  We classify and analyze bit errors in the current measurement mode of the
Kirchhoff-law-Johnson-noise (KLJN) key distribution. The error probability
decays exponentially with increasing bit exchange period and fixed bandwidth,
which is similar to the error probability decay in the voltage measurement
mode. We also analyze the combination of voltage and current modes for error
removal. In this combination method, the error probability is still an
exponential function that decays with the duration of the bit exchange period,
but it has superior fidelity to the former schemes.
