  Using a blister test, we measured the work of separation between MoS$_2$
membranes from metal, semiconductor, and graphite substrates. We found a work
of separation ranging from 0.11 +- 0.05 J/m^2 for chromium to 0.39 +- 0.1 J/m^2
for graphite substrates. In addition, we measured the work of adhesion of
MoS$_2$ membranes over these substrates and observed a dramatic difference
between the work of separation and adhesion which we attribute to adhesion
hysteresis. Due to the prominent role that adhesive forces play in the
fabrication and functionality of devices made from 2D materials, an
experimental determination of the work of separation and adhesion as provided
here will help guide their development.
