  We demonstrate a new scheme of spectromicroscopy in the extreme ultraviolet
(EUV) spectral range, where the spectral response of the sample at different
wavelengths is imaged simultaneously. It is enabled by applying ptychographical
information multiplexing (PIM) to a tabletop EUV source based on high harmonic
generation, where four spectrally narrow harmonics near 30 nm form a spectral
comb structure. Extending PIM from previously demonstrated visible wavelengths
to the EUV/X-ray wavelengths promises much higher spatial resolution and more
powerful spectral contrast mechanism, making PIM an attractive
spectromicroscopy method in both the microscopy and the spectroscopy aspects.
Besides the sample, the multicolor EUV beam is also imaged in situ, making our
method a powerful beam characterization technique. No hardware is used to
separate or narrow down the wavelengths, leading to efficient use of the EUV
radiation.
