  Frequency stability is key to performance of nanoresonators. This stability
is thought to reach a limit with the resonator's ability to resolve
thermally-induced vibrations. Although measurements and predictions of
resonator stability usually disregard fluctuations in the mechanical frequency
response, these fluctuations have recently attracted considerable theoretical
interest. However, their existence is very difficult to demonstrate
experimentally. Here, through a literature review, we show that all studies of
frequency stability report values several orders of magnitude larger than the
limit imposed by thermomechanical noise. We studied a monocrystalline silicon
nanoresonator at room temperature, and found a similar discrepancy. We propose
a new method to show this was due to the presence of frequency fluctuations, of
unexpected level. The fluctuations were not due to the instrumentation system,
or to any other of the known sources investigated. These results challenge our
current understanding of frequency fluctuations and call for a change in
practices.
