  In this paper we report the results about the synthesis and characterization
of optimally doped La1-xNaxMnO3 thin films grown onto SrTiO3 (100), NdGaO3
(100) and NdGaO3 (110) for thickness ranging from 11 to 82 nm. The effect of
substrate nature and orientation, film thickness and annealing procedure was
investigated in order to optimize their magnetoresistance (MR). We obtained
very smooth films displaying MR values greater than 70%, near to room
temperature.
