  We propose a novel approach for precision measurement utilizing an ensemble
of probabilistic bits (p-bits). This method leverages the inherent fluctuations
of p-bits to achieve high sensitivity in various applications, including
magnetic field sensing, temperature monitoring and timekeeping. The sensitivity
scales proportionally to the square root of the total number of p-bits,
enabling unprecedented accuracy with large ensembles. Furthermore, the
robustness of this method against device imperfections and non-uniformity
enhances its practicality and scalability. This work paves the way for a new
paradigm in precision measurement, offering a cost-effective and versatile
alternative to traditional methods.
