  Incorporation mechanisms of H_2 in silica glass were studied with Raman and
infrared (IR) microspectroscopy. Hydrogenated samples were prepared at
temperatures between 800 deg C and 955 deg C at 2 kbar total pressure. Hydrogen
fugacities (f_{H_2}) were controlled using the double capsule technique with
the iron-w\"ustite (IW) buffer assemblage generating f_{H_2} of 1290-1370 bars
corresponding to H_2 partial pressures (P_{H_2}) of 960-975 bars. We found that
silica glass hydrogenated under such conditions contains molecular hydrogen
(H_2) in addition to SiH and SiOH groups. H_2 molecules dissolved in the
quenched glasses introduce a band at 4136 cm^{-1} in the Raman spectra which in
comparison to that of gaseous H_2 is wider and is shifted to lower frequency.
IR spectra of hydrogenated samples contain a band at 4138 cm^{-1} which we
assign to the stretching vibration of H_2 molecules located in
non-centrosymmetric sites. The Raman and IR spectra indicate that the dissolved
H_2 molecules interact with the silicate network. We suggest that the H_2 band
is the envelope of at least three components due to the occupation of at least
three different interstitial sites by H_2 molecules. Both, Raman and IR spectra
of hydrogenated glasses contain bands at ~2255 cm^{-1} which may be due to the
vibration of SiH groups.
