  The Gas Electron Multiplier (GEM) is a new age detector, which can handle the
high flux of particles. The GEM foil, which is constructed using 50$\mu$m
highly insulating foil (Kapton/Apical) coated with 5$\mu$m layers of copper, on
both sides, with a network of specifically shaped holes is the major component
of these detectors. The European Center for Nuclear Research (CERN) has been
the sole supplier of the GEM foils until recently when a few other companies
started manufacturing GEM foils under the transfer of technology (TOT) agrement
from CERN. Techtra is one such company in Europe which gained a right to use
CERN developed technology in order to produce commercially viable GEM foils.
Micropack Pvt. Ltd. is another company in India which has successfully
manufactured good quality GEM foils. Due to the microscopic structure of holes
and dependence on the electric field inside, it becomes essential to study the
defect and uniformity of holes along with the electrical property of foils
under ambient conditions. In this work we are reporting the tests condition of
Techtra GEM foils. We report on the development of a cost effective and
efficient technique to study the GEM foils holes geometry, distribution, and
defects. We also report on the electrical properties of these foils like
leakage current, stability, and discharges. At the detector level, we describe
the high voltage (HV) response, gain, uniformity, and stability. The GEMs have
been proposed to have a wider applications, so we performed a feasibility study
to utilize these for the imaging. We irrediated various objects of varying
density with X-rays and reconstructed the images. The reconstructed image shows
a good distinction between materials of different densities, which can be very
useful in various applications like medical imaging or cargo imaging.
