  Ferroelectric relaxors are complex materials with distinct properties. The
understanding of their dielectric susceptibility, which strongly depends on
both temperature and probing frequency, have interested researchers for many
years. Here we report a macroscopic and phenomenological approach based on
statistical modeling to investigate and better understand how the dielectric
response of a relaxor depends on temperature. Employing the Maxwell-Boltzmann
distribution and considering temperature dependent dipolar orientational
polarizability, we propose a minimum statistical model and specific equations
to understand and fit numerical and experimental dielectric responses versus
temperature. We show that the proposed formula can successfully fit the
dielectric response of typical relaxors, including Ba(Zr,Ti)O$_{3}$,
Pb(Zn$_{1/3}$Nb$_{2/3}$)$_{0.87}$Ti$_{0.13}$O$_{3}$, and
Pb(Mg$_{1/3}$Nb$_{2/3}$)O$_{3}$-0.05Pb(Zr$_{0.53}$Ti$_{0.47}$)O$_{3}$, which
demonstrates the general applicability of this approach.
