  Here, we study the stability of capacitance diaphragm gauges. We focus on
their stability before and after a controlled series of bakes. We find that
baking results in appreciable shifts of the zero offset, but note that these
can easily be corrected at time of use. Linearity however cannor be corrected
at time of use, so it is essential to understand its effect if one wished to
use similar gauges in a system that requires baking. For the gauges in this
study, we find that baking introduces a minimal additional uncertainty, and
that the total uncertainty can be kept to below about 0.3% at the k=2
confidence level (95%).
