  The wide range of interesting electromagnetic behavior of contemporary
materials requires that experimentalists working in this field master many
diverse measurement techniques and have a broad understanding of condensed
matter physics and biophysics. Measurement of the electromagnetic response of
materials at microwave frequencies is important for both fundamental and
practical reasons. In this paper, we propose a novel near-field microwave
sensor with application to material characterization, biology, and
nanotechnology. The sensor is based on a subwavelength ferrite-disk resonator
with magnetic-dipolar-mode (MDM) oscillations. Strong energy concentration and
unique topological structures of the near fields originated from the MDM
resonators allow effective measuring material parameters in microwaves, both
for ordinary structures and objects with chiral properties.
