  The phase immiscibility and the excellent matching between Ag(001) and
Fe(001) unit cells (mismatch 0.8 %) make Fe/Ag growth attractive in the field
of low dimensionality magnetic systems. Intermixing could be drastically
limited at deposition temperatures as low as 140-150 K. The film structural
evolution induced by post-growth annealing presents many interesting aspects
involving activated atomic exchange processes and affecting magnetic
properties. Previous experiments, of He and low energy ion scattering on films
deposited at 150 K, indicated the formation of a segregated Ag layer upon
annealing at 550 K. Higher temperatures led to the embedding of Fe into the Ag
matrix. In those experiments, information on sub-surface layers was attained by
techniques mainly sensitive to the topmost layer. Here, systematic PED
measurements, providing chemical selectivity and structural information for a
depth of several layers, have been accompanied with a few XRD rod scans,
yielding a better sensitivity to the buried interface and to the film long
range order. The results of this paper allow a comparison with recent models
enlightening the dissolution paths of an ultra thin metal film into a different
metal, when both subsurface migration of the deposit and phase separation
between substrate and deposit are favoured. The occurrence of a surfactant-like
stage, in which a single layer of Ag covers the Fe film is demonstrated for
films of 4-6 ML heated at 500-550 K. Evidence of a stage characterized by the
formation of two Ag capping layers is also reported. As the annealing
temperature was increased beyond 700 K, the surface layers closely resembled
the structure of bare Ag(001) with the residual presence of subsurface Fe
aggregates.
