  The concept of compressive sensing was recently proposed to significantly
reduce the electron dose in scanning transmission electron microscopy (STEM)
while still maintaining the main features in the image. Here, an experimental
setup based on an electromagnetic shutter placed in the condenser plane of a
STEM is proposed. The shutter blanks the beam following a random pattern while
the scanning coils are moving the beam in the usual scan pattern. Experimental
images at both medium scale and high resolution are acquired and then
reconstructed based on a discrete cosine algorithm. The obtained results
confirm the predicted usefulness of compressive sensing in experimental STEM
even though some remaining artifacts need to be resolved.
