  We compare the temperature dependence of resistivity \rho(T) of Si MOSFETs
with the recent theory by Zala et al. This comparison does not involve any
fitting parameters: the effective mass m* and g*-factor for mobile electrons
have been found independently. An anomalous increase of \rho with temperature,
which has been considered a signature of the "metallic" state, can be described
quantitatively by the interaction effects in the ballistic regime. The in-plane
magnetoresistance \rho(B) is qualitatively consistent with the theory; however,
the lack of quantitative agreement indicates that the magnetoresistance is more
susceptible to the sample-specific effects than \rho(T).
