  We derive the full distribution of transmitted particles through a
superconducting point contact of arbitrary transparency under voltage bias. The
charge transport is dominated by multiple Andreev reflections. The counting
statistics is a multinomial distribution of processes, in which multiple
charges ne (n=1,2,3,...) are transferred through the contact. For zero
temperature we obtain analytical expressions for the probabilities of the
multiple Andreev reflections. The current, shot noise and high current
cumulants in a variety of situations can be obtained from our result.
