  The research field of two dimensional (2D) materials strongly relies on
optical microscopy characterization tools to identify atomically thin materials
and to determine their number of layers. Moreover, optical microscopy-based
techniques opened the door to study the optical properties of these
nanomaterials. We presented a comprehensive study of the differential
reflectance spectra of 2D semiconducting transition metal dichalcogenides
(TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up
to six layers. We analyzed the thickness-dependent energy of the different
excitonic features, indicating the change in the band structure of the
different TMDC materials with the number of layers. Our work provided a route
to employ differential reflectance spectroscopy for determining the number of
layers of MoS2, MoSe2, WS2, and WSe2.
