  We present the Chandra Multiwavelength Project (ChaMP) X-ray point source
catalog with ~6,800 X-ray sources detected in 149 Chandra observations covering
\~10 deg^2. The full ChaMP catalog sample is seven times larger than the
initial published ChaMP catalog. The exposure time of the fields in our sample
ranges from 0.9 to 124 ksec, corresponding to a deepest X-ray flux limit of
f_{0.5-8.0} = 9 x 10^{-16} erg/cm2/sec. The ChaMP X-ray data have been
uniformly reduced and analyzed with ChaMP-specific pipelines, and then
carefully validated by visual inspection. The ChaMP catalog includes X-ray
photometric data in 8 different energy bands as well as X-ray spectral hardness
ratios and colors. To best utilize the ChaMP catalog, we also present the
source reliability, detection probability and positional uncertainty. To
quantitatively assess those parameters, we performed extensive simulations. In
particular, we present a set of empirical equations: the flux limit as a
function of effective exposure time, and the positional uncertainty as a
function of source counts and off axis angle. The false source detection rate
is ~1% of all detected ChaMP sources, while the detection probability is better
than ~95% for sources with counts >30 and off axis angle <5 arcmin. The typical
positional offset between ChaMP X-ray source and their SDSS optical
counterparts is 0.7+-0.4 arcsec, derived from ~900 matched sources.
