  Characterizing the noise in the set of gate operations that form the building
blocks of a quantum computational device is a necessity for assessing the
quality of the device. Here, we introduce randomized linear gate set
tomography, an easy-to-implement gate set tomography procedure that combines
the idea of state-preparation-and-measurement-error-free characterization of
standard gate set tomography with no-design randomized tomographic circuits and
computational ease brought about by an appropriate linear approximation. We
demonstrate the performance of our scheme through simulated examples as well as
experiments done on the IBM Quantum Experience Platform. In each case, we see
that the performance of our procedure is comparable with that of standard
gateset tomography, while requiring no complicated tomographic circuit design
and taking much less computational time in deducing the estimate of the noise
parameters. This allows for straightforward on-the-fly characterization of the
gate operations in an experiment.
