  We discuss basics of scanning tunneling microscopy and spectroscopy (STM/S)
of the superconducting state with normal and superconducting tips. We present a
new method to measure the local variations in the Andreev reflection amplitude
between a superconducting tip and the sample. This method is termed Scanning
Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging
with STM/S under an applied current through the sample, and show the vortex
lattice as a function of the angle between the magnetic field and sample's
surface.
