  By using piezoelectric force microscopy and scanning Kelvin probe microscopy,
we have investigated the domain evolution and space charge distribution in
planar BiFeO3 capacitors with different electrodes. It is observed that charge
injection at the film/electrode interface leads to domain pinning and
polarization fatigue in BiFeO3. Furthermore, the Schottky barrier at the
interface is crucial for the charge injection process. Lowering the Schottky
barrier by using low work function metals as the electrodes can also improve
the fatigue property of the device, similar to what oxide electrodes can
achieve.
