  A simple and versatile strategy, denominated Slip Trace - Modified Lattice
Rotation Analysis (ST-MLRA), is presented to enable the identification of the
active slip systems in polycrystalline alloys from surface information. The
slip plane trace orientation is used to define the potential active slip planes
while the actual slip direction within the active slip plane is obtained from
the grain rotation, as indicated by the stretching of the trace of the grain
orientation in the pole figure as a result of deformation. Examples of
application of the strategy in a HCP Mg alloy are presented for illustration.
They show that the strategy is simple to implement and allows to identify the
active slip system(s) in each grain.
