  Polarized light microscopy, as a contrast-enhancing technique for optically
anisotropic materials, is a method well suited for the investigation of a wide
variety of effects in solid-state physics, as for example birefringence in
crystals or the magneto-optical Kerr effect (MOKE). We present a microscopy
setup that combines a widefield microscope and a confocal scanning laser
microscope with polarization-sensitive detectors. By using a high numerical
aperture objective, a spatial resolution of about 240 nm at a wavelength of 405
nm is achieved. The sample is mounted on a $^4$He continuous flow cryostat
providing a temperature range between 4 K and 300 K, and electromagnets are
used to apply magnetic fields of up to 800 mT with variable in-plane
orientation and 20 mT with out-of-plane orientation. Typical applications of
the polarizing microscope are the imaging of the in-plane and out-of-plane
magnetization via the longitudinal and polar MOKE, imaging of magnetic flux
structures in superconductors covered with a magneto-optical indicator film via
Faraday effect or imaging of structural features, such as twin-walls in
tetragonal SrTiO$_3$. The scanning laser microscope furthermore offers the
possibility to gain local information on electric transport properties of a
sample by detecting the beam-induced voltage change across a current-biased
sample. This combination of magnetic, structural and electric imaging
capabilities makes the microscope a viable tool for research in the fields of
oxide electronics, spintronics, magnetism and superconductivity.
