  We observe a strong correlation between magnetization relaxation and
electrical resistivity in thin Permalloy (Ni$_{81}$Fe$_{19}$, ``Py'') films.
Electron scattering rates in the films were affected by varying film thickness
and deposition conditions. This shows that the magnetization relaxation
mechanism is analogous to ``bulk'' relaxation, where phonon scattering in bulk
is replaced by surface and defect scattering in thin films. Another interesting
finding is the increased magnetization damping with Pt layers adjacent to the
Py films. This is attributed to the strong spin-orbit coupling in Pt, resulting
in spin-flip scattering of electrons that enter from the Py.
