  We investigate the influence of clock frequency on the success rate of a
fault injection attack. In particular, we examine the success rate of voltage
and electromagnetic fault attacks for varying clock frequencies. Using three
different tests that cover different components of a System-on-Chip, we perform
fault injection while its CPU operates at different clock frequencies. Our
results show that the attack's success rate increases with an increase in clock
frequency for both voltage and EM fault injection attacks. As the technology
advances push the clock frequency further, these results can help assess the
impact of fault injection attacks more accurately and develop appropriate
countermeasures to address them.
