  Constructive theory of characterization test is considered. The theory is
applicable to a nano devices characterization: current-voltage, Auger current
dependence. Generally small response of device under test on an applied
stimulus is masked by an unknown deterministic background and a random noise.
Characterization test in this signal corruption scenario should be based on
correlation measurement technique of device response on applied optimal
stimulus with optimal reference signal. Co-synthesis solution of stimulus and
reference signal is proposed.
