  We present a novel approach to achieve hyper spectral resolution, high
sensitive detection, and high speed data acquisition Stimulated Raman
Spectroscopy by employing amplified offset-phase controlled fs-pulse bursts. In
this approach, the Raman-shift spectrum is obtained through the direct mapping
between the bursts offset phase and the Raman-shift frequency, which requires
neither wavelength-detuning as in the long-pulse method nor precise dispersion
management and delay scanning with movable parts as in the spectral focusing
technique. This method is demonstrated numerically by solving the coupled
non-linear Schroedinger equations and the properties of this approach are
systematically investigated. The product of the spectral resolution and the
pixel dwell time in this work is below 2 microsiemens/centimeter, which is at
least an order of magnitude lower than previous methods. This previously
untouched area will greatly expand the applications of SRS and holds the
potential for discovering new science.
