  An experimental methodology is developed to evaluate size effects in
nanovoids deformation under macroscopic uniaxial stress loading conditions.
Quantitative evaluation of voids deformation as a function of voids size shows
both a crystallographic effect, albeit small compared to the scatter, and no
evidence of size effects for voids diameter larger than 10 nm, while a slight
effect is present for smaller voids. Critical assessment of the data in light
of theoretical models indicates that these results may be compatible with the
presence of a hardened layer at the void/matrix interface, which is illustrated
through finite element simulations accounting for surface tension.
