  Solid-state quantum emitters have emerged as a leading quantum memory for
quantum networking applications. However, standard optical characterization
techniques are neither efficient nor repeatable at scale. In this work, we
introduce and demonstrate spectroscopic techniques that enable large-scale,
automated characterization of color centers. We first demonstrate the ability
to track color centers by registering them to a fabricated machine-readable
global coordinate system, enabling systematic comparison of the same color
center sites over many experiments. We then implement resonant
photoluminescence excitation in a widefield cryogenic microscope to parallelize
resonant spectroscopy, achieving two orders of magnitude speed-up over confocal
microscopy. Finally, we demonstrate automated chip-scale characterization of
color centers and devices at room temperature, imaging thousands of microscope
fields of view. These tools will enable accelerated identification of useful
quantum emitters at chip-scale, enabling advances in scaling up color center
platforms for quantum information applications, materials science, and device
design and characterization.
