  An X-ray spectrograph consisting of radially ruled off-plane reflection
gratings and silicon pore optics was tested at the Max Planck Institute for
extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic
(SPO) stack used is a test module for the Arcus small explorer mission, which
will also feature aligned off-plane reflection gratings. This test is the first
time two off-plane gratings were actively aligned to each other and with a SPO
to produce an overlapped spectrum. The gratings were aligned using an active
alignment module which allows for the independent manipulation of subsequent
gratings to a reference grating in three degrees of freedom using picomotor
actuators which are controllable external to the test chamber. We report the
line spread functions of the spectrograph and the actively aligned gratings,
and plans for future development.
