  The temperature dependence of the x-ray scattering in the region below the
first sharp diffraction peak was measured for silica glasses with low and high
OH content (GE-124 and Corning 7980). Data were obtained upon scanning the
temperature at 10, 40 and 80 K/min between 400 K and 1820 K. The measurements
resolve, for the first time, the hysteresis between heating and cooling through
the glass transition for silica glass, and the data have a better signal to
noise ratio than previous light scattering and differential thermal analysis
data. For the glass with the higher hydroxyl concentration the glass transition
is broader and at a lower temperature. Fits of the data to the
Adam-Gibbs-Fulcher equation provide updated kinetic parameters for this very
strong glass. The temperature derivative of the observed X-ray scattering
matches that of light scattering to within 14%.
