  In this work we studied Cu/Co multilayers prepared using dc-magnetron
sputtering technique with Ag surfactant. It was found that Ag balances the
difference in the surface free energy of Cu and Co and this results in removing
the asymmetry in the interface roughness of Cu-on-Co and Co-on-Cu interfaces.
As the interfaces become symmetric, we observe a significant enhancement in
antiferromagnetic coupling and magneto resistance. Further, a correlation of
spin-dependent scattering with the interface roughness is brought by comparing
Cu/Co multilayer prepared using different deposition methods. It was found that
as interface roughness increases spin-dependent scattering decreases.
