the device should leave the system near its initial state. We show
that fidelity estimates made via this technique have a lower variance than
fidelity estimates made via cross-entropy benchmarking. This provides an
experimentally-relevant advantage in sample efficiency when estimating the
fidelity loss to some desired precision. We describe the experimental
realization of this technique using continuously-parameterized quantum gate
sets on a trapped-ion quantum processor from Sandia QSCOUT and a
superconducting quantum processor from IBM Q, and we demonstrate the sample
efficiency advantage of this technique both numerically and experimentally.
