  Angle-resolved photoemission spectroscopy with sub-micrometer spatial
resolution ({\mu}-ARPES), has become a powerful tool for studying quantum
materials. To achieve sub-micrometer or even nanometer-scale spatial
resolution, it is important to focus the incident light beam (usually from the
synchrotron radiation) using X-ray optics such as the zone plate or ellipsoidal
capillary mirrors. Recently, we developed a laser-based {\mu}-ARPES with
spin-resolution (LMS-ARPES). The 177 nm laser beam is achieved by frequency
doubling a 355 nm beam using a KBBF crystal and subsequently focused using an
optical lens with a focal length of about 16 mm. By characterizing the focused
spot size using different methods and performing spatial-scanning photoemission
measurement, we confirm the sub-micron spatial resolution of the system.
Compared with the {\mu}-ARPES facilities based on synchrotron radiation, our
LMS-ARPES system is not only more economical and convenient but also with
higher photon flux (> 5E13 photons/s), thus enabling the high-resolution and
high-statistics measurements. Moreover, the system is equipped with a
two-dimensional spin detector based on exchange scattering at a
surface-passivated iron film grown on a W(100) substrate. We investigate the
spin structure of the prototype topological insulator Bi2Se3 and reveal a high
spin-polarization rate, confirming its spin-momentum locking property. This
lab-based LMS-ARPES will be a powerful research tool for studying the local
fine electronic structures of different condensed matter systems, including
topological quantum materials, mesoscopic materials and structures, and
phase-separated materials.
