  Raman spectroscopy is one of the widely used methods in the analysis of
various samples including carbon-based materials. This study aimed to identify
the number of layers and defects in graphene using micro-Raman spectroscopy.
More specifically, the study examined tracing the oxidation process of graphene
under UV exposure. Investigation of the effect of the power density of the
Raman excitation laser reveals a linear dependence between the ratio of I2D/IG
and the power density of the excitation laser. Also, the absence of peak D due
to the increase in power density provides evidence for the non-destructive
nature of micro-Raman spectroscopy. Given the value of I2D/IG, one of the
parameters for determining the number of layers in graphene which has reached
1.39 at the edge, the findings indicate the possibility of an edge fold of
single-layer graphene. During the oxidation process, the intensity and position
of the D peak increase as a function of exposure time. Alterations in the
graphene Raman spectrum, comprising the disappearance of the 2D peak and the
appearance of the D peak, trace and confirm the oxidation process of the
sample.
