  The recent rapid development of deep learning has laid a milestone in
industrial Image Anomaly Detection (IAD). In this paper, we provide a
comprehensive review of deep learning-based image anomaly detection techniques,
from the perspectives of neural network architectures, levels of supervision,
loss functions, metrics and datasets. In addition, we extract the new setting
from industrial manufacturing and review the current IAD approaches under our
proposed our new setting. Moreover, we highlight several opening challenges for
image anomaly detection. The merits and downsides of representative network
architectures under varying supervision are discussed. Finally, we summarize
the research findings and point out future research directions. More resources
are available at
https://github.com/M-3LAB/awesome-industrial-anomaly-detection.
