  Power capacitor device is a widely used reactive power compensation equipment
in power transmission and distribution system which can easily have internal
fault and therefore affects the safe operation of the power system. An
intelligent non-destructive testing (I-NDT) method based on ICT is proposed to
test the quality of power capacitors automatically in this study. The internal
structure of power capacitors would be scanned by the ICT device and then
defects could be recognized by the SSD algorithm. Moreover, the data data
augmentation algorithm is used to extend the image set to improve the stability
and accuracy of the trained SSD model.
