  Concomitant with the rapid development of quantum technologies, challenging
demands arise concerning the certification and characterization of devices. The
promises of the field can only be achieved if stringent levels of precision of
components can be reached and their functioning guaranteed. This review
provides a brief overview of the known characterization methods of
certification, benchmarking, and tomographic recovery of quantum states and
processes, as well as their applications in quantum computing, simulation, and
communication.
