  Edge illumination (EI) is a non-interferometric X-ray phase contrast imaging
(XPCI) method that has been successfully implemented with conventional
polychromatic sources, thanks to its relaxed coherence requirements. Like other
XPCI methods, EI enables the retrieval of absorption, refraction and
ultra-small angle X-ray scattering (USAXS) signals. However, current retrieval
algorithms require three input frames, which have so far been acquired under as
many different illumination conditions, in separate exposures. These
illumination conditions can be achieved by deliberately misaligning the set-up
in different ways. Each one of these misaligned configurations can then be used
to record frames containing a mixture of the absorption, refraction and
scattering signals. However, this acquisition scheme involves lengthy exposure
times, which can also introduce errors to the retrieved signals. Such errors
have, so far, been mitigated by careful image acquisition and analysis.
However, further reduction to image acquisition time and errors due to sample
mask/sample movement can increase the advantages offered by the EI technique,
and enable targeting more challenging applications. In this paper, we describe
two simplified set-ups that exploit state-of-the-art detector technologies to
achieve single-shot multi-modal imaging.
