  Dipole-coupled nanomagnetic logic (NML), where nanomagnets with bistable
magnetization states act as binary switches and information is transferred
between them via dipole coupling and Bennett clocking, is a potential
replacement for conventional transistor logic since magnets dissipate less
energy than transistors when they switch in response to the clock. However,
dipole-coupled NML is much more error-prone than transistor logic because
thermal noise can easily disrupt magnetization dynamics. Here, we study a
particularly energy-efficient version of dipole-coupled NML known as
straintronic multiferroic logic (SML) where magnets are clocked/switched with
electrically generated mechanical strain. By appropriately shaping the voltage
pulse that generates strain, the error rate in SML can be reduced to tolerable
limits. In this paper, we describe the error probabilities associated with
various stress pulse shapes and discuss the trade-off between error rate and
switching speed in SML.
