  We focus on the slow relaxations observed in the conductance of disordered
insulators at low temperature (especially granular aluminum films). They
manifest themselves as a temporal logarithmic decrease of the conductance after
a quench from high temperatures and the concomitant appearance of a field
effect anomaly centered on the gate voltage maintained. We are first interested
in ageing effects, i.e. the age dependence of the dynamical properties of the
system. We stress that the formation of a second field effect anomaly at a
different gate voltage is not a "history free" logarithmic (lnt) process, but
departs from lnt in a way which encodes the system's age. The apparent
relaxation time distribution extracted from the observed relaxations is thus
not "constant" but evolves with time. We discuss what defines the age of the
system and what external perturbation out of equilibrium does or does not
rejuvenate it. We further discuss the problem of relaxation times and comment
on the commonly used "two dip" experimental protocol aimed at extracting
"characteristic times" for the glassy systems (granular aluminum, doped indium
oxide...). We show that it is inoperable for systems like granular Al and
probably highly doped InOx where it provides a trivial value only determined by
the experimental protocol. But in cases where different values are obtained
like in lightly doped InOx or some ultra thin metal films, potentially
interesting information can be obtained, possibly about the "short time"
dynamics of the different systems. Present ideas about the effect of doping on
the glassiness of disordered insulators may also have to be reconsidered.
