  Freestanding graphene displays an outstanding resilience to electron
irradiation at low electron energies. Point defects in graphene are, however,
subject to beam driven dynamics. This means that high resolution micrographs of
point defects, which usually require a high electron irradiation dose might not
represent the intrinsic defect population. Here, we capture the inital defects
formed by ejecting carbon atoms under electron irradiation, by imaging with
very low doses and subsequent reconstruction of the frequently occuring defects
via a maximum likelihood algorithm.
