  We introduce an algorithm for detection of bugs in sequential circuits. This
algorithm is incomplete i.e. its failure to find a bug breaking a property P
does not imply that P holds. The appeal of incomplete algorithms is that they
scale better than their complete counterparts. However, to make an incomplete
algorithm effective one needs to guarantee that the probability of finding a
bug is reasonably high. We try to achieve such effectiveness by employing the
Test-As-Proofs (TAP) paradigm. In our TAP based approach, a counterexample is
built as a sequence of states extracted from proofs that some local variations
of property P hold. This increases the probability that a) a representative set
of states is examined and that b) the considered states are relevant to
property P.
  We describe an algorithm of test generation based on the TAP paradigm and
give preliminary experimental results.
