  Materials can, in principle, be imaged at the level of individual atoms with
aberration corrected transmission electron microscopy. However, such resolution
can be attained only with very high electron doses. Consequently, radiation
damage is often the limiting factor when characterizing sensitive materials.
Here, we demonstrate a simple and effective method to increase the electron
radiation tolerance of materials by using graphene as protective coating. This
leads to an improvement of three orders of magnitude in the radiation tolerance
of monolayer MoS2. Further on, we construct samples in different
heterostructure configurations to separate the contributions of different
radiation damage mechanisms.
