  State-of-the-art time-of-flight (ToF) based 3D sensors suffer from poor
lateral and depth resolutions. In this work, we introduce a novel sensor
concept that provides ToF-based 3D measurements of real world objects with
depth precisions up to 35 micrometers and point cloud densities at the native
sensor-resolutions of state-of-the-art CMOS/CCD cameras (up to several
megapixels). Unlike other continuous-wave amplitude-modulated ToF principles,
our approach exploits wavelength diversity for an interferometric surface
measurement of macroscopic objects with rough or specular surfaces. Based on
this principle, we introduce three different embodiments of prototype sensors,
exploiting three different sensor architectures.
