  We have investigated recrystallization of amorphous Yttrium Iron Garnet (YIG)
by annealing in oxygen atmosphere. Our findings show that well below the
melting temperature the material transforms into a fully epitaxial layer with
exceptional quality, both structural and magnetic.\\ In ferromagnetic resonance
(FMR) ultra low damping and extremely narrow linewidth can be observed. For a
56 nm thick layer a damping constant of
$\alpha$=(6.63$\pm$1.50)$\cdot$10$^{-5}$ is found and the linewidth at 9.6 GHz
is as small as 1.30$\pm$0.05 Oe which are the lowest values for PLD grown thin
films reported so far. Even for a 20 nm thick layer a damping constant of
$\alpha$=(7.51$\pm$1.40)$\cdot$10$^{-5}$ is found which is the lowest value for
ultrathin films published so far. The FMR linewidth in this case is
3.49$\pm$0.10 Oe at 9.6 GHz. Our results not only present a method of
depositing thin film YIG of unprecedented quality but also open up new options
for the fabrication of thin film complex oxides or even other crystalline
materials.
