  We present a structural analysis of the multi-layer graphene-4HSiC(000-1})
system using Surface X-Ray Reflectivity. We show for the first time that
graphene films grown on the C-terminated (000-1}) surface have a
graphene-substrate bond length that is very short (0.162nm). The measured
distance rules out a weak Van der Waals interaction to the substrate and
instead indicates a strong bond between the first graphene layer and the bulk
as predicted by ab-initio calculations. The measurements also indicate that
multi-layer graphene grows in a near turbostratic mode on this surface. This
result may explain the lack of a broken graphene symmetry inferred from
conduction measurements on this system [C. Berger et al., Science 312, 1191
(2006)].
