  Magnetotransport measurements on small single crystals of Cr, the elemental
antiferromagnet, reveal the hysteretic thermodynamics of the domain structure.
The temperature dependence of the transport coefficients is directly correlated
with the real-space evolution of the domain configuration as recorded by x-ray
microprobe imaging, revealing the effect of antiferromagnetic domain walls on
electron transport. A single antiferromagnetic domain wall interface resistance
is deduced to be of order $5\times10^{-5}\mathrm{\mu\Omega\cdot cm^{2}}$ at a
temperature of 100 K.
