  We measure the dynamic properties of $\text{Co}_{25}\text{Fe}_{75}$ thin
films grown by dc magnetron sputtering. Using ferromagnetic resonance
spectroscopy, we demonstrate an ultralow total damping parameter in the
out-of-plane configuration of < 0.0013, whereas for the in-plane configuration
we find a minimum total damping of < 0.0020. In both cases, we observe low
inhomogeneous linewidth broadening in macroscopic films. We observe a minimum
full-width half-maximum linewidth of 1 mT at 10 GHz resonance frequency for a
12 nm thick film. We characterize the morphology and structure of these films
as a function of seed layer combinations and find large variation of the
qualitative behavior of the in-plane linewidth vs. resonance frequency.
Finally, we use wavevector-dependent Brillouin light scattering spectroscopy to
characterize the spin-wave dispersion at wave vectors up to 23 $\mu
\text{m}^{-1}$.
