  Spectroscopic photoemission microscopy is a well-established method to
investigate the electronic structure of surfaces. In modern photoemission
microscopes the electron optics allows imaging of the image plane, momentum
plane, or dispersive plane, depending on the lens setting. Furthermore,
apertures allow filtering of energy-, real-, and momentum space. Here, we
describe how a standard spectroscopic and low energy electron microscope can be
equipped with an additional slit at the entrance of the already present
hemispherical analyzer to enable an angle- and energy resolved photoemission
mode with micrometer spatial selectivity. We apply a photogrammetric
calibration to correct for image distortions of the projective system behind
the analyzer and present spectra recorded on Au(111) as a benchmark. Our
approach makes data acquisition in energy-momentum space more efficient, which
is a necessity for laser-based pump-probe photoemission microscopy with
femtosecond time resolution.
