  Quantitative interpretation of transmission electron microscopy (TEM) data of
crystalline specimens often requires the accurate knowledge of the local
crystal orientation. A method is presented which exploits momentum-resolved
scanning TEM (STEM) data to determine the local mistilt from a major zone axis.
It is based on a geometric analysis of Kikuchi bands within a single
diffraction pattern, yielding the centre of the Laue circle. Whereas the
approach is not limited to convergent illumination, it is here developed using
unit-cell averaged diffraction patterns corresponding to high-resolution STEM
settings. In simulation studies, an accuracy of approximately 0.1mrad is found.
The method is implemented in automated software and applied to crystallographic
tilt and in-plane rotation mapping in two experimental cases. In particular,
orientation maps of high-Mn steel and an epitaxially grown
La$_{\text{0.7}}$Sr$_{\text{0.3}}$MnO$_{\text{3}}$-SrTiO$_{\text{3}}$ interface
are presented. The results confirm the estimates of the simulation study and
indicate that tilt mapping can be performed consistently over a wide field of
view with diameters well above 100nm at unit cell real space sampling.
