  We present a new approach to tuning fork-based atomic force microscopy for
utilizing advanced "tip-on-chip" probes with high sensitivity and broad
compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm
drastically perturb the oscillation of the tuning fork, resulting in poor
performance in its intrinsic force sensing. Therefore, restoring initial
oscillatory characteristics is necessary for regaining high sensitivity. To
this end, we developed a new approach consisting of three basic steps: tuning
fork rebalancing, revamping holder-sensor fixation, and electrode
reconfiguration. Mass rebalancing allows the tuning fork to recover the
frequency and regain high Q-factor values up to 10E4 in air and up to 4 x 10E4
in ultra-high vacuum conditions. The floating-like holder-fixation using soft
wires significantly reduces energy dissipation from the mounting elements.
Combined with the soft wires, reconfigured electrodes provide electrical access
to the chip-like probe without intervening in the force-sensing signal.
Finally, our easy-to-implement approach allows converting the atomic force
microscopy-tip from a passive tool to a dedicated microdevice with extended
functionality.
