  We report an automated characterization of a single-photon detector based on
commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode
is characterized by I-V curves at different illumination levels (darkness, 10
pW and 10 uW), dark count rate and photon detection efficiency at different
bias voltages. The automated characterization routine is implemented in C++
running on a Linux computer.
