  Moir\'e superlattices, engineered through precise stacking of van der Waals
(vdW) layers, hold immense promise for exploring strongly correlated and
topological phenomena. However, these applications have been held back by the
common preparation method: tear-and-stack of Scotch tape exfoliated monolayers.
It has low efficiency and reproducibility, along with challenges of twist angle
inhomogeneity, interfacial contamination, micrometer sizes, and a tendency to
untwist at elevated temperatures. Here we report an effective strategy to
construct highly consistent vdW moir\'e structures with high production
throughput, near-unity yield, pristine interfaces, precisely controlled twist
angles, and macroscopic scale (up to centimeters) with enhanced thermal
stability. We further demonstrate the versatility across various vdW materials
including transition metal dichalcogenides, graphene, and hBN. The expansive
size and high quality of moir\'e structures enables high-resolution mapping of
the reciprocal space back-folded lattices and moir\'e mini band structures with
low energy electron diffraction (LEED) and angle-resolved photoemission
spectroscopy (ARPES). This technique will have broad applications in both
fundamental studies and mass production of twistronic devices.
