  We propose a novel high resolution microscopy technique for enantio-specific
detection of chiral samples down to sub-100 nm size, based on force
measurement. We delve into the differential photo-induced optical force exerted
on an achiral probe in the vicinity of a chiral sample, when left and right
circularly polarized beams separately excite the sample-probe interactive
system. We analytically prove that the differential force is entangled with the
enantiomer type of the sample enabling enantio-specific detection of chiral
inclusions. Moreover, we demonstrate that the differential force is linearly
dependent on both the chiral response of the sample and the electric response
of the tip and is inversely related to the quartic power of probe-sample
distance. We provide physical insight into the transfer of optical activity
from the chiral sample to the achiral tip based on a rigorous analytical
approach. We support our theoretical achievements by several numerical
examples, highlighting the potential application of the derived analytic
properties. Lastly, we demonstrate the sensitivity of our method to
enantio-specify nanoscale chiral samples with chirality parameter in the order
of 0.01, and discuss how this could be further improved.
