  Using focused electron-beam-induced deposition (FEBID), we fabricate
vertical, platinum-coated cobalt nanowires with a controlled three-dimensional
structure. The latter is engineered to feature bends along the height: these
are used as pinning sites for domain walls, the presence of which we
investigate using X-ray Magnetic Circular Dichroism (XMCD) coupled to
PhotoEmission Electron Microscopy (PEEM). The vertical geometry of our sample
combined with the low incidence of the X-ray beam produce an extended wire
shadow which we use to recover the wire's magnetic configuration. In this
transmission configuration, the whole sample volume is probed, thus
circumventing the limitation of PEEM to surfaces. This article reports on the
first study of magnetic nanostructures standing perpendicular to the substrate
with XMCD-PEEM. The use of this technique in shadow mode enabled us to confirm
the presence of a domain wall (DW) without direct imaging of the nanowire.
