  We design models for helium in matrices like aerogel, Vycor or Geltech from a
manifestly microscopic point of view. For that purpose, we calculate the
dynamic structure function of 4He on Si substrates and between two Si walls as
a function of energy, momentum transfer, and the scattering angle. The
angle--averaged results are in good agreement with the neutron scattering data;
the remaining differences can be attributed to the simplified model used here
for the complex pore structure of the materials. A focus of the present work is
the detailed identification of coexisting layer modes and bulk--like
excitations, and, in the case of thick films, ripplon excitations. Involving
essentially two--dimensional motion of atoms, the layer modes are sensitive to
the scattering angle.
