  We have developed a unique micromechanical method to extract extremely thin
graphite samples. Graphite crystallites with thicknesses ranging from 10 - 100
nm and lateral size $\sim$ 2 $\mu$m are extracted from bulk. Mesoscopic
graphite devices are fabricated from these samples for electric field dependent
conductance measurements. Strong conductance modulation as a function of gate
voltage is observed in the thinner crystallite devices. The temperature
dependent resistivity measurements show more boundary scattering contribution
in the thinner graphite samples.
