  Carrier and spin recombination are investigated in p-type GaAs of acceptor
concentration NA = 1.5 x 10^(17) cm^(-3) using time-resolved photoluminescence
spectroscopy at 15 K. At low pho- tocarrier concentration, acceptors are mostly
neutral and photoelectrons can either recombine with holes bound to acceptors
(e-A0 line) or form excitons which are mostly trapped on neutral acceptors
forming the (A0X) complex. It is found that the spin lifetime is shorter for
electrons that recombine through the e-A0 transition due to spin relaxation
generated by the exchange scattering of free electrons with either trapped or
free holes, whereas spin flip processes are less likely to occur once the
electron forms with a free hole an exciton bound to a neutral acceptor. An
increase of exci- tation power induces a cross-over to a regime where the
bimolecular band-to-band (b-b) emission becomes more favorable due to screening
of the electron-hole Coulomb interaction and ionization of excitonic complexes
and free excitons. Then, the formation of excitons is no longer possible, the
carrier recombination lifetime increases and the spin lifetime is found to
decrease dramatically with concentration due to fast spin relaxation with free
photoholes. In this high density regime, both the electrons that recombine
through the e-A0 transition and through the b-b transition have the same spin
relaxation time.
