  When the thickness of the layer is smaller than the electrons mean free path,
the morphology affects the conductivity directly based on the layer thickness.
This issue provides basis in order to estimate the thickness of the layer by
understanding the morphology and the value of the conductivity. This method is
an inverse approach on thickness estimation and is applied to various samples.
The comparison of the results with other thickness estimations shows good
consistency. The benefits of this approach is that the only parameter that
needs to be measured is the conductivity, which is quite trivial. Despite the
simplicity of this approach, its results would prove adequate to study both the
material properties and the morphology of the layer. In addition, the
possibility of repeating the measurements on thickness for AC currents with
various frequencies enables averaging the measurements in order to obtain the
most precise results.
