  We present a straightforward method to realize non-planar dielectric
structures with a controlled height profile for use in calibration of
fluorophores. Calibration of fluorescence quantum efficiency and intrinsic
radiative and nonradiative decay rates of emitters is possible by using changes
in the local density of optical states, provided one can control the
emitter-surface distance with nanometer accuracy. We realize a method that is
accurate yet fast to implement. We fabricate PMMA wedges (4 mm x 4 mm x 2 \mu
m) by gray-tone UV-lithography of Shipley S1813G2. Its applicability as
dielectric spacer is demonstrated in Drexhage experiments for three different
emitters in the visible and near-infrared wavelength regime. The decay-rate
dependence of the fluorescent state of emitters on the distance to a silver
mirror is observed and compared to calculations based on the local density of
states. Quantitative values for (non)radiative decay rates and quantum
efficiencies are extracted. Furthermore, we discuss how Drexhage experiments
can help to scrutinize the validity of effective material parameters of
metamaterials in the near field regime.
