  An expression that relates thermal current fluctuations in two terminal
networks at quasi-equilibrium to their current voltage characteristics is
presented. It is based upon the observation that the available thermal noise
power at quasi-equilibrium is very close to the equilibrium value. As an
example, current noise in ideal p-n junctions is obtained from their
characteristics. Thermal current noise in field effect transistors is predicted
by this approach, as well as "shot noise suppression" due to barrier lowering
in solid-state diodes.
