  Understanding the exotic properties of quantum materials, including
high-temperature superconductors, remains a formidable challenge that demands
direct insights into electronic conductivity. Current methodologies either
capture a bulk average or near-atomically-resolved information, missing direct
measurements at the critical intermediate length scales. Here, using the
superconductor Fe(Se,Te) as a model system, we use low-temperature conductive
atomic force microscopy (cAFM) to bridge this gap. Contrary to the uniform
superconductivity anticipated from bulk assessments, cAFM uncovers micron-scale
conductive intrusions within a relatively insulating matrix. Subsequent
compositional mapping through atom probe tomography, shows that differences in
conductivity correlated with local changes in composition. cAFM, supported by
advanced microscopy and microanalysis, represents a methodological breakthrough
that can be used to navigate the intricate landscape of high-temperature
superconductors and the broader realm of quantum materials. Such fundamental
information is critical for theoretical understanding and future guided design.
