  We have developed a wedge-loaded double-cantilever beam adhesion measurement
set-up for thin films deposited on glass by sputtering. The test is described
in details. Results on the Glass/sublayer/Ag/ZnO multilayer provide evidence
that \SnOd or \TiOd perform better than ZnO as a sublayer. Then however,
rupture within the multilayer shifts to the upper Ag/ZnO interface. The latter
is shown to be tougher than the lower ZnO/Ag interface, an asymmetry due to
non-equilibrium interfacial structures.
