  While high-throughput (HT) computations have streamlined the discovery of
promising new materials, experimental characterization remains challenging and
time-consuming. One significant bottleneck is the lack of an HT thermal
characterization technique capable of analyzing advanced materials exhibiting
varying surface roughness and in-plane anisotropy. To tackle these challenges,
we introduce spatially resolved lock-in micro-thermography (SR-LIT), an
innovative technique enhanced by tensor analysis for optical thermal
characterization. Our comprehensive analysis and experimental findings showcase
notable advancements: We present a novel tensor-based methodology that
surpasses the limitations of vector-based analysis prevalent in existing
techniques, significantly enhancing the characterization of arbitrary in-plane
anisotropic thermal conductivity tensors. On the instrumental side, we
introduce a straightforward camera-based detection system that, when combined
with the tensor-based methodology, enables HT thermal measurements. This
technique requires minimal sample preparation and enables the determination of
the entire in-plane thermal conductivity tensor with a single data acquisition
lasting under 40 seconds, demonstrating a time efficiency over 90 times
superior to state-of-the-art HT thermology. Additionally, our method
accommodates millimeter-sized samples with poor surface finish, tolerating
surface roughness up to 3.5 {\mu}m. These features highlight an innovative
approach to realizing HT and accurate thermal characterization across various
research areas and real-world applications.
