  Many believe that in-field hardware faults are too rare in practice to
justify the need for Logic Built-In Self-Test (LBIST) in a design. Until now,
LBIST was primarily used in safety-critical applications. However, this may
change soon. First, even if costly methods like burn-in are applied, it is no
longer possible to get rid of all latent defects in devices at leading-edge
technology. Second, demands for high reliability spread to consumer electronics
as smartphones replace our wallets and IDs. However, today many ASIC vendors
are reluctant to use LBIST. In this paper, we describe the needs for successful
deployment of LBIST in the industrial practice and discuss how these needs can
be addressed. Our work is hoped to attract a wider attention to this important
research topic.
