  Using molecular dynamics (MD) simulation, we have calculated the melting
temperature of two-dimensional electron systems on $ 240$\AA-$ 500$\AA helium
films supported by substrates of dielectric constants $ \epsilon_{s}=2.2-11.9$
at areal densities $n$ varying from $ 3\times 10^{9}$ cm$^{-2}$ to $ 1.3\times
10^{10}$ cm$^{-2}$. Our results are in good agreement with the available
theoretical and experimental results.
