  Fine structure analysis of core electron excitation spectra is a cornerstone
characterization technique across the physical sciences. Spectra are most
commonly measured with synchrotron radiation and X-ray spot sizes on the {\mu}m
to mm scale. Alternatively, electron energy loss spectroscopy (EELS) in the
(scanning) transmission electron microscope ((S)TEM) offers over a 1000 fold
increase in spatial resolution, a transformative advantage for studies of
nanostructured materials. However, EELS applicability is generally limited to
excitations below ~2 keV, i.e., mostly to elements in just the first three rows
of the periodic table. Here, using state-of-the-art EELS instrumentation, we
present nm resolved fine structure EELS measurements out to an unprecedented 12
keV with signal-to-noise ratio rivaling that of a synchrotron. We showcase the
advantages of this technique in exemplary experiments.
