  Test pattern generation is an electronic design automation tool that attempts
to find an input (or test) sequence that, when applied to a digital circuit,
enables one to distinguish between the correct circuit behavior and the faulty
behavior caused by particular faults. The effectiveness of this classical
method is measured by the fault coverage achieved for the fault model and the
number of generated vectors, which should be directly proportional to test
application time. This work address the quantum process validation problem by
considering the quantum mechanical adaptation of test pattern generation
methods used to test classical circuits. We found that quantum mechanics allows
one to execute multiple test vectors concurrently, making each gate realized in
the process act on a complete set of characteristic states in space/time
complexity that breaks classical testability lower bounds.
