  Recent experiments involving CdTe films grown on Si(111) substrates by hot
wall epitaxy revealed features not previously observed [S. O. Ferreira
\textit{et al.}, J. Appl. Phys. \textbf{93}, 1195 (2003)]. This system, which
follows the Volmer-Weber growth mode with nucleation of isolated 3D islands for
less than one monolayer of evaporated material, was described by a peculiar
behavior of the quantum dot (QD) size distributions. In this work, we proposed
a kinetic deposition model to reproduce these new features. The model, which
includes thermally activated diffusion and evaporation of CdTe, qualitatively
reproduced the experimental QD size distributions. Moreover, the model predicts
a transition from Stranski-Krastanow growth mode at lower temperatures to
Volmer-Weber growth mode at higher ones characterized through the QD width
distributions.
