  We propose an application of the Angular X-ray Cross-Correlation Analysis
(AXCCA) to the scattered intensity distribution measured in three-dimensional
(3D) reciprocal space from a single crystalline sample. Contrary to the
conventional application of AXCCA, when averaging over many two-dimensional
(2D) diffraction patterns collected from different randomly oriented samples is
required, the proposed approach gives an insight into the structure of a single
specimen. This is particularly useful in studies of defect-reach samples that
are unlikely to have the same structure. Here, we demonstrate an example of a
qualitative structure determination of a colloidal crystal on the simulated as
well as experimentally measured 3D scattered intensity distributions.
