  The GlueX Central Drift Chamber (CDC) in Hall D at Jefferson Lab, used for
detecting and tracking charged particles, is calibrated and controlled during
data taking using a Gaussian process. The system dynamically adjusts the high
voltage applied to the anode wires inside the chamber in response to changing
environmental and experimental conditions such that the gain is stabilized.
Control policies have been established to manage the CDC's behavior. These
policies are activated when the model's uncertainty exceeds a configurable
threshold or during human-initiated tests during normal production running. We
demonstrate the system reduces the time detector experts dedicate to
calibration of the data offline, leading to a marked decrease in computing
resource usage without compromising detector performance.
