  Analyser-Based Phase-Contrast imaging (ABPCI) is a phase-contrast imaging
method that produces high contrast images of weakly absorbing materials.
However, it is only sensitive to phase variations lying in the diffraction
plane of the analyser crystal (i.e in one dimension; 1-D), as it is highly
sensitive to phase variations lying in the diffraction plane of the analyser
crystal. In order to accurately account for and measure phase effects produced
by the wavefield-sample interaction, ABPCI and other 1-D phase sensitive
methods must achieve 2-D phase sensitivity. We applied an inclined geometry
method to a Laue geometry setup for X-ray ABPCI through rotation of the
detector and object about the optical axis. This allowed this traditionally 1-D
phase sensitive phase contrast method to possess 2-D phase sensitivity. We
acquired tomographic datasets over 360 degrees of a multi-material phantom with
the detector and sample tilted by 8 degrees. The real and imaginary parts of
the refractive index were reconstructed for the phantom.
