  We present a technique for measuring the transverse spatial properties of an
optical wavefront. Intensity and phase profiles are recovered by analysis of a
series of interference patterns produced by the combination of a scanning
X-shaped slit and a static horizontal slit; the spatial coherence may be found
from the same data. We demonstrate the technique by characterizing high
harmonic radiation generated in a gas cell, however the method could be
extended to a wide variety of light sources.
