  Ferroelectric domain walls have emerged as one of the most fascinating
objects in condensed matter physics due to the broad variability of functional
behaviors they exhibit. However, the vast majority of domain walls studies have
been focused on bias-induced dynamics and transport behaviors. Here, we
introduce the scanning probe microscopy approach based on piezoresponse force
microscopy (PFM) with a dynamically heated probe, combining local heating and
local biasing of the material. This approach is used to explore the thermal
polarization dynamics in soft Sn2P2S6 ferroelectrics, and allows for the
exploration of phase transitions at individual domain walls. The strong and
weak modulation regimes for the thermal PFM are introduced. The future
potential applications of heated probe approach for functional SPM measurements
including piezoelectric, elastic, microwave, and transport measurements are
discussed.
