  X-ray-induced photoemission in materials research is commonly acknowledged as
a method with a probing depth limited by the escape depth of the
photoelectrons. This general statement should be complemented with exceptions
arising from the distribution of the X-ray wavefield in the material. Here we
show that the integral hard-X-ray-induced photoemission yield is modulated by
the Fresnel reflectivity of a multilayer structure with the signal originating
well below the photoelectron escape depth. A simple electric self-detection of
the integral photoemission yield and Fourier data analysis permit extraction of
thicknesses of individual layers. The approach does not require detection of
the reflected radiation and can be considered as a framework for non-invasive
evaluation of buried layers with hard X-rays under grazing incidence.
