  We present a novel approach to implement compressive sensing in laser
scanning microscopes (LSM), specifically in image scanning microscopy (ISM),
using a single-photon avalanche diode (SPAD) array detector. Our method
addresses two significant limitations in applying compressive sensing to LSM:
the time to compute the sampling matrix and the quality of reconstructed
images. We employ a fixed sampling strategy, skipping alternate rows and
columns during data acquisition, which reduces the number of points scanned by
a factor of four and eliminates the need to compute different sampling
matrices. By exploiting the parallel images generated by the SPAD array, we
improve the quality of the reconstructed compressive-ISM images compared to
standard compressive confocal LSM images. Our results demonstrate the
effectiveness of our approach in producing higher-quality images with reduced
data acquisition time and potential benefits in reducing photobleaching.
