  We theoretically consider the temperature and density dependent transport
properties of semiconductor-based 2D carrier systems within the RPA-Boltzmann
transport theory, taking into account realistic screened charged impurity
scattering in the semiconductor. We derive a leading behavior in the transport
property, which is exact in the strict 2D approximation and provides a zeroth
order explanation for the strength of metallicity in various 2D carrier
systems. By carefully comparing the calculated full nonlinear temperature
dependence of electronic resistivity at low temperatures with the corresponding
asymptotic analytic form obtained in the $T/T_F \to 0$ limit, both within the
RPA screened charged impurity scattering theory, we critically discuss the
applicability of the linear temperature dependent correction to the low
temperature resistivity in 2D semiconductor structures. We find quite generally
that for charged ionized impurity scattering screened by the electronic
dielectric function (within RPA or its suitable generalizations including local
field corrections), the resistivity obeys the asymptotic linear form only in
the extreme low temperature limit of $T/T_F \le 0.05$. We point out the
experimental implications of our findings and discuss in the context of the
screening theory the relative strengths of metallicity in different 2D systems.
