  High-resolution dynamic X-ray detector is crucial for time-resolved digital
radiography (DR) imaging and fast 3D medical computed tomography (CT) imaging.
Recently, perovskites have become promising alternatives to conventional
semi-conductor materials, e.g., Si, a-Se and CdTe, for direct X-ray detection.
However, the feasibility of their combination with high-speed pixelated
complementary metal-oxide-semiconductor (CMOS) arrays remains unknown. This
work originally reports an innovative direct-conversion X-ray detector
fabricated with 300 micrometer thick inorganic perovskite film printed on a
tailored CMOS array. In-house measurements demonstrate that the CsPbBr3 film
has excellent optoelectric properties of an electron mobility-lifetime product
of 3.40x10$^{-5}$ cm$^2$ V$^{-1}$, and the X-ray detector exhibits high
sensitivity of 9341uC Gy$_{\rm air}^{-1}$ cm$^{-2}$, and low detection limit of
588 nGy$_{\rm air}^{-1}$. This CMOS X-ray imaging detector achieves a high
spatial resolution up to 5.5 lp/mm (close to the resolution limit of 6.0
lp/mm), and >300 frame per second (fps) readout speed. DR image of a resolution
pattern phantom and a anesthesia mice, CT images of a biological specimen are
acquired for the first time.
