  We present the development of a versatile apparatus for a 6.2 eV laser-based
time and angle-resolved photoemission spectroscopy with micrometer spatial
resolution (time-resolved $\mu$-ARPES). With a combination of tunable spatial
resolution down to $\sim$11 $\mu$m, high energy resolution ($\sim$11 meV),
near-transform-limited temporal resolution ($\sim$280 fs), and tunable 1.55 eV
pump fluence up to $\sim$3 mJ/cm$^2$, this time-resolved $\mu$-ARPES system
enables the measurement of ultrafast electron dynamics in exfoliated and
inhomogeneous materials. We demonstrate the performance of our system by
correlating the spectral broadening of the topological surface state of
Bi$_2$Se$_3$ with the spatial dimension of the probe pulse, as well as
resolving the spatial inhomogeneity contribution to the observed spectral
broadening. Finally, after in-situ exfoliation, we performed time-resolved
$\mu$-ARPES on a $\sim$30 $\mu$m few-layer-thick flake of transition metal
dichalcogenide WTe$_2$, thus demonstrating the ability to access ultrafast
electron dynamics with momentum resolution on micro-exfoliated and twisted
materials.
