  Detecting electronic hot spots is important for understanding the heat
dissipation and thermal management of electronic and semiconductor devices.
Optical thermoreflective imaging is being used to perform precise temporal and
spatial imaging of heat on wires and semiconductor materials. We apply quantum
squeezed light to perform thermoreflective imaging on micro-wires, surpassing
the shot-noise limit of classical approaches. We obtain a far-field temperature
sensing accuracy of 42 mK after 50 ms of averaging and show that a
$256\times256$ pixel image can be constructed with such sensitivity in 10
minutes. We can further obtain single-shot temperature sensing of 1.6 K after
only 10 $\mathrm{\mu s}$ of averaging enabling dynamical study of heat
dissipation. Not only do the quantum images provide accurate spatio-temporal
information about heat distribution, but the measure of quantum correlation
provides additional information, inaccessible by classical techniques, that can
lead to a better understanding of the dynamics. We apply the technique to both
Al and Nb microwires and discuss the applications of the technique in studying
electron dynamics at low temperatures.
