  Dislocations - linear defects within the crystal lattice of, e.g., metals -
already have been directly observed and analyzed for nearly a century. While
experimental characterization methods can nowadays reconstruct
three-dimensional pictures of complex dislocation networks, simulation methods
are at the same time more and more able to predict the evolution of such
systems in great detail. Concise methods for analyzing and comparing
dislocation microstructure, however, are still lagging behind. We introduce a
universal microstructure "language" which could be used for direct comparisons
and detailed analysis of very different experimental and simulation methods.
