  A novel approach was derived to compute the elastic displacement field from a
measured elastic deformation field (i.e., deformation gradient or strain). The
method is based on integrating the deformation field using Finite Element
discretisation. Space and displacement fields are approximated using piece-wise
interpolation functions. Hence, the full elastic deformation field can be
expressed as nodal displacements, the unknowns. The nodal displacements are
then obtained using a least square method. The proposed method was applied to
the symmetrical (residual) elastic deformation field measured using high
(angular) resolution electron backscatter diffraction around a Vickers
micro-indenting impression on a (001) mono-Si crystal sample with the
integrated out-of-plane surface displacements matched with the impression
topography measured using. The (residual) displacement field was used as the
boundary conditions to calculate the three-dimensional stress intensity factors
(K_(I,II,III)) at the cracks emanating from the indentation.
