  We present an ultra-fast, precise, parameter-free method, which we term
Deep-STORM, for obtaining super-resolution images from stochastically-blinking
emitters, such as fluorescent molecules used for localization microscopy.
Deep-STORM uses a deep convolutional neural network that can be trained on
simulated data or experimental measurements, both of which are demonstrated.
The method achieves state-of-the-art resolution under challenging
signal-to-noise conditions and high emitter densities, and is significantly
faster than existing approaches. Additionally, no prior information on the
shape of the underlying structure is required, making the method applicable to
any blinking data-set. We validate our approach by super-resolution image
reconstruction of simulated and experimentally obtained data.
