  Hexagonal boron nitride (hBN) regains interest as a strategic component in
graphene engineering and in van der Waals heterostructures built with two
dimensional materials. It is crucial then, to handle reliable characterization
techniques capable to assess the quality of structural and electronic
properties of the hBN material used. We present here characterization
procedures based on optical spectroscopies, namely cathodoluminescence and
Raman, with the additional support of structural analysis conducted by
transmission electron microscopy. We show the capability of optical
spectroscopies to investigate and benchmark the optical and structural
properties of various hBN thin layers sources.
