  This paper describes an integrated framework for SOC test automation. This
framework is based on a new approach for Wrapper/TAM co-optimization based on
rectangle packing considering the diagonal length of the rectangles to
emphasize on both TAM widths required by a core and its corresponding testing
time. In this paper, we propose an efficient algorithm to construct wrappers
that reduce testing time for cores. We then use rectangle packing to develop an
integrated scheduling algorithm that incorporates power constraints in the test
schedule. The test power consumption is important to consider since exceeding
the system's power limit might damage the system.
