  Ravishankar et al. claimed the drive-level capacitance profiling (DLCP)
method cannot resolve trap density along depth direction in perovskites with
given thickness, and explained the measured charges to be a consequence of
geometrical capacitance and diffusion capacitance. We point out that the trap
densities in DLCP method are derived from the differential capacitance at
different frequencies, and thus the background charges caused by diffusion and
geometry capacitance has been subtracted. Even for the non-differential doping
analysis by DLCP, the contribution from diffusion capacitance is shown to be
negligible and contribution from geometry capacitance is excluded. Additional
experiment results further support the measured trap density represents the
actual trap distribution in perovskite solar cells.
