  The VIS instrument on board the Euclid mission is a weak-lensing experiment
that depends on very precise shape measurements of distant galaxies obtained by
a large CCD array. Due to the harsh radiative environment outside the Earth's
atmosphere, it is anticipated that the CCDs over the mission lifetime will be
degraded to an extent that these measurements will only be possible through the
correction of radiation damage effects. We have therefore created a Monte Carlo
model that simulates the physical processes taking place when transferring
signal through a radiation-damaged CCD. The software is based on
Shockley-Read-Hall theory, and is made to mimic the physical properties in the
CCD as closely as possible. The code runs on a single electrode level and takes
three dimensional trap position, potential structure of the pixel, and
multi-level clocking into account. A key element of the model is that it also
takes device specific simulations of electron density as a direct input,
thereby avoiding to make any analytical assumptions about the size and density
of the charge cloud. This paper illustrates how test data and simulated data
can be compared in order to further our understanding of the positions and
properties of the individual radiation-induced traps.
