  We measure the anomalous Hall effect (AHE) resistivity $\rho_{xy}$ in thin
films of the itinerant ferromagnet SrRuO$_{3}$. At low temperatures, the AHE
coefficient $R_{s}$ varies with $\rho_{xx}^2$, and at higher temperatures,
$R_{s}$ reaches a peak and then changes sign just below $T_{c}$. We find that
for all films studied $R_{s}$ scales with resistivity in the entire
ferromagnetic phase. We attribute the observed behavior to the contribution of
the extrinsic side jumps mechanism and the intrinsic Karplus-Luttinger (Berry
phase) mechanism including the effect of finite scattering rates.
