  A framework for studying the behavior of a classically frustrated signed
network in the process of random rewiring is developed. We describe jump
probabilities for change in frustration and formulate a theoretical estimate in
terms of the master equation. Stationary thermodynamic distribution and moments
are derived from the master equation and compared to numerical simulations.
Furthermore, an exact solution of the probability distribution is provided
through suitable mapping of rewiring dynamic to birth and death processes with
quadratic asymptotically symmetric transition rates.
