  This paper is focused on survival analysis of electrical components. The main
goal of this paper is to develop a method for on-line estimation of the Mean
Time To Failure (MTTF) of electrical components under dynamic stress levels.
The proposed method models the variations of the stress levels as a stochastic
process. Hence, a stochastic failure rate function can be developed for each
electrical component. Later, this function is used as the underlying rate of a
doubly stochastic Poisson process (known as Cox processes). Furthermore, this
Cox process is used for on-line estimation of the Mean Residual Life (MRL)
using the observed stress levels. The proposed method provides a good estimate
of the age and life expectancy of each component. An experimental case study is
provided to demonstrate the proposed method.
