  Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and
Systems on Chip (SoCs), are increasingly used in dependable or safety-critical
systems. These commodity devices are subject to notable hardware ageing, which
makes failures likely when used for an extended time. It is of vital importance
to understand ageing processes and to detect hardware degradations early. In
this survey, we describe the fundamental ageing mechanisms and review the main
techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power
supplies. The main goal of this work is to facilitate future research efforts
in this field by presenting all main approaches in an organized way.
