  We report the results obtained by a broad-band (0.5-500 keV) data analysis of
narrow-line Seyfert 1 galaxy NGC 4748 observed with an XMM-Newton/PN,
INTEGRAL/ISGRI and SWIFT/BAT telescopes. This galaxy has a soft X-ray excess
that is typical for the class of narrow-line Seyfert 1. The question of the
origin of soft excess in such objects is still unclear. We tested and compared
two spectral models for the soft X-ray spectra based on the different physical
scenarios. The first one is based on the Done & Nayakshin model of two-phase
accretion disc in a vertical direction, which includes two reflection zones
with different ionization levels. According to this model, we found that a
highly ionized reflection has the value of ionization $\xi\sim3000$
$erg~s^{-1}~cm$ and is mostly responsible for the soft excess. This reflection
becomes comparable with a low ionized one ($\xi\sim30$ $erg~s^{-1}~cm$) in
moderate X-ray range. However, this model requires also an additional component
at soft energies with $kT\sim300$ eV. The second model is an energetically
self-consistent model and assumes that a soft excess arises from optically
thick thermal Comptonization of the disc emission. Combination of the UV (from
XMM/Optical monitor) and X-ray data in the latter model allowed us to determine
a mass of the central black hole of $6.9\times10^6 M_{\odot}$ and Eddington
ratio $log_{L/L_{Edd}}\simeq-0.57$. Also, we were not able to rule out one of
competing models using only X-ray spectra of NGC 4748.
