  Microscopic fringe projection profilometry is a powerful 3D measurement
technique with a theoretical measurement accuracy better than one micron
provided that the measured targets can be imaged with good fringe visibility.
However, practically, the 3D shape of the measured surface can hardly be fully
reconstructed due to the defocus of the dense fringes and complex surface
reflexivity characteristics, which lead to low fringe quality and intensity
saturation. To address this problem, we propose to calculate phases of these
highlighted areas from a subset of the fringe sequence which is not subjected
to the intensity saturation. By using the proposed multi-frequency
phase-shifting scheme, the integrity of the 3D surface reconstruction can be
significantly improved. The ultimate phase maps obtained from unsaturated
intensities are used to achieve high-accuracy 3D recovering of shiny surfaces
based on a phase stereo matching method. Experimental results on different
metal surfaces show that our approach is able to retrieve the complete
morphology of shiny surfaces with high accuracy and fidelity.
