  Neuromorphic computing refers to brain-inspired computers, that differentiate
it from von Neumann architecture. Analog VLSI based neuromorphic circuits is a
current research interest. Two simpler spiking integrate and fire neuron model
namely axon-Hillock (AH) and voltage integrate, and fire (VIF) circuits are
commonly used for generating spike events. This paper discusses the impact of
reliability issues like Bias Temperature instability (BTI) and Hot Carrier
Injection (HCI), and timezero variability on these CMOS based neuromorphic
circuits. AH and VIF circuits are implemented using HKMG based 45nm technology.
For reliability analysis, industry standard Cadence RelXpert tool is used. For
time-zero variability analysis, 1000 Monte-Carlo simulations are performed.
