  The investigation of the switching current probability distribution of a
Josephson junction is a conventional tool to gain information on the phase
slips dynamics as a function of the temperature. Here we adopt this
well-established technique to probe the impact of an external static electric
field on the occurrence of phase slips in gated all-metallic titanium (Ti)
Josephson weak links. We show, in a temperature range between 20 mK and 420 mK,
that the evolution of the phase slips dynamics as a function of the
electrostatic field starkly differs from that observed as a function of the
temperature. This fact demonstrates, on the one hand, that the electric field
suppression of the critical current is not simply related to a conventional
thermal-like quasiparticle overheating in the weak-link region. On the other
hand, our results may open the way to operate an electrostatic-driven
manipulation of phase slips in metallic Josephson nanojunctions, which can be
pivotal for the control of decoherence in superconducting nanostructures.
