  Barrium fluoride (BaF2) thin films were prepared by electron beam evaporation
technique at room temperature, on glass, Silicon and Aluminum substrates having
thickness of 20 nm each. Its structural property and surface morphology were
studied using glancing angle X-ray diffraction (GAXRD) and atomic force
microscopy (AFM) respectively. It was found that grain size, average surface
roughness and interface width changes with different substrates. Higuchi
algorithm is applied for the fractal measure on AFM images.It was observed
found that the fractal dimension varied from substrate to substrate.
