  This contribution discusses the results of an in-situ angular XPS study on
the thermal evolution of the native oxide layer on Nb3Sn and pure Nb. XPS data
were recorded with conventional spectrometers using an AlK(alpha) X-ray source
for spectra collected up to 600 C, and an MgK(Alpha) X-rays source for
temperatures above 600 C. The effect of the thickness, composition, and thermal
stability of that oxide layer is relevant to understanding the functional
properties of superconducting radiofrequency (SRF) cavities used in particle
accelerators. There is a consensus that oxide plays a role in surface
resistance (Rs). The focus of this study is Nb3Sn, which is a promising
material that is used in the manufacturing of superconducting radiofrequency
(SRF) cavities as well as in quantum sensing, and pure Nb, which was included
in the study for comparison. The thermal evolution of the oxide layer in these
two materials is found to be quite different, which is ascribed to the
influence of the Sn atom on the reactivity of the Nb atom in Nb3Sn films. Nb
and Sn atoms in this intermetallic solid have different electronegativity, and
the Sn atom can reduce electron density around neighbouring Nb atoms in the
solid, thus reducing their reactivity for oxygen. This is shown in the
thickness, composition, and thermal stability of the oxide layer formed on
Nb3Sn. The XPS spectra were complemented by grazing incident XRD patterns
collected using the ESRF synchrotron radiation facility. The results discussed
herein shed light on oxide evolution in the Nb3Sn compound and guide its
processing for potential applications of the Nb3Sn-based SRF cavities in
accelerators and other superconducting devices.
