  The electric field-dependence of structural dynamics in a tetragonal
ferroelectric lead zirconate titanate thin film is investigated under
sub-coercive and above-coercive fields using time-resolved X-ray diffraction.
During the application of an external field to the pre-poled thin film
capacitor, structural signatures of domain nucleation and growth include
broadening of the in-plane peak width of a Bragg reflection concomitant with a
decrease of the peak intensity. This disordered domain state is remanent and
can be erased with an appropriate voltage pulse sequence.
