  An expression describing the controlling parameters involved in short range
nanoscale dissipation is proposed and supported by simulations and experimental
findings. The expression is deconstructed into the geometrical, dynamic,
chemical and mechanical properties of the system. In atomic force microscopy
these are translated into 1) tip radius and tip-sample deformation, 2) resonant
frequency and oscillation amplitude and 3) hysteretic and viscous dissipation.
The latter are characteristic parameters defining the chemical and mechanical
properties of the tip-sample system. Long range processes are also discussed
and footprints are identified in experiments conducted on mica and silicon
samples. The present methodology can be exploited to validate or invalidate
nanoscale dissipative models by comparing predictions with experimental
observables.
