  It is shown that for thin metallic films thickness of which does not exceed
thickness of skin layer, the problem allows analytical solution. In the field
of resonant frequencies the analysis of dependence of coefficients of
transmission, reflection and absorbtion on an electromagnetic wave is carried
out. Dependence on pitch angle, thickness of the layer and coefficient of
specular reflection and on effective electron collision frequency is carried
out. The formula for contactless determination (calculation) of a thickness of
a film by observable resonant frequencies is deduced.
