  Theory predicts that the currents in scanning tunneling microscopy (STM) and
the attractive forces measured in atomic force microscopy (AFM) are directly
related. Atomic images obtained in an attractive AFM mode should therefore be
redundant because they should be \emph{similar} to STM. Here, we show that
while the distance dependence of current and force is similar for graphite,
constant-height AFM- and STM images differ substantially depending on distance
and bias voltage. We perform spectroscopy of the tunneling current, the
frequency shift and the damping signal at high-symmetry lattice sites of the
graphite (0001) surface. The dissipation signal is about twice as sensitive to
distance as the frequency shift, explained by the Prandtl-Tomlinson model of
atomic friction.
