  We observed that close to a Mott transition, over a small temperature range,
the predominance of slow relaxations leads to decoupling of electrons from the
thermal bath. This has been established by observation of large deviation of
the thermal noise in the films of Mott system $NdNiO_{3}$ from the canonical
Johnson-Nyquist value of $4k_{B}TR$ close to the transition. It is suggested
that such a large noise arise from small isolated pockets of nanometric
metallic phases (estimated size $\sim$ 15-20 nm) within the insulating phase
with the charging energy as the control parameter.
