  We experimentally investigate a scheme for detecting single atoms
magnetically trapped on an atom chip. The detector is based on the
photoionization of atoms and the subsequent detection of the generated ions. We
describe the characterization of the ion detector with emphasis on its
calibration via the correlation of ions with simultaneously generated
electrons. A detection efficiency of 47.8% (+-2.6%) is measured, which is
useful for single atom detection, and close to the limit allowing atom counting
with sub-Poissonian uncertainty.
