  Several sources of noise limit the sensitivity of current gravitational wave
detectors. Currently, dominant noise sources include quantum noise and thermal
Brownian noise, but future detectors will also be limited by other thermal
noise channels. In this paper we study a thermal noise source which is caused
by spatial charge carrier density variations in semiconductor materials. We
provide an analytical model for the understanding of charge carrier
fluctuations under the presence of screening effects and show that charge
carrier noise will not be a limiting noise source for third generation
gravitational wave detectors.
