  With dark firld x-ray microscopy, it is possible to measure reciprocal space
manps of localized volumes embedded deeply in a large sample. Ferroelastic
materials contains elastic twins that display characteristing splitting of
diffraction peaks. We show how to utilize established methods for analysing
reciprocal space maps of elastically twinned materials to the analysis of
dark-field x-ray microscopy data to detemin the exact kind of domain wall
present in each probed volume, even when the domains are not spatially
resolved.
