  $1/f$ noise caused by microscopic Two-Level Systems (TLS) is known to be very
detrimental to the performance of superconducting quantum devices but the
nature of these TLS is still poorly understood. Recent experiments with
superconducting resonators indicates that interaction between TLS in the oxide
at the film-substrate interface is not negligible. Here we present data on the
loss and $1/f$ frequency noise from two different Nb resonators with and
without Pt capping and discuss what conclusions can be drawn regarding the
properties of TLS in amorphous oxides. We also estimate the concentration and
dipole moment of the TLS.
