  This paper summarizes the idea of Adaptive-Latency DRAM (AL-DRAM), which was
published in HPCA 2015. The key goal of AL-DRAM is to exploit the extra margin
that is built into the DRAM timing parameters to reduce DRAM latency. The key
observation is that the timing parameters are dictated by the worst-case
temperatures and worst-case DRAM cells, both of which lead to small amount of
charge storage and hence high access latency. One can therefore reduce latency
by adapting the timing parameters to the current operating temperature and the
current DIMM that is being accessed. Using an FPGA-based testing platform, our
work first characterizes the extra margin for 115 DRAM modules from three major
manufacturers. The experimental results demonstrate that it is possible to
reduce four of the most critical timing parameters by a minimum/maximum of
17.3%/54.8% at 55C while maintaining reliable operation. AL-DRAM adaptively
selects between multiple different timing parameters for each DRAM module based
on its current operating condition. AL-DRAM does not require any changes to the
DRAM chip or its interface; it only requires multiple different timing
parameters to be specified and supported by the memory controller. Real system
evaluations show that AL-DRAM improves the performance of memory-intensive
workloads by an average of 14% without introducing any errors.
