  In this paper, we show that it is possible to overcome one of the fundamental
limitations of super-resolution microscopy techniques: the necessity to be in
an \emph{optically homogeneous} environment. Using recent modal approximation
results we show as a proof of concept that it is possible to recover the
position of a single point-like emitter in a \emph{known resonant environment}
from far-field measurements with a precision two orders of magnitude below the
classical Rayleigh limit. The procedure does not involve solving any partial
differential equation, is computationally light (optimisation in $\R^d$ with
$d$ of the order of $10$) and therefore suited for the recovery of a very large
number of single emitters.
