  There is now growing evidence that the soft X-ray excess is almost ubiquitous
among unobscured active galaxies. In spite of the various interpretations that
have been considered in the last years, the nature of this foremost spectral
feature is not firmly established yet. In this context, we review from a
reflection perspective the three highest-quality X-ray observations of the
narrow-line Seyfert 1 galaxy Tonantzintla S180, obtained by XMM-Newton and
Suzaku. The X-ray spectrum of Ton S180 shows only moderate variations over a
time span of several years, suggesting that the same physical process accounts
for the bulk of the broad-band X-ray emission at the different epochs, and that
the properties of the X-ray source are fairly stable. We have successfully
applied in our spectral analysis a dual-reflector model, consisting of two
separate components: one arises from the surface of the accretion disc, is
highly ionized and blurred by relativistic effects; the other is cold, quite
faint, and can be associated with a distant reprocessor. Due to the strength
and the nearly power-law shape of its soft excess emission, Ton S180 is one of
the most challenging sources to test the X-ray reflection scenario. In this
work we provide a clear illustration of the great potential and spectral
flexibility of blurred reflection models, while discussing some of their
current limitations and possible shortcomings.
