  We present a simple technique which uses a self-aligned oxide etch to suspend
individual single-wall carbon nanotubes between metallic electrodes. This
enables one to compare the properties of a particular nanotube before and after
suspension, as well as to study transport in suspended tubes. As an example of
the utility of the technique, we study quantum dots in suspended tubes, finding
that their capacitances are reduced owing to the removal of the dielectric
substrate.
