  We report measurements of the polar Kerr effect, proportional to the
out-of-plane component of the magnetization, in thin films of the magnetically
doped topological insulator
$(\text{Cr}_{0.12}\text{Bi}_{0.26}\text{Sb}_{0.62})_2\text{Te}_3$. Measurements
of the complex Kerr angle, $\Theta_K$, were performed as a function of photon
energy in the range $0.8\text{ eV}<\hbar\omega<3.0\text{ eV}$. We observed a
peak in the real part of $\Theta_K(\omega)$ and zero crossing in the imaginary
part that we attribute to resonant interaction with a spin-orbit avoided
crossing located $\approx$ 1.6 eV above the Fermi energy. The resonant
enhancement allows measurement of the temperature and magnetic field dependence
of $\Theta_K$ in the ultrathin film limit, $d\geq2$ quintuple layers. We find a
sharp transition to zero remanent magnetization at 6 K for $d<8$~QL, consistent
with theories of the dependence of impurity spin interactions on film thickness
and their location relative to topological insulator surfaces.
