  Recent advances in the technology of transmission electron microscopy have
allowed for a more precise visualization of materials and physical processes,
such as metal oxidation. Nevertheless, the quality of information is limited by
the damage caused by an electron beam, movement of the specimen or other
environmental factors. A novel registration method has been proposed to remove
those limitations by acquiring a series of low dose microscopy frames and
performing a computational registration on them to understand and visualize the
sample. This process can be represented as a prefix sum with a complex and
computationally intensive binary operator and a parallelization is necessary to
enable processing long series of microscopy images. With our parallelization
scheme, the time of registration of results from ten seconds of microscopy
acquisition has been decreased from almost thirteen hours to less than seven
minutes on 512 Intel IvyBridge cores.
