  In this paper we show how single layer graphene can be utilized to study
swift heavy ion (SHI) modifications on various substrates. The samples were
prepared by mechanical exfoliation of bulk graphite onto SrTiO$_3$, NaCl and
Si(111), respectively. SHI irradiations were performed under glancing angles of
incidence and the samples were analysed by means of atomic force microscopy in
ambient conditions. We show that graphene can be used to check whether the
irradiation was successful or not, to determine the nominal ion fluence and to
locally mark SHI impacts. In case of samples prepared in situ, graphene is
shown to be able to catch material which would otherwise escape from the
surface.
