  We report our design, development, installation and troubleshooting of an
open source Gnome X Scanning Microscopy (GXSM) software package for controlling
and processing of modern Scanning Probe Microscopy (SPM) system as a
development tool of Nanotechnology. GXSM is a full featured analysis tool for
the characterization of nanomaterials with different controlling tools like
Atomic Force Microscopy (AFM), Scanning Tunneling Spectroscopy (STS), scanning
tunneling microscopy (STM), Nanoindentation and etc.,. This developed package
tool consists of Digital Signal Processing (DSP) and image processing system of
SPM. A digital signal processor (DSP) subsystem runs the feedback loop,
generates the scanning signals and acquires the data during SPM measurements.
With installed SR-Hwl plug-in this developed package was tested in no hardware
mode.
