  We demonstrate that the highly sensitive phase-contrast properties of Bragg
coherent diffraction measurements combined with the translational diversity of
ptychography can provide a Bragg "dark field" imaging method capable of
revealing the finger print of domain structure in metallic thin films.
Experimental diffraction data was taken from a epitaxially grown niobium
metallic thin film on sapphire; and analysed with the help of a careful
combination of implemented refinement mechanisms.
