  Resonant (elastic) soft x-ray scattering (RSXS) offers a unique element,
site, and valence specific probe to study spatial modulations of charge, spin,
and orbital degrees of freedom in solids on the nanoscopic length scale. It
cannot only be used to investigate single crystalline materials. This method
also enables to examine electronic ordering phenomena in thin films and to zoom
into electronic properties emerging at buried interfaces in artificial
heterostructures. During the last 20 years, this technique, which combines
x-ray scattering with x-ray absorption spectroscopy, has developed into a
powerful probe to study electronic ordering phenomena in complex materials and
furthermore delivers important information on the electronic structure of
condensed matter. This review provides an introduction to the technique, covers
the progress in experimental equipment, and gives a survey on recent RSXS
studies of ordering in correlated electron systems and at interfaces.
