  We report on a technically simple approach to achieve high-resolution and
high-sensitivity Fourier-domain OCT imaging in the mid-infrared range. The
proposed OCT system employs an InF3 supercontinuum source. A specially designed
dispersive scanning spectrometer based on a single InAsSb point detector is
employed for detection. The spectrometer enables structural OCT imaging in the
spectral range from 3140 nm to 4190 nm with a characteristic sensitivity of
over 80 dB and an axial resolution below 8 um. The capabilities of the system
are demonstrated for imaging of porous ceramic samples and transition-stage
green parts fabricated using an emerging method of lithography-based ceramic
manufacturing. Additionally, we demonstrate the performance and flexibility of
the system by OCT imaging using an inexpensive low-power (average power of 16
mW above 3 um wavelength) mid-IR supercontinuum source.
