  The magnetic properties of rare earth compounds are usually well captured by
assuming a fully localized f shell and only considering the Hund's rule ground
state multiplet split by a crystal electrical field (CEF). Currently, the
standard technique for probing CEF excitations in lanthanides is inelastic
neutron scattering. Here we show that with the recent leap in energy
resolution, resonant inelastic soft X-ray scattering has become a serious
alternative for looking at CEF excitations with some distinct advantages
compared to INS. As an example we study the CEF scheme in CeRh2Si2, a system
that has been intensely studied for more than two decades now but for which no
consensus has been reached yet as to its CEF scheme. We used two new features
that have only become available very recently in RIXS, high energy resolution
of about 30 meV as well as polarization analysis in the scattered beam, to find
a unique CEF description for CeRh2Si2. The result agrees well with previous INS
and magnetic susceptibility measurements. Due to its strong resonant character,
RIXS is applicable to very small samples, presents very high cross sections for
all lanthanides, and further benefits from the very weak coupling to phonon
excitation. The rapid progress in energy resolution of RIXS spectrometers is
making this technique increasingly attractive for the investigation of the CEF
scheme in lanthanides.
