  Highly sensitive terahertz (THz) sensors for a myriad of applications are
rapidly evolving. A widespread sensor concept is based on the detection of
minute resonance frequency shifts due to a targeted specimen in the sensors
environment. Therefore, cutting-edge high resolution continuous wave (CW) THz
spectrometers provide very powerful tools to investigate the sensors'
performances. However, unpredictable yet non negligible frequency drifts common
to state-of-the-art CW THz spectrometers limit the sensors' accuracy for
ultra-high precision sensing and metrology. Here, we overcome this deficiency
by introducing an ultra-high quality (Q) THz microresonator frequency
reference. Measuring the sensor's frequency shift relative to a well-defined
frequency reference eliminates the unwanted frequency drift, and fully exploits
the capabilities of modern CW THz spectrometers as well as THz sensors. In a
proof-of-concept experiment, we demonstrate the accurate and repeated detection
of minute resonance frequency shifts of less than 5MHz at 0.6THz of a THz
microresonator sensor.
