  Atomically resolved images of monolayer organic crystals have only been
obtained with scanning probe methods so far. On the one hand, they are usually
prepared on surfaces of bulk materials, which are not accessible by (scanning)
transmission electron microscopy. On the other hand, the critical electron dose
of a monolayer organic crystal is orders of magnitudes lower than the one for
bulk crystals, making (scanning) transmission electron microscopy
characterization very challenging. In this work we present an atomically
resolved study on the dynamics of a monolayer CuPcCl\textsubscript{16} crystal
under the electron beam as well as an image of the undamaged molecules obtained
by low-dose electron microscopy. The results show the dynamics and the
radiation damage mechanisms in the 2D layer of this material, complementing
what has been found for bulk crystals in earlier studies. Furthermore, being
able to image the undamaged molecular crystal allows the characterization of
new composites consisting of 2D materials and organic molecules.
