  We exploit millimeter wave technology to measure the reflection and
transmission response of random dielectric media. Our samples are easily
constructed from random stacks of identical, sub-wavelength quartz and Teflon
wafers. The measurement allows us to observe the characteristic transmission
resonances associated with localization. We show that these resonances give
rise to enhanced attenuation even though the attenuation of homogeneous quartz
and Teflon is quite low. We provide experimental evidence of disorder-induced
slow light and superluminal group velocities, which, in contrast to photonic
crystals, are not associated with any periodicity in the system. Furthermore,
we observe localization even though the sample is only about four times the
localization length, interpreting our data in terms of an effective cavity
model. An algorithm for the retrieval of the internal parameters of random
samples (localization length and average absorption rate) from the external
measurements of the reflection and transmission coefficients is presented and
applied to a particular random sample. The retrieved value of the absorption is
in agreement with the directly measured value within the accuracy of the
experiment.
