  The aim of this paper is the modeling and simulation of impact of space
radiation variability on total dose and single event effects in spaceborne
electronics. It has been shown that the simultaneous thermal annealing may lead
to non-stationary relaxation after dose-rate peaks. Significant enhancement of
soft error rate during solar flares in the memories mitigated by the scrubbing
due to non-linear dependence on particle flux has been revealed.
