  Dynamic thin film interferometry is a technique used to non-invasively
characterize the thickness of thin liquid films. Recovering the underlying
thickness from the captured interferograms, unconditionally and automatically
is still an open problem. Here we report a compact setup employing a snapshot
hyperspectral camera and the related algorithms for the automated determination
of thickness profiles of dynamic thin liquid films. The proposed technique is
shown to recover film thickness profiles to within 100 nm of accuracy as
compared to those profiles reconstructed through the manual color matching
process. Subsequently, we discuss the characteristics and advantages of
hyperspectral interferometry including the increased robustness against
imagining noise as well as the ability to perform thickness reconstruction
without considering the absolute light intensity information.
