  Suspended specimens of 2D crystals and their heterostructures are required
for a range of studies including transmission electron microscopy (TEM),
optical transmission experiments and nanomechanical testing. However,
investigating the properties of laterally small 2D crystal specimens, including
twisted bilayers and air sensitive materials, has been held back by the
difficulty of fabricating the necessary clean suspended samples. Here we
present a scalable solution which allows clean free-standing specimens to be
realized with 100% yield by dry-stamping atomically thin 2D stacks onto a
specially developed adhesion-enhanced support grid. Using this new capability,
we demonstrate atomic resolution imaging of defect structures in atomically
thin CrBr3, a novel magnetic material which degrades in ambient conditions.
