  The article comprises structural, microstructural, and physical properties
analysis of Bi2Se3-xTex (x= 0, 1, 2 and 3) mixed topological insulator (MTI)
single crystals. All the crystals were grown through a well-optimized
solid-state reaction route via the self-flux method. These MTI are well
characterized through XRD (X-ray Diffraction), SEM (Scanning Electron
Microscopy), EDAX (Energy Dispersive spectroscopy), and thereby, the physical
properties are analyzed through the RT (Resistance vs temperature) down to 10K
as well as the magneto-resistance (MR) measurements (at 5K) in a magnetic field
of up to 10 Tesla. The MR drastically varies from x=0 to x=3 in MTI, from a
huge 400 percent, it goes down to 20 percent and 5 percent and eventually back
to 315 percent. This fascinated behaviour of MR is explained in this article
through HLN (Hikami-Larkin-Nagaoka) equation and an additional term. This
article not only proposed the mesmerizing behavior of MR in MTI but also
explains the reason through competing WAL (Weak Anti-Localization) and WL (Weak
Localization) conduction processes.
