  To better address the heating issue in stacks of intrinsic Josephson
junctions, we directly measure temperature of the stack by using a micron-sized
thermocouple which is in direct thermal- and electrical contact to the stack,
exactly in the place where the bias current is injected. Our measurements have
shown that the temperature of the stack can reach 200-300K at the highest bias.
Thus, we confirm experimentally that the Joule self-heating is a severe problem
in intrinsic-junction-spectroscopy experiments. The pseudogap features reported
in our previous paper (A.Yurgens etal, PRL 90, 147005 (2003)) are indeed an
artifact of Joule heating. The detailed measurements of the temperature of the
stacks at different ambient temperatures T0 allow us to deduce the unique,
"heating-free" I(V)-, or dI/dV(V) curves.
