  Results of detailed simulations of the charge transfer inefficiency of a
prototype CCD chip are reported. The effect of radiation damage in a particle
detector operating at a future accelerator is studied by examining two electron
trap levels, 0.17 eV and 0.44 eV below the bottom of the conduction band. Good
agreement is found between simulations using the ISE-TCAD DESSIS program and an
analytical model for the 0.17 eV level. Optimum operation is predicted to be at
about 250 K where the effect of the traps is minimal which is approximately
independent of readout frequency. This work has been carried out within the
Linear Collider Flavour Identification (LCFI) collaboration in the context of
the International Linear Collider (ILC) project.
