  We have examined the upper critical field of a large and representative set
of present multi-filamentary Nb3Sn wires and one bulk sample over a temperature
range from 1.4 K up to the zero field critical temperature. Since all present
wires use a solid-state diffusion reaction to form the A15 layers,
inhomogeneities with respect to Sn content are inevitable, in contrast to some
previously studied homogeneous samples. Our study emphasizes the effects that
these inevitable inhomogeneities have on the field-temperature phase boundary.
The property inhomogeneities are extracted from field-dependent resistive
transitions which we find broaden with increasing inhomogeneity. The upper
90-99 % of the transitions clearly separates alloyed and binary wires but a
pure, Cu-free binary bulk sample also exhibits a zero temperature critical
field that is comparable to the ternary wires. The highest mu0Hc2 detected in
the ternary wires are remarkably constant: The highest zero temperature upper
critical fields and zero field critical temperatures fall within 29.5 +/- 0.3 T
and 17.8 +/- 0.3 K respectively, independent of the wire layout. The complete
field-temperature phase boundary can be described very well with the relatively
simple Maki-DeGennes model using a two parameter fit, independent of
composition, strain state, sample layout or applied critical state criterion.
