  Physical side-channel attacks represent a great challenge for today's chip
design. Although attacks on CMOS dynamic power represent a class of
state-of-the-art attacks, many other effects potentially affect the security of
CMOS chips analogously by affecting mostly static behaviour of the chip,
including aging, ionizing radiation, or non-ionizing illumination of the CMOS.
Vulnerabilities exploiting data dependency in CMOS static power were already
demonstrated in practice and the analogous vulnerability exploiting
light-modulated static power was demonstrated by simulation. This work confirms
the CMOS vulnerability related to the light-modulated data-dependent static
power experimentally and discusses future work.
