  We explore the interactions between Argon and extreme ultraviolet (XUV) laser
pulses across photon energies of 200 eV, 260 eV, and 315 eV, scrutinizing the
influence of photon energy on Argon ion yields and unraveling the associated
ionization pathways. Utilizing pulse durations of 10 fs and 30 fs, we spotlight
a notable increase in Argon's ionization propensity with escalating laser
intensities, especially within the \(5 \times 10^{14}\, \text{W/cm}^2\) to
\(1.2 \times 10^{16}\, \text{W/cm}^2\) range. While direct ionization
predominated at 200 eV, the 260 eV and 315 eV spectra revealed complex
interactions, prominently featuring the Auger process. A consistent
overshadowing of odd-charged ions by even-charged Argon ions, particularly at
315 eV, paves the way for future research. The findings provide crucial
insights into atomic interactions with intense light, establishing a groundwork
for further exploration into similar atomic systems.
