  Liquid xenon (LXe) based detectors for rare event searches in particle and
astroparticle physics are optimized for high xenon scintillation light
collection and low background rate from detector materials.
Polytetrafluoroethylene (PTFE, Teflon) is commonly used to encapsulate the
active LXe volume due to its high reflectance for VUV LXe scintillation light
with peak emission at 178 nm. Reflectance, transmission and number of
background signals arising from PTFE depend on the thickness of the PTFE
detector walls. In this work, we present VUV transmission measurements for PTFE
of various thicknesses often considered in the design phase of LXe detectors.
PTFE samples are measured in an apparatus previously used for reflectance
measurements in LXe using collimated light at a wavelength of 178 nm.
Measurements in vacuum as well as gaseous xenon are described by the Kubelka
and Munk model, as well as by Beer-Lambert's law for samples of $\geq
0.7\,\mathrm{mm}$ thickness, yielding a transmission coefficient of
$\lambda_\text{BL} = (0.89 \pm 0.05)\,\mathrm{mm}$. The PTFE wall thickness of
the XENONnT dark matter experiment was optimized by these measurements and
selected as $\geq 3\,\mathrm{mm}$.
