  Exotic atom experiments place transition-edge-sensor (TES) microcalorimeter
arrays in a high-energy charged particle rich environment. When a high-energy
charged particle passes through the silicon substrate of a TES array, a large
amount of energy is deposited and small pulses are generated across multiple
pixels in the TES array due to thermal crosstalk. We have developed analysis
techniques to assess and reduce the effects of charged particle events on
exotic atom X-ray measurements. Using this technique, the high-energy and
low-energy components of the X-ray peaks due to pileup are eliminated,
improving the energy resolution from 6.6 eV to 5.7 eV at 6.9 keV.
