  We report the growth of thickness-controlled rotationally faulted multilayer
graphene (rf-MLG) on Ni foils by low-pressure chemical vapor deposition and
their characterization by micro-Raman spectroscopy. The surface morphology and
thickness were investigated by scanning electron microscope, X-ray diffraction,
and transmittance measurements. These results have revealed that the thickness
of rf-MLG can be effectively controlled by the thickness of the Ni foil rather
than the flow rate of CH$_4$, H$_2$, Ar. In the Raman spectroscopy
measurements, we observed most Raman peaks of the graphitic materials. Raman
spectra can be categorized into four patterns and show systematic behaviors.
Especially, the in-plane (~1880 cm$^{-1}$, ~2035 cm$^{-1}$) and out-of-plane
(~1750 cm$^{-1}$) modes are successfully analyzed to explain the dimensionality
of rf-MLG as in the twisted (or rotated) bilayer graphene. In addition, it is
found that the two peaks at ~1230 cm$^{-1}$ and ~2220 cm$^{-1}$ well reflect
the properties of the in-plane mode. The peak intensities of the above four
in-plane modes are proportional to that of 2D band, indicating that they share
the common Raman resonance process.
