  We present the development of a high-precision sample-position-autocorrection
system for photoemission experiments. A binocular vision method based on image
pattern matching calculations was realized to track the sample position with an
accuracy better than 1 \um, which was much smaller than the spot size of the
incident laser. We illustrate the performance of the
sample-position-autocorrection system with representative photoemission data on
the topological insulator Bi$_2$Se$_3$ and an optimally-doped cuprate
superconductor \Bi. Our method provides new possibilities for studying the
temperature-dependent electronic structures in quantum materials by laser-based
or spatially resolved photoemission systems with high precision and efficiency.
