  Single-pixel imaging, originally developed in light optics, facilitates fast
three-dimensional sample reconstruction, as well as probing with light
wavelengths undetectable by conventional multi-pixel detectors. However, the
spatial resolution of optics-based single-pixel microscopy is limited by
diffraction to hundreds of nanometers. Here, we propose an implementation of
single-pixel imaging relying on attainable modifications of currently available
ultrafast electron microscopes in which optically-modulated electrons are used
instead of photons to achieve sub-nanometer spatially- and temporally-resolved
single-pixel imaging. We simulate electron beam profiles generated by
interaction with the optical field produced by an externally programable
spatial light modulator and demonstrate the feasibility of the method by
showing that the sample image and its temporal evolution can be reconstructed
using realistic imperfect illumination patterns. Electron single-pixel imaging
holds strong potential for application in low-dose probing of beam-sensitive
biological and molecular samples, including rapid screening during in-situ
experiments.
