  We show how a new quantum property, a geometric phase, associated with
scattering states can be exhibited in nanoscale electronic devices. We propose
an experiment to use interference to directly measure the effect of the new
geometric phase. The setup involves a double path interferometer, adapted from
that used to measure the phase evolution of electrons as they traverse a
quantum dot (QD). Gate voltages on the QD could be varied cyclically and
adiabatically, in a manner similar to that used to observe quantum adiabatic
charge pumping. The interference due to the geometric phase results in
oscillations in the current collected in the drain when a small bias across the
device is applied. We illustrate the effect with examples of geometric phases
resulting from both Abelian and non-Abelian gauge potentials.
