  We have conducted a careful study of current-voltage (I-V) characteristics in
fully integrated commercial PbZr0.4Ti0.6O3 thin film capacitors with Pt bottom
and Ir/IrO2 top electrodes. Highly reproducible steady state I-V were obtained
at various temperatures over two decades in voltage from current-time data and
analyzed in terms of several common transport models including space charge
limited conduction, Schottky thermionic emission under full and partial
depletion and Poole-Frenkel conduction, showing that the later is the most
plausible leakage mechanism in these high quality films. In addition,
ferroelectric hysteresis loops and capacitance-voltage data were obtained over
a large range of temperatures and discussed in terms of a modified
Landau-Ginzburg-Devonshire theory accounting for space charge effects.
