  We report grazing incidence small angle neutron scattering (GISANS) and
complementary off-specular neutron reflectometry (OSR) of the magnetic order in
a single-crystalline epitaxial MnSi film on Si(111) in the thick film limit.
Providing a means of direct reciprocal space mapping, GISANS and OSR reveal a
magnetic modulation perpendicular to the films under magnetic fields parallel
and perpendicular to the film, where additional polarized neutron reflectometry
(PNR) and magnetization measurements are in excellent agreement with the
literature. Regardless of field orientation, our data does not suggest the
presence of more complex spin textures, notably the formation of skyrmions.
This observation establishes a distinct difference with bulk samples of MnSi of
similar thickness under perpendicular field, in which a skyrmion lattice
dominates the phase diagram. Extended x-ray absorption fine structure
measurements suggest that small shifts of the Si positions within the
unstrained unit cell control the magnetic state, representing the main
difference between the films and thin bulk samples.
