  This is our second paper devoted to the problem of line intensity - oxygen
abundance calibration starting from the idea of McGaugh (1991) that the strong
oxygen lines contain the necessary information to determine accurate abundances
in HII regions. The high-metallicity HII regions are considered.
  A relation of the type O/H=f(P,R23) between oxygen abundance and the value of
abundance index R23 introduced by Pagel et al. (1979) and the excitation
parameter P (which is defined here as the contribution of the radiation in
[OIII]4959,5007 lines to the "total" oxygen radiation) has been derived
empirically using the available oxygen abundances determined via measurement of
a temperature-sensitive line ratio [OIII]4959,5007/[OIII]4363 (Te - method). By
comparing oxygen abundances derived with the Te - method and those derived with
the suggested relations (P - method), it was found that the precision of oxygen
abundance determination with the P - method is around 0.1 dex and is comparable
to that of the Te - method.
  A relation of the type Te=f(P,R23) between electron temperature and the
values of abundance index R23 and the excitation parameter P was derived
empirically using the available electron temperatures determined via
measurement of temperature-sensitive line ratios. The mean difference between
electron temperatures derived through the Te=f(P,23 relation and determined via
measurement of the temperature-sensitive line ratio is around 500K.
