  Raman spectroscopy is widely used to assess the quality of 2D materials thin
films. This report focuses on $\rm{PtSe_2}$, a noble transition metal
dichalcogenide which has the remarkable property to transit from a
semi-conductor to a semi-metal with increasing layer number. While
polycrystalline $\rm{PtSe_2}$ can be grown with various crystalline qualities,
getting insight into the monocrystalline intrinsic properties remains
challenging. We report on the study of exfoliated 1 to 10 layers $\rm{PtSe_2}$
by Raman spectroscopy, featuring record linewidth. The clear Raman signatures
allow layer-thickness identification and provides a reference metrics to assess
crystal quality of grown films.
