  This paper proposes the preliminary study of the data-driven failure analysis
model for the internet of things (IoT) devices. This model focus on the impact
of data transferring both get and receiving data in class C of Low Power Wide
Area Network (LoRaWAN). To set up the network, the authors develop the
combination of four several technology parts, including 1) the End Device
Gateway Network server of LoRa IoT, 2) an Application server for storing the
data in the database, 3) the Dashboard to show and got the command by the user,
and 4) the failure analysis model based on Bayesian belief networks which
calculate the probability values that collect the data transferring both uplink
and downlink on the network connection in this study. In the testing phase, the
authors input the separated data into the data-driven failure analysis model to
analyze the time and latency of the connection by the concern of the impact and
risk of the failure of the overall system. The model will show the probability
value of failure. The authors hope to use the results to clarify whether a
tested IoT device is suitable for use or not.
