  Between Run II commissioning in early 2001 and the end of operations in
September 2011, the Tevatron collider delivered 12~fb$^{-1}$ of $p\bar{p}$
collisions at $\sqrt{s}=1.96$ TeV to the Collider Detector at Fermilab (CDF).
During that time, the CDF silicon vertex detector was subject to radiation
doses of up to 12 Mrad. After the end of operations, the silicon detector was
annealed for 24 days at $18^{\circ}$C. In this paper, we present a measurement
of the change in the bias currents for a subset of sensors during the annealing
period. We also introduce a novel method for monitoring the depletion voltage
throughout the annealing period. The observed bias current evolution can be
characterized by a falling exponential term with time constant
$\tau_I=17.88\pm0.36$(stat.)$\pm0.25$(syst.) days. We observe an average
decrease of $(27\pm3)\%$ in the depletion voltage, whose evolution can
similarly be described by an exponential time constant of $\tau_V=6.21\pm0.21$
days. These results are consistent with the Hamburg model within the
measurement uncertainties.
