  Studies of low-frequency resistance noise show that the glassy freezing of
the two-dimensional (2D) electron system in the vicinity of the metal-insulator
transition occurs in all Si inversion layers. The size of the metallic glass
phase, which separates the 2D metal and the (glassy) insulator, depends
strongly on disorder, becoming extremely small in high-mobility samples. The
behavior of the second spectrum, an important fourth-order noise statistic,
indicates the presence of long-range correlations between fluctuators in the
glassy phase, consistent with the hierarchical picture of glassy dynamics.
