  SrVO3 (SVO) is a prospective candidate to replace the conventional
indium-tin-oxide (ITO) among the new transparent conducting oxide (TCO)
generation. In this study, the structural, electrical, and optical properties
of SVO thin films, both epitaxial and polycrystalline, are determined during
and after heat treatments in the 150-250 {\deg}C range and under ambient
environment in order to explore the chemical stability of this material. The
use of these relatively low temperatures speeds up the natural ageing of the
films, and allows to follow the evolution of their related properties. The
combination of techniques rather sensitive to the film surface and of
techniques sampling the film volume will emphasize the presence of a surface
oxidation evolving in time at low annealing temperatures, whereas the
perovskite phase is destroyed throughout the film for treatments above 200
{\deg}C. The present study is designed to understand the thermal degradation
and long-term stability issues of vanadate-based TCOs, and to identify
technologically viable solutions for the application of this group as new TCOs.
