  We propose a method to describe the short-distance behavior of an interface
fluctuating in the presence of the wedge-shaped substrate near the critical
filling transition. Two different length scales determined by the average
height of the interface at the wedge center can be identified. On one length
scale the one-dimensional approximation of Parry et al. \cite{Parry} which
allows to find the interfacial critical exponents is extracted from the full
description. On the other scale the short-distance fluctuations are analyzed by
the mean-field theory.
