  We propose a new wide-field imaging method that exploits the Localized
Surface Plasmon Resonance phenomenon to produce super-resolution images with an
optical microscope equipped with a custom design polarization analyzer module.
In this paper we describe the method and apply it to the analysis of low-energy
carbon ion tracks implanted in a nuclear emulsion film. The result is then
compared with the measurements of the same tracks carried out at an electronic
microscope. The images set side by side show their close similarity. The
resolution achieved with the current microscope setup is estimated to be about
50 nm.
