  This work proposes the application of fractal descriptors to the analysis of
nanoscale materials under different experimental conditions. We obtain
descriptors for images from the sample applying a multiscale transform to the
calculation of fractal dimension of a surface map of such image. Particularly,
we have used the}Bouligand-Minkowski fractal dimension. We applied these
descriptors to discriminate between two titanium oxide films prepared under
different experimental conditions. Results demonstrate the discrimination power
of proposed descriptors in such kind of application.
