  Graphene has been proposed for use in various nanodevice designs, many of
which harness emergent quantum properties for device functionality. However,
visualization, measurement, and manipulation become non-trivial at nanometer
and atomic scales, representing a significant challenge for device fabrication,
characterization, and optimization at length scales where quantum effects
emerge. Here, we present proof of principle results at the crossroads between
2D nanoelectronic devices, e-beam-induced modulation, and imaging with
secondary electron e-beam induced currents (SEEBIC). We introduce a device
platform compatible with scanning transmission electron microscopy
investigations. We then show how the SEEBIC imaging technique can be used to
visualize conductance and connectivity in single layer graphene nanodevices,
even while supported on a thicker substrate (conditions under which
conventional imaging fails). Finally, we show that the SEEBIC imaging technique
can detect subtle differences in charge transport through time in non-ohmic
graphene nanoconstrictions indicating the potential to reveal dynamic
electronic processes.
