  In this report, we scrutinize the thickness dependent resistivity data from
the recent literature on electrical transport measurements in topological
insulators. A linear increase in resistivity with increase in thickness is
expected in the case of these materials since they have an insulating bulk and
conducting surface. However, such a trend is not seen in the resistivity versus
thickness data for all the cases examined, except for some samples, where it
holds for a narrow range of thickness.
