  SIMNRA is widely adopted by the scientific community of ion beam analysis for
interpretation of nuclear scattering analysis. Taking advantage of its
recognized reliability and quality of the simulations, we developed a computer
program that use parallel sessions of SIMNRA to perform self-consistent
analysis for energy spectra of a given sample obtained using different
techniques or experimental setups. In this paper, we present a result using
MultiSIMNRA on self-consistent analysis for a multielemental thin film produced
by magnetron sputtering. The results demonstrate the potentialities of the
self-consistent analysis and its feasibility when using MultiSIMNRA.
