  We report on the direct measurement of the electron-phonon relaxation time,
{\tau}eph, in disordered TiN films. Measured values of {\tau}eph are from 5.5
ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T-3
temperature dependence. The electronic density of states at the Fermi level N0
is estimated from measured material parameters. The presented results confirm
that thin TiN films are promising candidate-materials for ultrasensitive
superconducting detectors.
