  Grain boundaries (GBs) have been shown to limit critical current density, Jc,
in YBa2Cu3O7 (YBCO) coated conductors. Here we use transport measurements and
scanning Hall probe microscopy coupled with current reconstruction to
demonstrate that GB geometry, such as the in-plane meandering observed in films
grown by metalorganic deposition (MOD) on rolling assisted biaxially textured
substrate (RABiTS), can lead to higher GB Jc. We observe current-induced flux
entry into such a coated conductor, then model its behavior by imaging films
with single, straight GBs tilted at various angles to the applied current.
