  We performed x-ray magnetic circular dichroism (XMCD) measurements on
heterostructures comprising topological insulators (TIs) of the
(Bi,Sb)$_2$(Se,Te)$_3$ family and the magnetic insulator EuS. XMCD measurements
allow us to investigate element-selective magnetic proximity effects at the
very TI/EuS interface. A systematic analysis reveals that there is neither
significant induced magnetism within the TI nor an enhancement of the Eu
magnetic moment at such interface. The induced magnetic moments in Bi, Sb, Te,
and Se sites are lower than the estimated detection limit of the XMCD
measurements of $\sim\!10^{-3}$ $\mu_\mathrm{B}$/at.
