  Electron tomography is a technique used in both materials science and
structural biology to image features well below optical resolution limit. In
this work, we present a new algorithm for reconstructing the
three-dimensional(3D) electrostatic potential of a sample at atomic resolution
from phase contrast imaging using high-resolution transmission electron
microscopy. Our method accounts for dynamical and strong phase scattering,
providing more accurate results with much lower electron doses than those
current atomic electron tomography experiments. We test our algorithm using
simulated images of a synthetic needle geometry dataset composed of an
amorphous silicon dioxide shell around a silicon core. Our results show that,
for a wide range of experimental parameters, we can accurately determine both
atomic positions and species, and also identify vacancies even for light
elements such as silicon and disordered materials such as amorphous silicon
dioxide and also identify vacancies.
