  A scanning helium microscope typically utilises a thermal energy helium atom
beam, with an energy and wavelength (<100 meV, ~0.05 nm) particularly sensitive
to surface structure. An angular detector stage for a scanning helium
microscope is presented that facilitates the in-situ measurement of scattering
distributions from a sample. We begin by demonstrating typical elastic and
inelastic scattering from ordered surfaces. We then go on to show the role of
topography in diffuse scattering from disordered surfaces, observing deviations
from simple cosine scattering. In total, these studies demonstrate the wealth
of information that is encoded into the scattering distributions obtained with
the technique.
