  High-precision particle tracking devices allow for two-dimensional analyses
of the material budget distribution of particle detectors and their periphery.
In this contribution, the material budget of different targets is reconstructed
from the width of the angular distribution of scattered beam particle at a
sample under test. Electrons in the GeV-range serve as beam particles carrying
enough momentum to traverse few millimetre thick targets whilst offering
sufficient deflection for precise measurement. Reference measurements of the
scattering angle distribution of targets of known thicknesses are presented
that serve as calibration techniques required for tomographic reconstructions
of inhomogeneous objects.
