  Epitaxial thin films of the theoretically predicted half metal
Co2Cr0.6Fe0.4Al were deposited by dc magnetron sputtering on different
substrates and buffer layers. The samples were characterized by x-ray and
electron beam diffraction (RHEED) demonstrating the B2 order of the Heusler
compound with only a small partition of disorder on the Co sites. Magnetic
tunneling junctions with Co2Cr0.6Fe0.4Al electrode, AlOx barrier and Co counter
electrode were prepared. From the Julliere model a spin polarisation of
Co2Cr0.6Fe0.4Al of 54% at T=4K is deduced. The relation between the annealing
temperature of the Heusler electrodes and the magnitude of the tunneling
magnetoresistance effect was investigated and the results are discussed in the
framework of morphology and surface order based of in situ STM and RHEED
investigations.
