  We show that scanning electron microscopy with polarization analysis (SEMPA)
that is sensitive to both in-plane magnetization components can be used to
image the out-of-plane magnetized multi-domain state in multilayered chiral
spin textures. By depositing a thin layer of Fe on top of the multilayer we
image the underlying out-of-plane domain state through the mapping of its stray
fields in the Fe. We also demonstrate that SEMPA can be used to image the
domain wall chirality in these systems after milling away the capping layer and
imaging the topmost magnetic layer directly.
