  Large ultra-sensitive detector arrays are needed for present and future
observatories for far infra-red, submillimeter wave (THz), and millimeter wave
astronomy. With increasing array size, it is increasingly important to control
stray radiation inside the detector chips themselves, the surface wave. We
demonstrate this effect with focal plane arrays of 880 lens-antenna coupled
Microwave Kinetic Inductance Detectors (MKIDs). Presented here are near field
measurements of the MKID optical response versus the position on the array of a
reimaged optical source. We demonstrate that the optical response of a detector
in these arrays saturates off-pixel at the $\sim-30$ dB level compared to the
peak pixel response. The result is that the power detected from a point source
at the pixel position is almost identical to the stray response integrated over
the chip area. With such a contribution, it would be impossible to measure
extended sources, while the point source sensitivity is degraded due to an
increase of the stray loading. However, we show that by incorporating an
on-chip stray light absorber, the surface wave contribution is reduced by a
factor $>$10. With the on-chip stray light absorber the point source response
is close to simulations down to the $\sim-35$ dB level, the simulation based on
an ideal Gaussian illumination of the optics. In addition, as a crosscheck we
show that the extended source response of a single pixel in the array with the
absorbing grid is in agreement with the integral of the point source
measurements.
