  In the present work, the microcrystalline characteristics of KBr thin films
have been investigated by evaluating the breadth of diffraction peak. The
Williamson-Hall, the Size-Strain Plot and the single line Voigt methods are
employed to deconvolute the finite crystallite size and microstrain
contribution from the broaden X-ray profile. The texture coefficient and
dislocation density have been determined along each diffraction peak. Other
relevant physical parameters such as stress, Young's modulus and energy density
are also estimated using Uniform Stress-Deformation and Uniform Deformation
Energy Density approximation of Williamson-Hall method.
