  We have used soft X-ray Resonant Magnetic Scattering (XRMS) to search for the
presence of an effective ferromagnetic moment belonging to the
antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F)
layer. Taking advantage of the element specificity of the XRMS technique, we
have measured hysteresis loops of both Fe and CoO layers of a CoO(40
\AA)/Fe(150 \AA) exchange bias bilayer. From these measurements we have
concluded that the proximity of the F layer induces a magnetic moment in the AF
layer. The F moment of the AF layer has two components: one is frozen and does
not follow the applied magnetic field and the other one follows in phase the
ferromagnetic magnetization of the F layer. The temperature dependence of the F
components belonging to the AF layer is shown and discussed.
