  Low temperature transport measurements on superconducting film - normal metal
wire - superconducting film (SNS) junctions fabricated on the basis of 6 nm
thick superconducting polycrystalline PtSi films are reported. The structures
with the normal metal wires of two different lengths L=1.5 $\mu$m and L=6$\mu$m
and the same widths W=0.3$\mu$m are studied. Zero bias resistance dip related
to pair current proximity effect is observed for all junctions whereas the
subharmonic energy gap structure originating from phase coherent multiple
Andreev reflections have occurs only in the SNS junctions with short wires.
