  X-ray production differential cross sections induced by C and Si ions with
energies from 1 MeV/u down to 0.25 MeV/u, produced by the CMAM 5 MV tandem
accelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Ta
in a direct way. X-rays have been detected by a fully characterized silicon
drift diode and beam currents have been measured by a system of two Faraday
cups. Measured cross sections agree in general with previously published
results. The ECPSSR theory with the united atoms correction gives absolute
values close to the experimental ones for all the studied elements excited by C
ions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si,
the basic ECPSSR theory gives better agreement, although on absolute values the
gap for Ti is still large.
