  Using polarized X-rays, we compare the electronic and magnetic properties of
a La(2/3)Sr(1/3)MnO(3)(LSMO)/SrTiO(3)(STO) and a modified
LSMO/LaMnO(3)(LMO)/STO interface. Using the technique of X-ray resonant
magnetic scattering (XRMS), we can probe the interfaces of complicated layered
structures and quantitatively model depth-dependent magnetic profiles as a
function of distance from the interface. Comparisons of the average electronic
and magnetic properties at the interface are made independently using X-ray
absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD). The
XAS and the XMCD demonstrate that the electronic and magnetic structure of the
LMO layer at the modified interface is qualitatively equivalent to the
underlying LSMO film. From the temperature dependence of the XMCD, it is found
that the near surface magnetization for both interfaces falls off faster than
the bulk. For all temperatures in the range of 50K - 300K, the magnetic
profiles for both systems always show a ferromagnetic component at the
interface with a significantly suppressed magnetization that evolves to the
bulk value over a length scale of ~1.6 - 2.4 nm. The LSMO/LMO/STO interface
shows a larger ferromagnetic (FM) moment than the LSMO/STO interface, however
the difference is only substantial at low temperature.
