  The role of charged centers in radiation-induced phenomena occurring in solid
nitrogen irradiated with an electron beam was studied. The experiments were
performed employing luminescence method and activation spectroscopy techniques
- spectrally resolved thermally stimulated luminescence TSL and thermally
stimulated exoelectron emission. To discriminate radiation-induced processes in
the bulk and at the surface the samples were probed in depth by varying
electron energy. Desorption of excited N2* (C3{\Pi}u) molecule was detected for
the first time. The mechanism of this phenomenon based on recombination of
electron with intrinsic charged center N4+ was proposed. The key role of N3+
center dissociative recombination in generation of N radicals is suggested.
