  Electrical measurement of nano-scale devices and structures requires skills
and hardware to make nano-contacts. Such measurements have been difficult for
number of laboratories due to cost of probe station and nano-probes. In the
present work, we have demonstrated possibility of assembling low cost probe
station using USB microscope (US $ 30) coupled with in-house developed probe
station. We have explored the effect of shape of etching electrodes on the
geometry of the microprobes developed. The variation in the geometry of copper
wire electrode is observed to affect the probe length (0.58 mm to 2.15 mm) and
its half cone angle (1.4 to 8.8 degree). These developed probes were used to
make contact on micro patterned metal films and was used for electrical
measurement along with semiconductor parameter analyzer. These probes show low
contact resistance ( 4 ohm) and follows ohmic behavior. Such probes can be used
for laboratories involved in teaching and multidisciplinary research activities
and Atomic Force Microscopy.
