  Excitons and their constituent charge carriers play the central role in
electroluminescence mechanisms determining the ultimate performance of organic
optoelectronic devices. The involved processes and their dynamics are often
studied with time-resolved techniques limited by spatial averaging that
obscures the properties of individual electron-hole pairs. Here we overcome
this limit and characterize single charge and exciton dynamics at the nanoscale
by using time-resolved scanning tunnelling microscopy-induced luminescence
(TR-STML) stimulated with nanosecond voltage pulses. We use isolated defects in
C$_{60}$ thin films as a model system into which we inject single charges and
investigate the formation dynamics of a single exciton. Tuneable hole and
electron injection rates are obtained from a kinetic model that reproduces the
measured electroluminescent transients. These findings demonstrate that TR-STML
can track dynamics at the quantum limit of single charge injection and can be
extended to other systems and materials important for nanophotonic devices.
