  We present a combined scanning force and tunneling microscope working in a
dilution refrigerator that is optimized for the study of individual electronic
nano-devices. This apparatus is equipped with commercial piezo-electric
positioners enabling the displacement of a sample below the probe over several
hundred microns at very low temperature, without excessive heating. Atomic
force microscopy based on a tuning fork resonator probe is used for cryogenic
precise alignment of the tip with an individual device. We demonstrate the
local tunneling spectroscopy of a hybrid Josephson junction as a function of
its current bias.
