  Charging-up processes affecting gain stability in Thick Gas Electron
Multipliers (THGEM) were studied with a dedicated simulation toolkit.
Integrated with Garfield++, it provides an effective platform for systematic
phenomenological studies of charging-up processes in MPGD detectors. We
describe the simulation tool and the fine-tuning of the step-size required for
the algorithm convergence, in relation to physical parameters. Simulation
results of gain stability over time in THGEM detectors are presented, exploring
the role of electrode-thickness and applied voltage on its evolution. The
results show that the total amount of irradiated charge through electrode's
hole needed for reaching gain stabilization is in the range of tens to hundreds
of pC, depending on the detector geometry and operational voltage. These
results are in agreement with experimental observations presented previously.
