  The structured illumination microscopy using unknown speckle patterns has
shown the capacity to surpass the Abbe's diffraction barrier, giving the
possibility to design cheap and versatile SIM devices. However, the
state-of-the-art joint reconstruction methods in this framework has a
relatively low contrast in super-resolution part in comparison to conventional
SIM and the hyper-parameter is not easy to tune. In this paper, a unified joint
reconstruction approach is proposed with the hyper-parameter proportional to
the noise level. Different regularization terms could be evaluated under the
same model. Moreover, the degradation entailed by out-of-focus light could be
solved in speckle illumination setup easily.
