  We present an alternative switching-magnetization magnetic force microscopy
(SM- MFM) method using planar tip-on-chip probes. Unlike traditional
needle-like tips, the planar probe approach integrates a microdevice near the
tip apex with dedicated functionality. Its 1 mm x 1 mm planar surface paves the
way for freedom in ultra thin-film engineering and micro-/nano-tailoring for
application-oriented tip functionalization. Here, we form a microscale current
pathway near the tip end to control tip magnetisation. The chip like probe or
planar probe, was applied to study the complex magnetic behaviour of epitaxial
transition metal oxide perovskite LaMnO3, which was previously shown to behave
as complex material with domains associated with superpara-, antiferro- and
ferromagnetism. To this end we successfully imaged an inhomogeneous
distribution of weak ferromagnetic islands with a resolution better than 10 nm.
