  In recent years, x-ray speckle tracking techniques have emerged as viable
tools for wavefront metrology and sample imaging applications. These methods
are based on the measurement of near-field images. Thanks to the simple
experimental set-up, high angular sensitivity and compatibility with low
coherence sources these methods have been actively developed for use with
synchrotron and laboratory light sources. Not only do speckle-tracking
techniques give the potential for high resolution imaging, but they also
provide rapid and robust characterisation of aberrations of x-ray optical
elements, focal spot profiles and the sample position and transmission
properties. In order to realise these capabilities, we require software
implementations that are equally rapid and robust. To address this need, a
software suite has been developed for the "ptychographic x-ray speckle tracking
technique" -- an x-ray speckle based method suitable for highly divergent
wavefields. The software suite is written in Python 3, with an OpenCL back end
for GPU and multi-CPU core processing. It is accessible as a Python module,
through the command line or through a graphical user interface and is available
as source code under version 3 or later of the GNU General Public License.
