  Magnetic force microscopy (MFM) measurements generally provide phase images
which represent the signature of domain structures on the surface of
nanomaterials. To quantitatively determine magnetic stray fields based on an
MFM image requires calibrated properties of the magnetic tip. In this work, an
approach is presented for calibrating a magnetic tip using a Co/Pt multilayered
film as a reference sample which shows stable well-known magnetic properties
and well-defined perpendicular band domains. The approach is based on a
regularized deconvolution process in Fourier domain with a Wiener filter and
the L-curve method for determining a suitable regularization parameter to get a
physically reasonable result. The calibrated tip is applied for a traceable
quantitative determination of the stray fields of a test sample which has a
patial frequency spectrum covered by that of the reference sample. According to
the "Guide to the expression of uncertainty in measurement", uncertainties of
the processing algorithm are estimated considering the fact that the
regularization influences significantly the quantitative analysis. We discuss
relevant uncertainty components and their propagations between real domain and
Fourier domain for both, the tip calibration procedure and the stray field
calculation, and propose an uncertainty evaluation procedure for quantitative
magnetic force microscopy.
