  Beautiful theories of magnetic hysteresis based on random microscopic
disorder have been developed over the past ten years. Our goal was to directly
compare these theories with precise experiments. We first developed and then
applied coherent x-ray speckle metrology to a series of thin multilayer
perpendicular magnetic materials. To directly observe the effects of disorder,
we deliberately introduced increasing degrees of disorder into our films. We
used coherent x-rays to generate highly speckled magnetic scattering patterns.
The apparently random arrangement of the speckles is due to the exact
configuration of the magnetic domains in the sample. In effect, each speckle
pattern acts as a unique fingerprint for the magnetic domain configuration.
Small changes in the domain structure change the speckles, and comparison of
the different speckle patterns provides a quantitative determination of how
much the domain structure has changed. How is the magnetic domain configuration
at one point on the major hysteresis loop related to the configurations at the
same point on the loop during subsequent cycles? The microscopic return-point
memory(RPM) is partial and imperfect in the disordered samples, and completely
absent when the disorder was not present. We found the complementary-point
memory(CPM) is also partial and imperfect in the disordered samples and
completely absent when the disorder was not present. We found that the RPM is
always a little larger than the CPM. We also studied the correlations between
the domains within a single ascending or descending loop. We developed new
theoretical models that do fit our experiments.
