  We report on a resonant soft X-ray spectroscopy study of the electronic and
magnetic structure of the cuprate-manganite interface. Polarized X-ray
spectroscopy measurements taken at the Cu L edge reveal up to a five-fold
increase in the dichroic signal as compared to past experimental and
theoretical values. Furthermore an increase in the degree of interlayer charge
transfer up to 0.25e (where e is charge of an electron) per copper ion is
observed leading to a profound reconstruction in the orbital scheme for these
interfacial copper ions. It is inferred that these enhancement are related to
an increase in TMI observed for manganite layers grown with rapidly modulated
flux.
