  Due to a modification in the original magnetoscan setup, a significant
improvement in resolution was obtained. The paper focuses on experimental
results which should support the idea of the new setup using two magnets with
opposite direction of magnetization. This contribution to the characterization
techniques of melt-grown bulk superconductors should promote the easy
installation of this technique in industry. The improved magnetoscan technique
may further help to investigate growth-induced inhomogeneities of the
top-seeded-melt-growth process in the submillimeter range, and it offers new
possibilities to the characterization of smaller structures such as
superconducting films or coated conductors.
