  Exploring new strategies for controlling the magnetic domain propagation is
the key to realize ultrafast, high-density domain wall-based memory and logic
devices for next generation computing. These strategies include strain
modulation in multiferroic devices, geometric confinement and area-selective
pinning of domain wall. 2D Van der Waals materials introduce localized
modifications to the interfacial magnetic order, enabling control over the
propagation of magnetic domains. Here, using Lorentz-Transmission Electron
Microscopy (L-TEM) along with the Modified Transport of Intensity equations
(MTIE), we demonstrate controlled domain expansion with in-situ magnetic field
in a ferromagnet (Permalloy, NiFe) interfacing with a 2D Van der Waals material
Graphene (Gr). The Gr/NiFe interface exhibits distinctive domain expansion rate
with magnetic field selectively near the interface which is further analyzed
using micromagnetic simulations. Our findings are crucial for comprehending
direct visualization of interface controlled magnetic domain expansion,
offering insights for developing future domain wall-based technology.
