  To achieve quantitative interpretation of Piezoresponse Force Microscopy
(PFM), including resolution limits, tip bias- and strain-induced phenomena and
spectroscopy, analytical representations for tip-induced electroelastic fields
inside the material are derived for the cases of weak and strong indentation.
In the weak indentation case, electrostatic field distribution is calculated
using image charge model. In the strong indentation case, the solution of the
coupled electroelastic problem for piezoelectric indentation is used to obtain
the electric field and strain distribution in the ferroelectric material. This
establishes a complete continuum mechanics description of the PFM contact
mechanics and imaging mechanism. The electroelastic field distribution allows
signal generation volume in PFM to be determined. These rigorous solutions are
compared with the electrostatic point charge and sphere-plane models, and the
applicability limits for asymptotic point charge and point force models are
established. The implications of these results for ferroelectric polarization
switching processes are analyzed.
