  By means of numerical simulations, we demonstrate the innovative use of
computational ghost imaging in transmission electron microscopy to retrieve
images with a resolution that overcomes the limitations imposed by coherent
aberrations. The method requires measuring the intensity on a single pixel
detector with a series of structured illuminations. The success of the
technique is improved if the probes are made to resemble the sample and the
patterns cover the area of interest evenly. By using a simple 8 electrode
device as a specific example, a 2-fold increase in resolution beyond the
aberration limit is demonstrated to be possible under realistic experimental
conditions.
