  The standard method of "measuring" quantum wavefunction is the technique of
{\it indirect} quantum state tomography. Owing to conceptual novelty and
possible advantages, an alternative {\it direct} scheme was proposed and
demonstrated recently in quantum optics system. In this work we present a study
on the direct scheme of measuring qubit state in the circuit QED system, based
on weak measurement and weak value concepts. To be applied to generic parameter
conditions, our formulation and analysis are carried out for finite strength
weak measurement, and in particular beyond the bad-cavity and weak-response
limits. The proposed study is accessible to the present state-of-the-art
circuit-QED experiments.
