  We propose a scheme to retrieve the size parameters of a nano-particle on a
glass substrate at a scale much smaller than the wavelength. This is achieved
by illuminating the particle using two plane waves to create rich and
non-trivial local polarization distributions, and observing the far-field
scattering pattern into the substrate. A simple dipole model which exploits
tunneling effect of evanescent field into regions beyond the critical angle, as
well as directional scattering due to spin-orbit coupling is developed, to
relate the particle's shape, size and position to the far-field scattering with
remarkable sensitivity. Our method brings about a far-field super-resolution
imaging scheme based on the interaction of vectorial light with nanoparticles.
