  This paper reports the development of a methodology combining microstrip
ferromagnetic resonance (MS-FMR) and digital image correlation (DIC) in order
to silmuteanously measure the voltage-induced strains and the magnetic
resonance in artificial magnetoelectric heterostructures (magnetic
films/piezoelectric substrate? or magnetic films/flexible
substrate/piezoelectric actuator ?). The overall principle of the technique and
the related analytical modelling are described. It is powerful to estimate the
magnetostriction coefficient of ferromagnetic thin films and can be used to
determine the effective magnetoelectric coefficient of the whole
heterostructures in addition to the piezoelectric coefficient related to the
in-plane voltage-induced strains. This methodology can be applied to system for
which the strains are well transmitted at the different interfaces.
