  W-O deposits with complex morphologies and significant He contents will
growth on the surface of plasma facing components exposed to He discharges. To
mimic the re/co-deposition process, W-O-He coatings were produced by implanting
He+ ions on W films grown by pulsed laser deposition (PLD). The use of
appropriate PLD experimental parameters such as Ar or He background atmospheres
induces the deposition of porous or amorphous-like W-O structures,
respectively. After multiple ion implantation stages using 150 keV, 100 keV and
50 keV incident He+ ion beams with a total fluence of 5 x 1017 ion/cm^2,
significant amounts of He were identified in porous coatings by Rutherford
backscattering (RBS). Time-of-flight elastic recoil detection (TOF-ERDA)
measurements showed that most of the implanted He was already released from the
porous coatings five month after implantation while for the case of amorphous
ones the He content remains significant at deeper layers and smoothly decrease
towards the surface, as result of a different morphology and nanostructure. The
proposed method involving PLD and ion implantation seems adequate to produce
W-O-He reference samples for fusion investigations.
