  Atomic-scale mapping of the chemical elements in materials is now possible
using aberration-corrected electron microscopes but delocalization and multiple
scattering can confound image interpretation. Here we report atomic-resolution
measurements with the elastic and inelastic signals acquired on an absolute
scale. By including dynamical scattering in both the elastic and inelastic
channels we obtain quantitative agreement between theory and experiment. Our
results enable a close scrutiny of the inelastic scattering physics and
demonstrate the possibility of element-specific atom counting.
