  Spin Polarized Low Energy Electron Microscopy is used as a spin dependent
spectroscopic probe to study the spin dependent specular reflection of a
polarized electron beam from two different magnetic thin film systems:
Fe/W(110) and Co/W(110). The reflectivity and spin-dependent
exchange-scattering asymmetry are studied as a function of electron kinetic
energy and film thickness, as well as the time dependence. The largest value of
the figure of merit for spin polarimetry is observed for a 5 monolayer thick
film of Co/W(110) at an electron kinetic energy of 2eV. This value is 2 orders
of magnitude higher than previously obtained with state of the art Mini-Mott
polarimeter. We discuss implications of our results for the development of an
electron-spin-polarimeter using the exchange-interaction at low energy.
