  In this work, we measure and model tilted x-ray refractive lenses to
investigate their effects on an x-ray beam. The modelling is benchmarked
against at-wavelength metrology obtained with x-ray speckle vector tracking
experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing
very good agreement. This validation permits us to explore possible
applications of tilted x-ray lenses in optical design: we demonstrate that
tilting 1D lenses around their focusing direction can be used for fine-tuning
their focal length with possible applications in beamline optical design.
