  Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating
to generate intensity fluctuations, and analyze their distortion by the sample
in order to retrieve attenuation, phase-contrast, and dark-field information.
Phase contrast yields an improved visibility of soft-tissue specimens, while
dark-field reveals small-angle scatter from sub-resolution structures. Both
have found many biomedical and engineering applications. The previously
developed Unified Modulated Pattern Analysis (UMPA) model extracts these
modalities from wavefront-marking data. We here present a new UMPA
implementation, capable of rapidly processing large datasets and featuring
capabilities to greatly extend the field of view. We also discuss possible
artifacts and additional new features.
