  We performed near-edge x-ray absorption spectroscopy (XANES) at V K edge in
the antiferromagnetic insulating (AFI) phase of a 2.8% Cr-doped V_2O_3 single
crystal. Linear dichroism of several percent is measured in the hexagonal plane
and found to be in good agreement with ab-initio calculations based on multiple
scattering theory. This experiment definitively proves the structural origin of
the signal and therefore solves a controversy raised by previous
interpretations of the same dichroism as non-reciprocal. It also calls for a
further investigation of the role of the magnetoelectric annealing procedure in
cooling to the AFI phase.
