  We have used standard fractal analysis and Markov approach to obtain further
insights on roughness and multifractality of different surfaces. The effect of
coating rates on generating topographic rough surfaces in copper thin films
with same thickness has been studied using atomic force microscopy technique
(AFM). Our results show that by increasing the coating rates, correlation
length (grain sizes) and Markov length are decreased and roughness exponent is
decreased and our surfaces become more multifractal. Indeed, by decreasing the
coating rate, the relaxation time of embedding the particles is increased.
