  The microstructural parameters like the average domain size, effective domain
size at a particular crystallographic direction and microstrain within the
domains of titanium and Ti-5%Ta-2%Nb, irradiated with 116 MeV O5+ ion, have
been characterized as a function of dose by X-Ray Diffraction Line Profile
Analysis using different model based approaches. Dislocation Density and
stacking fault probabilities have also been estimated from the analysis. The
analysis revealed that there was a significant decrease of the average domain
size with dose as compared to the unirradiated sample. The estimated values of
dislocation density increased significantly for the irradiated samples and was
found to be an order of magnitude more as compared to the unirradiated one.
However, the dislocation density saturated with increase in dose. The
deformation (stacking) fault probabilities were found to be negligible even
with the increase in dose of irradiation.
