  We demonstrate a technique that allows highly surface sensitive imaging of
nanostructures on planar surfaces over large areas, providing a new avenue for
research in materials science, especially for \textit{in situ} applications.
The capabilities of hard X-ray grazing incidence ptychography combine aspects
from imaging, reflectometry and grazing incidence small angle scattering in
providing large field-of-view images with high resolution transverse to the
beam, horizontally and along the surface normal. Thus, it yields data with
resolutions approaching electron microscopy, in two dimensions, but over much
larger areas and with a poorer resolution in the third spatial dimension, along
the beam propagation direction. Similar to grazing incidence small angle X-ray
scattering, this technique facilitates the characterization of nanostructures
across statistically significant surface areas or volumes within potentially
feasible time frames for \textit{in situ} experiments, while also providing
spatial information.
