  This is a brief account of our numerical study of the tearing mode
reconnection. We demonstrate two main points. First, we show that, given
sufficiently small resistivity, the Rutherford regime always exists; larger
values of Delta' require smaller values of resistivity. Rutherford's
negligible-inertia assumption is validated and the asymptotically linear
dependence of the time derivative of the island width on the resistivity and
Delta' is confirmed. Second, we find that, at large Delta', the Rutherford
regime is followed by a nonlinear stage of fast growth linked to X-point
collapse and formation of a current sheet. This causes the reconnection to
become Sweet-Parke (SP) like. The signature resistivity^{1/2} scaling of the
effective island growth rate is, indeed, found in this nonlinear stage. The SP
stage culminates in the saturation of the mode, which can, thus, be achieved
much faster than via Rutherford regime.
