  This paper presents a novel method to identify and insert redundant logic
into a combinational circuit to improve its fault tolerance without having to
replicate the entire circuit as is the case with conventional redundancy
techniques. In this context, it is discussed how to estimate the fault masking
capability of a combinational circuit using the truth-cum-fault enumeration
table, and then it is shown how to identify the logic that can introduced to
add redundancy into the original circuit without affecting its native
functionality and with the aim of improving its fault tolerance though this
would involve some trade-off in the design metrics. However, care should be
taken while introducing redundant logic since redundant logic insertion may
give rise to new internal nodes and faults on those may impact the fault
tolerance of the resulting circuit. The combinational circuit that is
considered and its redundant counterparts are all implemented in semi-custom
design style using a 32/28nm CMOS digital cell library and their respective
design metrics and fault tolerances are compared.
