  Coherent X-ray diffraction microscopy is a method of imaging non-periodic
isolated objects at resolutions only limited, in principle, by the largest
scattering angles recorded. We demonstrate X-ray diffraction imaging with high
resolution in all three dimensions, as determined by a quantitative analysis of
the reconstructed volume images. These images are retrieved from the 3D
diffraction data using no a priori knowledge about the shape or composition of
the object, which has never before been demonstrated on a non-periodic object.
We also construct 2D images of thick objects with infinite depth of focus
(without loss of transverse spatial resolution). These methods can be used to
image biological and materials science samples at high resolution using X-ray
undulator radiation, and establishes the techniques to be used in
atomic-resolution ultrafast imaging at X-ray free-electron laser sources.
