  Topoelectrical circuits are meta-material realizations of topological
features of condensed matter systems. In this work, we discuss experimental
methods that allow a fast and straightforward detection of the spectral
features of these systems from the two-point impedance of the circuit. This
allows to deduce the full spectrum of a topoelectrical circuit consisting of N
sites from a single two-point measurement of the frequency resolved impedance.
In contrast, the standard methods rely on $N^2$ measurements of admittance
matrix elements with a subsequent diagonalization on a computer. We
experimentally test our approach by constructing a Fibonacci topoelectrical
circuit. Although the spectrum of this chain is fractal, i.e., more complex
than the spectra of periodic systems, our approach is successful in recovering
its eigenvalues. Our work promotes the topoelectrical circuits as an ideal
platform to measure spectral properties of various (quasi)crystalline systems.
