  Accessing intrinsic properties of a graphene device can be hindered by the
influence of contact electrodes. Here, we capacitively couple graphene devices
to superconducting resonant circuits and observe clear changes in the
resonance- frequency and -widths originating from the internal charge dynamics
of graphene. This allows us to extract the density of states and charge
relaxation resistance in graphene p-n junctions without the need of electrical
contacts. The presented characterizations pave a fast, sensitive and
non-invasive measurement of graphene nanocircuits.
