  We have studied the interlayer coupling in the antiferromagnetic (AF) phase
of Sr and Zn doped La2CuO4 by analyzing the spin flip transition in the
magnetization curves. We find that the interlayer coupling strongly depends on
the mobility of the hole charge carriers. Samples with the same hole content as
well as the same Neel temperature but a different hole mobility, which we
adjusted by Zn co-doping, can have a very different interlayer coupling. Our
results suggest that only mobile holes can cause a strong frustration of the
interlayer coupling.
