  We report the crystallographic texture of ZnO thin films comprising nanorods
grown by a microwave irradiation assisted method. Different substrates were
used, namely Si, Ge, metal coated Si, PMMA coated Si and ITO coated glass, to
examine the respective development of crystallographic texture. The films were
characterized by Xray diffraction and scanning electron microscopy, while the
texture analysis was done by Xray pole figure analysis using the Schultz
reflection method. The ZnO film deposited on Si and Ge showed a mixed texture.
On all the other substrates, c axis oriented ZnO films were obtained.
