  The characterization of thin film solar cells is of huge importance for
obtaining high open circuit voltage and low recombination rates from the
interfaces or within the bulk of the main materials. Among the many electrical
characterization techniques, the two and four wire probe using the Cascade
instrument is of interest since the resistance of the wires, and the electrical
contacts can be excluded by the additional two wires in 4 wire probe
configuration. In this paper, both two and four-point probes configuration are
employed to characterize the CIGS chalcogenide thin film solar cells. The two
wire probe has been used to measure the current-voltage characteristics of the
cell which results in a huge internal resistance. Therefore, the four wire
connection are also used to eliminate the lead resistance to enhance the
characterization accuracy. The load resistance in the twowire probe diminishes
the photogenerated current density at smaller voltage ranges. In contrast, the
proposed four wire probe collects more current at higher voltages due to
enhanced carrier collection efficiency from contact electrodes. The current
conduction mechanism is also identified at every voltage region represented by
the value of the ideality factor of that voltage region.
