  Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study
in-plane band dispersions of Nickel as a function of probing depth. Photon
energies between 190 and 780 eV were used to effectively probe up to 3-7
layers. The results show layer dependent band dispersion of the Delta_2
minority-spin band which crosses the Fermi level in 3 or more layers, in
contrast to known top 1-2 layers dispersion obtained using ultra-violet rays.
The layer dependence corresponds to an increased value of exchange splitting
and suggests reduced correlation effects in the bulk compared to the surface.
