  We report on the investigation of morphology, magnetic and conductive
properties of the mutilayered nanostructures
[(Co$_{40}$Fe$_{40}$B$_{20}$)$_{34}$(SiO$_2$)$_{66}$]/[C]$_{47}$ consisting of
the contacting magnetic (Co$_{40}$Fe$_{40}$B$_{20}$)$_{34}$(SiO$_2$)$_{66}$
nanocomposite and amorphous semiconductor carbon C layers. It is shown by
Grazing-Incidence Small-Angle X-ray Scattering method that the ordering and the
size of nanoparticles in the magnetic layers do not change profoundly with
increasing of carbon layer thickness. Meanwhile, the electrical conductance and
the magnetic properties are significantly varied: resistance of the samples
changes by four orders of magnitude and superparamagnetic blocking temperature
changes from 15 K to 7 K with the increment of carbon layer thickness $h_c$
from 0.4 nm to 1.8 nm. We assume that the formation of the homogeneous
semiconductor interlayer leads to modification of the metal-insulator growth
process that drives the changes in the magnetic and conductive properties.
