  We describe an optical technique based on the statistical analysis of the
random intensity distribution due to the interference of the near-field
scattered light with the strong transmitted beam. It is shown that, from the
study of the two-dimensional power spectrum of the intensity, one derives the
scattered intensity as a function of the scattering wave vector. Near-field
conditions are specified and discussed. The substantial advantages over
traditional scattering technique are pointed out, and is indicated that the
technique could be of interest for wave lengths other than visible light.
