  We measure ion heating following transport throughout a Y-junction
surface-electrode ion trap. By carefully selecting the trap voltage update rate
during adiabatic transport along a trap arm, we observe minimal heating
relative to the anomalous heating background. Transport through the junction
results in an induced heating between 37 and 150 quanta in the axial direction
per traverse. To reliably measure heating in this range, we compare the
experimental sideband envelope, including up to fourth-order sidebands, to a
theoretical model. The sideband envelope method allows us to cover the
intermediate heating range inaccessible to the first-order sideband and Doppler
recooling methods. We conclude that quantum information processing in this ion
trap will likely require sympathetic cooling in order to support high fidelity
gates after junction transport.
