  We discuss results on the use of charge division to estimate the longitudinal
position of charge deposition in silicon microstrip sensors, and on the
intrinsic noise limitation of microstrip sensors in the limit of long, narrow
strips. We find a resolution of \pm6% of the length of the sensor for a
10cm-long sensor. We also find that network effects significantly reduce sensor
readout noise relative to naive expectations that arise from treating the
detector resistance and capacitance as single discrete electronic components.
