  Fast and efficient detection of the qubit state in trapped ion quantum
information processing is critical for implementing quantum error correction
and performing fundamental tests such as a loophole-free Bell test. In this
work we present a simple qubit state detection protocol for a $^{171}$Yb$^+$
hyperfine atomic qubit trapped in a microfabricated surface trap, enabled by
high collection efficiency of the scattered photons and low background photon
count rate. We demonstrate average detection times of 10.5, 28.1 and
99.8\,$\upmu$s, corresponding to state detection fidelities of 99%, 99.85(1)%
and 99.915(7)%, respectively.
