  In a previous paper (Avotina et al.,Phys. Rev. B Vol.71, 115430 (2005)) we
have shown that in principle it is possible to image the defect positions below
a metal surface by means of a scanning tunnelling microscope. The principle
relies on the interference of electron waves scattered on the defects, which
give rise to small but measurable conductance fluctuations. Whereas in that
work the band structure was assumed to be free-electron like, here we
investigate the effects of Fermi surface anisotropy. We demonstrate that the
amplitude and period of the conductance oscillations are determined by the
local geometry of the Fermi surface. The signal results from those points for
which the electron velocity is directed along the vector connecting the point
contact to the defect. For a general Fermi surface geometry the position of the
maximum amplitude of the conductance oscillations is not found for the tip
directly above the defect. We have determined optimal conditions for
determination of defect positions in metals with closed and open Fermi
surfaces.
