  Hidden order in URu$_2$Si$_2$ has remained a mystery now entering its 4th
decade. The importance of resolving the nature of the hidden order has
stimulated extensive research. Here we present a detailed characterization of
different surface terminations in URu$_2$Si$_2$ by angle-resolved photoemission
spectroscopy, in conjunction with scanning tunneling spectroscopy and DMFT
calculations that may unveil a new piece of this puzzle. The U-terminated
surface is characterized by an electron-like band around the $\bar{X}$ point,
while a hole-like band for the Si-terminated surface. We also investigate
temperature evolution of the electronic structure around the $\bar{X}$ point
from 11 K up to 70 K, and did not observe any abrupt change of the electronic
structure around the coherence temperature (55 K). The $f$ spectral weight
gradually weakens upon increasing temperature, still some $f$ spectral weight
can be found above this temperature. Our results suggest that surface
terminations in URu$_2$Si$_2$ are an important issue to be taken into account
in future work.
