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Oct 27

UniEM-3M: A Universal Electron Micrograph Dataset for Microstructural Segmentation and Generation

Quantitative microstructural characterization is fundamental to materials science, where electron micrograph (EM) provides indispensable high-resolution insights. However, progress in deep learning-based EM characterization has been hampered by the scarcity of large-scale, diverse, and expert-annotated datasets, due to acquisition costs, privacy concerns, and annotation complexity. To address this issue, we introduce UniEM-3M, the first large-scale and multimodal EM dataset for instance-level understanding. It comprises 5,091 high-resolution EMs, about 3 million instance segmentation labels, and image-level attribute-disentangled textual descriptions, a subset of which will be made publicly available. Furthermore, we are also releasing a text-to-image diffusion model trained on the entire collection to serve as both a powerful data augmentation tool and a proxy for the complete data distribution. To establish a rigorous benchmark, we evaluate various representative instance segmentation methods on the complete UniEM-3M and present UniEM-Net as a strong baseline model. Quantitative experiments demonstrate that this flow-based model outperforms other advanced methods on this challenging benchmark. Our multifaceted release of a partial dataset, a generative model, and a comprehensive benchmark -- available at huggingface -- will significantly accelerate progress in automated materials analysis.

  • 11 authors
·
Aug 22

UNEM: UNrolled Generalized EM for Transductive Few-Shot Learning

Transductive few-shot learning has recently triggered wide attention in computer vision. Yet, current methods introduce key hyper-parameters, which control the prediction statistics of the test batches, such as the level of class balance, affecting performances significantly. Such hyper-parameters are empirically grid-searched over validation data, and their configurations may vary substantially with the target dataset and pre-training model, making such empirical searches both sub-optimal and computationally intractable. In this work, we advocate and introduce the unrolling paradigm, also referred to as "learning to optimize", in the context of few-shot learning, thereby learning efficiently and effectively a set of optimized hyper-parameters. Specifically, we unroll a generalization of the ubiquitous Expectation-Maximization (EM) optimizer into a neural network architecture, mapping each of its iterates to a layer and learning a set of key hyper-parameters over validation data. Our unrolling approach covers various statistical feature distributions and pre-training paradigms, including recent foundational vision-language models and standard vision-only classifiers. We report comprehensive experiments, which cover a breadth of fine-grained downstream image classification tasks, showing significant gains brought by the proposed unrolled EM algorithm over iterative variants. The achieved improvements reach up to 10% and 7.5% on vision-only and vision-language benchmarks, respectively.

  • 6 authors
·
Dec 21, 2024