  In recent years, there has been a mounting interest in better methods of
measuring nanoscale objects, especially in fields such as nanotechnology,
biomedicine, cleantech, and microelectronics. Conventional methods have proved
insufficient, due to the classical diffraction limit or slow and complicated
measuring procedures. The purpose of this paper is to explore the special
characteristics of singular beams with respect to the investigation of
subwavelength objects. Singular beams are light beams that contain one or more
singularities in their physical parameters, such as phase or polarization. We
focus on the three-dimensional interaction between electromagnetic waves and
subwavelength objects to extract information about the object from the
scattered light patterns.
