  We study the resistance fluctuation distribution of a thin film near
electrical breakdown. The film is modeled as a stationary resistor networkunder
biased percolation. Depending on the value of the external current,on the
system sizes and on the level of internal disorder, the fluctuation
distribution can exhibit a non-Gaussian behavior. We analyze this
non-Gaussianity in terms of the generalized Gumbel distribution recently
introduced in the context of highly correlated systems near criticality. We
find that when the average fraction of defects approaches the random
percolation threshold, the resistance fluctuation distribution is well
described by the universal behavior of the Bramwell-Holdsworth-Pinton
distribution.
