  Atomic-resolution cryogenic scanning transmission electron microscopy
(cryo-STEM) has provided a path to probing the microscopic nature of select
low-temperature phases in quantum materials. Expanding cryo-STEM techniques to
broadly tunable temperatures will give access to the rich temperature-dependent
phase diagrams of these materials. With existing cryo-holders, however,
variations in sample temperature significantly disrupt the thermal equilibrium
of the system, resulting in large-scale sample drift. The ability to tune
temperature without negatively impacting the overall instrument stability is
crucial, particularly for high-resolution experiments. Here, we test a new
side-entry continuously variable temperature dual-tilt cryo-holder which
integrates liquid nitrogen cooling with a 6-pin MEMS sample heater to overcome
some of these experimental challenges. We measure consistently low drift rates
of 0.3-0.4 Angstrom/s and demonstrate atomic-resolution cryo-STEM imaging
across a continuously variable temperature range from ~100 K to well above room
temperature. We conduct additional drift stability measurements across several
commercial sample stages and discuss implications for further developments of
ultra-stable, flexible cryo-stages.
