  We studied random resistor networks produced with regular structure and
random distribution of edge conductances. These networks are intended to mimic
crack-template-based transparent conductive films as well some random networks
produced using nano-imprinting technology. Applying an effective medium theory,
we found out that the electrical conductance of such networks is $\approx
0.5852 \sqrt{n_E}$, where $n_E$ is the number density of conductive edges. This
dependence is in agreement with numerical calculations in Voronoi networks,
although the effective conductances are approximately 15\% larger.
