  In a previous paper, we reviewed theoretically some of the available
processing schemes for X-ray wavefront sensing based on random modulation. We
here show experimental applications of the technique for characterising both
refractive and reflective optical components. These fast and accurate X-ray
at-wavelength metrology methods can assist the manufacture of X-ray optics that
transport X-ray beams with minimum amount of wavefront distortion. We also
recall how such methods can facilitate online optimization of active optics.
