  As one of the latest beamline built at the SOLEIL synchrotron source, ANTARES
beamline offers a spectroscopic non-destructive nano-probe to study advanced
materials. This innovative scanning photoemission microscopy combines linear
and angle sweeps to perform precise electronic band structure determination by
Nano Angle Resolved Photoelectron Spectroscopy (nanoARPES) and chemical imaging
by core level detection. The beamline integrates effectively insertion devices
and a high transmission beamline optics. This photon source has been combined
with an advanced microscope, which has precise sample handling abilities.
Moreover, it is fully compatible with a high resolution R4000 Scienta
hemispherical analyzer and a set of Fresnel Zone Plates (FZP) able to focalize
the beam spot up to a few tenths of nanometers, depending on the spatial
resolution of the selected FZP. We present here the main conceptual design of
the beamline and endstation, together with some of the firsts commissioning
results.
