  The emergence of memristor technologies brings new prospects for modern
electronics via enabling novel in-memory computing solutions and affordable and
scalable reconfigurable hardware implementations. Several competing memristor
technologies have been presented with each bearing distinct performance metrics
across multi-bit memory capacity, low-power operation, endurance, retention and
stability. Application needs however are constantly driving the push towards
higher performance, which necessitates the introduction of standard
characterisation protocols for fair benchmarking. At the same time,
opportunities for innovation are missed by focusing on excessively narrow
performance aspects. To that end our work presents a complete, technology
agnostic, characterisation methodology based on established techniques that are
adapted to memristors/RRAM characterisation needs. Our approach is designed to
extract information on all aspects of device behaviour, ranging from
deciphering underlying physical mechanisms to benchmarking across a variety of
electrical performance metrics that can in turn support the generation of
device models.
