  In this work we describe an experimental setup for spatially-resolved
pump-probe experiment with integrated wide-field magneto-optical (MO)
microscope. The MO microscope can be used to study ferromagnetic materials with
both perpendicular-to-plane and in-plane magnetic anisotropy via polar Kerr and
Voigt effects, respectively. The functionality of the Voigt effect-based
microscope was tested using an in-plane magnetized ferromagnetic semiconductor
(Ga,Mn)As. It was revealed that the presence of mechanical defects in the
(Ga,Mn)As epilayer alters significantly the magnetic anisotropy in their
proximity. The importance of MO experiments with simultaneous temporal and
spatial resolutions was demonstrated using (Ga,Mn)As sample attached to a
piezoelectric actuator, which produces a voltage-controlled strain. We observed
a considerably different behavior in different parts of the sample that enabled
us to identify sample parts where the epilayer magnetic anisotropy was
significantly modified by a presence of the piezostressor and where it was not.
Finally, we discuss the possible applicability of our experimental setup for
the research of compensated antiferromagnets, where only MO effects even in
magnetic moments are present.
