  CrGeTe3 (CGT) is a semiconducting vdW ferromagnet shown to possess magnetism
down to a two-layer thick sample. Although CGT is one of the leading candidates
for spintronics devices, a comprehensive analysis of CGT thickness dependent
magnetization is currently lacking. In this work, we employ scanning
SQUID-on-tip (SOT) microscopy to resolve the magnetic properties of exfoliated
CGT flakes at 4.2 K. Combining transport measurements of CGT/NbSe2 samples with
SOT images, we present the magnetic texture and hysteretic magnetism of CGT,
thereby matching the global behavior of CGT to the domain structure extracted
from local SOT magnetic imaging. Using this method, we provide a thickness
dependent magnetization state diagram of bare CGT films. No zero-field magnetic
memory was found for films thicker than 10 nm and hard ferromagnetism was found
below that critical thickness. Using scanning SOT microscopy, we identify a
unique edge magnetism, contrasting the results attained in the CGT interior.
