  In all printed OFETs with Poly(3,4-ethylenedioxythiophene)/
poly(styrenesulfonate) (PEDOT/ PSS) gate, offset printing and gravure of
electrically dense sub-$\mu$ insulators from polyvinylphenol (PVPh), polyvinyl
alcohol (PVOH) and poly(methyl methacrylate) (PMMA) as well as other organic
and inorganic materials turned out to be problematic due to the most reactive
part of the gate material- the negative sulfonate ions from PSS. The present
paper investigates the nature of the interaction between PSS and PVOH sub-$\mu$
insulator explored by infrared spectroscopy and electrical methods. Some
evidence is obtained that most probably OH- and not sulfonate ions are
responsible for creating channels, penetrated by PEDOT/PSS nano dispersion
applied as gate.
